Method for measuring distribution of pores in electrode for secondary battery

Patent metadata

Field	Value
Publication number	US-12196651-B2
Application number	US-201816607526-A
Country	US
Kind code	B2
Filing date	May 29, 2018
Priority date	May 29, 2017
Publication date	Jan 14, 2025
Grant date	Jan 14, 2025

Abstract

The present invention provides a method for measuring a distribution of pores in an electrode for a secondary battery, which can easily measure a distribution of pores inside the electrode for a secondary battery.

First claim

What is claimed is:

1. A method for measuring a distribution of pores in an electrode for a secondary battery, comprising:
preparing an electrode for a secondary battery comprising an electrode active material, a binder, and a conductive material;
filling pores inside the electrode for a secondary battery with a polymer comprising silicon by impregnating the polymer comprising silicon into the electrode for a secondary battery;
producing an electrode cross-sectional sample by irradiating the electrode for a secondary battery with an ion beam of an ion milling device;
detecting silicon present on the electrode cross-sectional sample by using an energy-dispersive X-ray spectroscopy; and
confirming a distribution of pores by analyzing an image in which points of silicon detected by the energy-dispersive X-ray spectroscopy are mapped.

2. The method of claim 1 , wherein the polymer comprising silicon comprises one or more selected from the group consisting of polydimethylsiloxane, polysiloxane, polysilane, and polysilazane.

3. The method of claim 1 , further comprising:
staining the binder, before the producing of the electrode cross-sectional sample.

4. The method of claim 3 , wherein the staining of the binder comprises staining the binder with a staining material comprising at least one of an osmium compound and a ruthenium compound.

5. The method of claim 4 , further comprising:
detecting the staining material in the binder by using an energy-dispersive X-ray spectroscopy; and
calculating an area ratio of the binder by analyzing an image in which points of the staining material detected by the energy-dispersive X-ray spectroscopy are mapped.

6. The method of claim 1 , wherein the ion beam is an argon ion beam.

7. The method of claim 1 , wherein an ion beam current of the ion milling device is from 100 μA to 250 μA.

8. The method of claim 1 , wherein a discharge current of the ion milling device is from 250 μA to 450 μA.

Assignees

• Lg Chemical Ltd
• Lg Energy Solution Ltd

Inventors

• Han Jung Hoon

Classifications

• H01B1/04

  mainly consisting of carbon-silicon compounds, carbon or silicon · CPC title

• G01N2223/409

  embedding or impregnating the object · CPC title

• G01N2223/079

  incident electron beam and measuring excited X-rays · CPC title

• G01N23/2252

  Measuring emitted X-rays, e.g. electron probe microanalysis [EPMA] · CPC title

• G01N2223/402

  mapping distribution of elements · CPC title