Detecting optical anomalies on optical elements used in an additive manufacturing machine

Patent metadata

Field	Value
Publication number	US-12162073-B2
Application number	US-202318448458-A
Country	US
Kind code	B2
Filing date	Aug 11, 2023
Priority date	Apr 16, 2021
Publication date	Dec 10, 2024
Grant date	Dec 10, 2024

Abstract

An additive manufacturing machine includes an energy beam system configured to emit an energy beam utilized in an additive manufacturing process, and first and second optical elements utilized by, or defining a portion of, the energy beam system and/or an imaging system of the additive manufacturing machine. The imaging system monitors one or more operating parameters of the additive manufacturing process. A light source is configured to emit an assessment beam that follows an optical path incident upon the first and second optical elements. One or more light sensors detect a reflected beam that is either internally reflected by the first optical element or reflectively propagated between the first and second optical elements. A control system determines, based at least in part on assessment data comprising data from the one or more light sensors, whether at least one of the first and second optical elements exhibits an optical anomaly.

First claim

What is claimed is:

1. An additive manufacturing machine, comprising:
an energy beam system configured to emit an energy beam utilized in an additive manufacturing process;
first and second optical elements utilized by, or defining a portion of, the energy beam system and/or an imaging system of the additive manufacturing machine, the imaging system configured to monitor one or more operating parameters of the additive manufacturing process;
a light source configured to emit an assessment beam that follows an optical path incident upon the first and second optical elements;
one or more light sensors configured to detect a reflected beam that is either refracted by the first optical element, internally reflected by a proximal surface and a distal surface of the first optical element, or reflectively propagated between the distal surface of the first optical element and a proximal surface of the second optical element, the reflected beam comprising at least a portion of the assessment beam; and
a control system configured to determine, based at least in part on assessment data comprising data from the one or more light sensors, whether at least one of the first and second optical elements exhibits an optical anomaly.

2. The additive manufacturing machine of claim 1 ,
wherein the light source comprises an energy beam source of the energy beam system, and wherein the assessment beam emitted by the light source has a first energy level and the energy beam utilized in the additive manufacturing process has a second energy level when the energy beam is utilized to additively manufacture a three-dimensional object, and wherein the first energy level is less than the second energy level.

3. The additive manufacturing machine of claim 1 , wherein the light source is utilized by the imaging system.

4. The additive manufacturing machine of claim 1 , wherein the first and second optical elements comprise a window that separates one or more components of the energy beam system and/or the imaging system from a process chamber within which powder material is irradiated by the energy beam during the additive manufacturing process.

5. The additive manufacturing machine of claim 1 , further comprising:
a scanner configured to orient the assessment beam to a scanner position, the scanner position mapped to a scan field corresponding to the first and second optical elements; and
wherein the control system is configured to determine a beam incidence location based at least in part on the scanner position corresponding to the data from the one or more light sensors.

6. The additive manufacturing machine of claim 5 , wherein the beam incidence location is determined at least in part by mapping the scanner position to the data from the one or more light sensors.

7. The additive manufacturing machine of claim 1 , wherein the control system is configured to determine whether at least one of the first and second optical elements exhibit an optical anomaly based at least in part on a comparison of the assessment data to reference data.

8. The additive manufacturing machine of claim 7 , wherein the reference data comprises a threshold value.

9. The additive manufacturing machine of claim 1 , wherein the control system is configured to determine location coordinates of the optical anomaly on at least one of the first and second optical elements.

10. The additive manufacturing machine of claim 1 , wherein the first optical element is a proximal optical element and the second optical element is a distal optical element.

11. The additive manufacturing machine of claim 1 , wherein the one or more light sensors are configured to detect the reflected beam at a perimeter edge of the first optical element.

12. A method of determining an optical anomaly exhibited by an optical element utilized in an additive manufacturing machine, the method comprising:
emitting, with a light source, an assessment beam that follows an optical path incident upon first and second optical elements;
detecting, with one or more light sensors, a reflected beam comprising at least a portion of the assessment beam that is either refracted by the first optical element, internally reflected by a proximal surface and a distal surface of the first optical element, or reflectively propagated between the distal surface of the first optical element and a proximal surface of the second optical element; and
determining, with a control system, whether at least one of the first and second optical elements exhibit an optical anomaly based at least in part on the assessment data comprising data from the one or more light sensors; and
wherein the first and second optical elements are utilized by, or define a portion of, an energy beam system and/or an imaging system of an additive manufacturing machine, the energy beam system configured to emit an energy beam utilized in an additive manufacturing process, and the imaging system configured to monitor one or more operating parameters of the additive manufacturing process.

13. The method of claim 12 , wherein detecting, with the one or more light sensors, the reflected beam comprises detecting, with the one or more light sensors, the reflected beam at a perimeter edge of the first optical element.

14. The method of claim 12 , further comprising determining, with the control system, whether at least one of the first and second optical elements exhibit an optical anomaly based at least in part on a comparison of the assessment data to reference data.

15. The method of claim 12 , further comprising determining, with the control system, location coordinates of the optical anomaly on at least one of the first and second optical elements.

16. The method of claim 12 , further comprising:
orienting, with a scanner, the assessment beam to a scanner position, the scanner position mapped to a scan field corresponding to the first and second optical elements; and
determining, with the control system, a beam incidence location based at least in part on the scanner position corresponding to the data from the one or more light sensors.

17. The method of claim 12 , wherein the light source comprises an energy beam source of the energy beam system, and further comprising emitting the assessment beam by the light source at a first energy level, and wherein the energy beam utilized in the additive manufacturing process has a second energy level when the energy beam is utilized to additively manufacture a three-dimensional object, and wherein the first energy level is less than the second energy level.

18. A non-transitory computer-readable medium comprising computer-executable instructions, which when executed by a processor associated with an additive manufacturing system, cause the additive manufacturing system to perform a method comprising:
emitting, with a light source, an assessment beam that follows an optical path incident upon first and second optical elements;
detecting, with one or more light sensors, a reflected beam comprising at least a portion of the assessment beam that is either refracted by the first optical element, internally reflected by a proximal surface and a distal surface of the first optical element or reflectively propagated between the distal surface of the first optical element and a proximal surface of the second optical element; and
determining, with a control system, whether at least one of the first and second optical elements exhibit an optical anomaly based at least in part on the assessment data comprising data from the one or more light sensors; and
wherein t

Assignees

• Gen Electric
• Concept Laser Gmbh

Inventors

• Zeulner Fabian
• Dicken Christian
• Mamrak Justin
• Redding Mackenzie Ryan
• Gaerber Bertram

Classifications

• B22F10/28

  Powder bed fusion, e.g. selective laser melting [SLM] or electron beam melting [EBM] · CPC title

• B22F12/90

  Means for process control, e.g. cameras or sensors · CPC title

• B22F12/41

  characterised by the type, e.g. laser or electron beam · CPC title

• B22F12/49

  Scanners · CPC title

• B33Y50/02

  for controlling or regulating additive manufacturing processes · CPC title