Active monitoring of multi-laser systems

US9310248B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9310248-B2
Application numberUS-201313828336-A
CountryUS
Kind codeB2
Filing dateMar 14, 2013
Priority dateMar 14, 2013
Publication dateApr 12, 2016
Grant dateApr 12, 2016

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A monitoring system for a multi-laser module includes detectors corresponding to each laser and situated to receive a portion of the associated laser beam uncombined with other beams. Laser characteristics are measured and stored, and in operation are used to identify device failures. A comparator receives a reference value and compares the reference value with a current operational value. If the current value is less that the reference value, a possible failure is indicated. Signal cross-coupling among the detectors is also used to identify undesirable scattering that can be associated with surface contamination or device failure.

First claim

Opening claim text (preview).

We claim: 1. An apparatus, comprising: a plurality of laser diodes and associated laser drivers configured to produce an optical beam; a detection system configured to receive portions of optical beams for each of the laser diodes and produce corresponding detector output signals associated with each of the optical beams; a memory configured to store the at least one characteristic parameter for each of the laser diodes; and a processor coupled to the laser drivers, the detection system, and the memory so as to establish at least one characteristic parameter for each of the laser diodes wherein the plurality of laser diodes includes a first linear array of laser diodes and a second linear array of laser diodes, and a beam interleaver configured to reflect beams associated with the first linear array and transmit beams associated with the second linear array to form the output beam. 2. The apparatus of claim 1 , wherein the processor is configured to establish a plurality of drive currents for each of the laser diodes and receive detector signals associated with detected optical power at each of the plurality of drive currents for each of the laser diodes, and determine the at least one characteristic parameter based on values associated with the plurality of drive currents and the received signals. 3. The apparatus of claim 2 , wherein the processor is coupled to store drive current values and associated received detector signals in the memory. 4. The apparatus of claim 2 , wherein the processor is configured to periodically establish a plurality of drive currents for each of the laser diodes and receive signals associated with detected optical power at each of the plurality of drive currents for each of the laser diodes, and store the at least one characteristic parameter in the memory. 5. The apparatus of claim 4 , wherein the at least one characteristic parameter is associated with a polynomial approximation to laser power as a function of drive current for each of the lasers. 6. The apparatus of claim 5 , further comprising a comparator coupled to the processor, and configured to compare a detector output signal and a reference signal based on the at least one characteristic parameter. 7. The apparatus of claim 6 , wherein the processor is configured to terminate operation of a selected laser diode if detector output signal is less than the reference signal. 8. The apparatus of claim 1 , wherein the at least one characteristic parameter is associated with a dependence of laser power on drive current. 9. The apparatus of claim 1 , wherein the detection system includes a photodetector corresponding to each of the laser diodes of the plurality of laser diodes. 10. The apparatus of claim 1 , wherein the laser drivers are configured to apply modulated drive currents to the laser diodes, and corresponding detector output signals portions associated with each of the laser diodes are identified based on modulations applied to the laser diodes. 11. The apparatus of claim 1 , wherein the detection system includes a first linear array of photodetectors and a second linear array of photodetectors corresponding to the first linear array of laser diodes and the second linear array of laser diodes, respectively, configured to receive portions of corresponding optical beams for each of the laser diodes and produce the corresponding detector output signals, wherein at least one of the first linear array of photodetectors or the second linear array of photodetectors receives the corresponding optical beam portions from the interleaver. 12. The apparatus of claim 11 , wherein the corresponding optical beam portions are received by reflection from the interleaver. 13. The apparatus of claim 11 , wherein the corresponding optical beam portions are received by transmission through the interleaver. 14. The apparatus of claim 11 , wherein at least one of the first linear array of photodetectors or the second linear array of photodetectors is configured to receive portions of corresponding optical beams as transmitted or reflected by the interleaver. 15. The apparatus of claim 11 , wherein the detection system includes first and second aperture plates situated at the first and second linear arrays of photodetectors, and having first and second linear arrays of apertures corresponding to the photodetectors of the first linear array and the second linear array, respectively. 16. The apparatus of claim 11 , wherein the processor is configured so that a laser drive current is applied to a selected laser diode, and the detected signal is associated with one or more photodetectors corresponding to laser diodes other than the selected laser diode. 17. The apparatus of claim 16 , wherein the detected signal is associated with at least one photodetector adjacent the photodetector associated with the selected laser diode. 18. The apparatus of claim 17 , wherein the processor is configured to issue an alert if the detected signal is greater than a predetermined value. 19. The apparatus of claim 11 , wherein the processor is configured so that laser drive currents are serially applied to each of the laser diodes, and serially detected signals are obtained from one or more photodetectors corresponding to laser diodes other than a currently selected laser diode. 20. The apparatus of claim 1 , wherein the processor is configured to energize a selected laser diode of the plurality of laser diodes and receive a detector output signal from the detection system that is associated with an optical detector corresponding to at least one of the unselected laser diodes of the plurality of laser diodes, and based on the received detector output signal, identify a channel error. 21. The apparatus of claim 20 , further comprising a display coupled to the processor, wherein the processor is configured to indicate received detector output signal values associated with each of the laser diodes with the display. 22. The apparatus of claim 21 , wherein the processor is operable so that the display includes a user interface area associated with user selection of the selected laser diode with a computer pointing device.

Assignees

Inventors

Classifications

  • Array arrangements, e.g. constituted by discrete laser diodes or laser bar (H01S5/42 takes precedence) · CPC title

  • Beam combining, e.g. by the use of fibres, gratings, polarisers, prisms · CPC title

  • Electrical excitation {; Circuits therefor (monolithically integrated laser drive components H01S5/0261)} · CPC title

  • Measuring characteristics or properties thereof (measuring techniques per se G01J, G01K, G01N, G01R) · CPC title

  • arrangements with two or more detectors, e.g. for sensitivity compensation · CPC title

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What does patent US9310248B2 cover?
A monitoring system for a multi-laser module includes detectors corresponding to each laser and situated to receive a portion of the associated laser beam uncombined with other beams. Laser characteristics are measured and stored, and in operation are used to identify device failures. A comparator receives a reference value and compares the reference value with a current operational value. If t…
Who is the assignee on this patent?
Nlight Photonics Corp, Nlight Inc
What technology area does this patent fall under?
Primary CPC classification G01J1/4257. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Apr 12 2016 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).