Resistivity imaging system with compensator for parasitic impedances between electrodes and their conductive substrates

US12092600B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-12092600-B2
Application numberUS-202017757128-A
CountryUS
Kind codeB2
Filing dateDec 17, 2020
Priority dateDec 18, 2019
Publication dateSep 17, 2024
Grant dateSep 17, 2024

How to read this patent

A practical reading order for non-experts. Skip the full description unless you need deep technical detail.

  1. Title

    What the patent document calls the invention.

  2. Abstract

    A short plain-language summary of the technical disclosure.

  3. Assignees and inventors

    Who owns or filed the patent and who is credited as inventor.

  4. Key dates

    Filing, priority, publication, and grant dates set the timeline.

  5. First independent claim

    The legal scope of protection — read this for what is actually claimed.

  6. CPC / IPC classifications

    Technology tags used to group this patent with similar filings.

  7. Citations and related patents

    Prior art links and similar publications in this corpus.

Abstract

Official abstract text for this publication.

A system for imaging material, typically in an underground scenario, comprising of a plurality of conductive electrodes supported on a conductive substrate positionable in an environment to be imaged, a signal generator connected to at least two of the electrodes, and a signal detector connected to at least two of the electrodes, and wherein an impedance compensator is arranged between each electrode and its substrate to counter parasitic impedance between the two. Typically the impedance compensator may be arranged to act as a negative capacitance, which may be approximately equal to any capacitance between the electrode and the substrate. An electrode may be a drive electrode coupled to a signal generator, or a detector electrode coupled to a detector, or may be reconfigurable to act as either one.

First claim

Opening claim text (preview).

The invention claimed is: 1. An imaging system for imaging of materials, comprising of: a plurality of conductive electrodes positionable in an environment to be imaged; a signal generator connected to at least two of the electrodes; and a signal detector connected to at least two of the electrodes, wherein the electrodes are supported on one or more conductive substrates; characterised in that it further comprises an impedance compensator arranged to counter parasitic impedance between each electrode and its substrate, wherein the impedance compensator comprises a negative impedance, wherein the negative impedance is arranged to cancel or reduce a parasitic impedance between a drive electrode and a conductive support. 2. The system as claimed in claim 1 wherein the impedance compensator comprises a negative capacitance, and is arranged to have a negative capacitance between a given electrode and the conductive substrate approximately equal to the capacitance between the given electrode and the conductive substrate. 3. The system as claimed in claim 1 wherein the impedance compensator comprises of a negative resistance. 4. The system as claimed in claim 3 wherein the negative resistance comprises a DC power source arranged to provide a current approximately equal to a current that would flow, in use, between the electrode and the substrate. 5. The system as claimed in claim 1 wherein the negative impedance compensator comprises a one port circuit having an amplifier configured to provide an electrical current between an electrode and its substrate, having an inverse phase compared to that of the connected circuit. 6. The system as claimed in claim 1 wherein each electrode is adapted be switchable so as to function either as a drive electrode where a signal generator is connected to it, or a detector electrode, where a signal detector is connected to it. 7. The system as claimed in claim 1 wherein the system has means for adjusting a supplied current, from the signal generator, based upon a measurement of coupling between its associated electrode and the substrate. 8. The system as claimed in claim 7 wherein the system further comprises a means for measuring the coupling comprising current measuring means for measuring a current flow between the signal generator connected to the electrode and the electrode itself. 9. The system as claimed in claim 7 wherein the system further comprises a means for measuring the coupling comprising a sensor arranged to measure an electric field emanating from the electrode into its surrounding environment, at a position more distant from the substrate than the electrode-substrate distance. 10. The system as claimed in claim 1 wherein there are at least four electrodes, with at least two arranged to connect to the signal generator, and at least two arranged to connect to the signal detector, and wherein the at least two electrodes connected to the signal generator are arranged with the two electrodes connected to the signal detector located between them. 11. The system as claimed in claim 1 wherein there are at least four electrodes, with at least two arranged to connect to the signal generator, and at least two arranged to connect to the signal detector, and wherein the at least two electrodes connected to the signal generator are nearest neighbours to each other, and the at least two electrodes connected to the signal detector are likewise nearest neighbours to each other. 12. The system as claimed in claim 1 wherein an electrode connected to the signal detector and supported on a first substrate is arranged to receive signals from an electrode, connected to the signal generator, and supported on a second substrate, spatially separated from the first substrate. 13. The system as claimed in claim 1 wherein the substrate has located thereon electrodes that are, during at least a part of their use, not connected to a signal detector or signal generator, but have a connection to an impedance compensator. 14. The system as claimed in claim 1 wherein the substrate, or substrates, comprise of metal pipes. 15. The system as claimed in claim 1 wherein the substrate, or substrates comprise of metal plates or frames. 16. A method of imaging comprising using a system as claimed in claim 1 to generate image data of a medium.

Assignees

Inventors

Classifications

  • using AC · CPC title

  • G01V3/22Primary

    using DC · CPC title

  • generating an image of the borehole wall using down-hole measurements, e.g. acoustic or electric · CPC title

  • G01N27/228Primary

    Circuits therefor (measuring capacitance per se G01R27/26) · CPC title

  • Circuits (measuring resistance per se G01R27/00, e.g. G01R27/22) · CPC title

Patent family

Related publications grouped by family.

External sources

Frequently asked questions

Answers are generated from the same data shown on this page.

What does patent US12092600B2 cover?
A system for imaging material, typically in an underground scenario, comprising of a plurality of conductive electrodes supported on a conductive substrate positionable in an environment to be imaged, a signal generator connected to at least two of the electrodes, and a signal detector connected to at least two of the electrodes, and wherein an impedance compensator is arranged between each ele…
Who is the assignee on this patent?
Qinetiq Ltd
What technology area does this patent fall under?
Primary CPC classification G01V3/22. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Sep 17 2024 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 5 related publications on this page (citations in our corpus or others sharing the same primary CPC).