Method for determining a parameter of a processing process and processing machine

US12053840B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-12053840-B2
Application numberUS-202117226094-A
CountryUS
Kind codeB2
Filing dateApr 9, 2021
Priority dateOct 12, 2018
Publication dateAug 6, 2024
Grant dateAug 6, 2024

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  5. First independent claim

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  6. CPC / IPC classifications

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Abstract

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A method determines at least one parameter for a process quality during a processing process. The method includes: processing a workpiece while moving a processing tool and the workpiece relative to one another; monitoring a region on the workpiece; determining the at least one parameter for the process quality based on the monitored region; and determining at least one position-dependent parameter for the process quality based on a plurality of measured values of the at least one parameter at a same processing position, or determining at least one direction-dependent parameter for the process quality based on the plurality of measured values of the at least one parameter in a same processing direction.

First claim

Opening claim text (preview).

The invention claimed is: 1. A processing machine, the processing machine comprising: a processing tool configured for processing of a workpiece; a movement device configured to move the processing tool relative to the workpiece; a monitoring device configured to monitor a region on the workpiece; and an evaluation device, which is configured to determine at least one parameter for a process quality based on the monitored region, wherein the evaluation device is configured to determine at least one position-dependent parameter for the process quality based on a plurality of measured values of the at least one parameter at a same processing position, or at least one direction-dependent parameter for the process quality based on the plurality of measured values of the at least one parameter along a same processing direction, wherein the evaluation device is configured to determine, based on the position-dependent parameter, processing positions which form at least one fault position region during the processing, or to determine, based on the direction-dependent parameter, processing directions, which form at least one fault angle region during the processing. 2. The processing machine as claimed in claim 1 , wherein the evaluation device is configured to carry out a statistical analysis of the plurality of measured values to determine the position-dependent parameter or the direction-dependent parameter for the process quality. 3. The processing machine as claimed in claim 1 , wherein the monitoring device is configured to monitor the at least one parameter continuously, and wherein the evaluation device is configured to assign an instantaneously determined measured value of the parameter to a respective processing position or to a respective processing direction. 4. The processing machine as claimed in claim 1 , the processing machine further comprising: a control device configured to control the movement of the processing tool relative to the workpiece. 5. The processing machine as claimed in claim 1 , wherein the monitoring device and the evaluation device are configured to determine, based on the monitored region, as a parameter for the process quality, a cutting front angle of a cutting front of a kerf, an opening angle between two cut flanks of the kerf, a positioning accuracy, or a directional accuracy during the movement of the processing tool and the workpiece relative to one another. 6. The processing machine as claimed in claim 4 , wherein the control device is configured to define processing positions or processing directions during the movement of the processing tool relative to the workpiece in dependence on the determined position-dependent parameter including on the at least one fault position region, or based on the direction-dependent parameter including on the at least one fault angle region. 7. The processing machine as claimed in claim 2 , wherein the position-dependent parameter or the direction-dependent parameter for the process quality is determined as a mean value or a median value of the plurality of measured values.

Assignees

Inventors

Classifications

  • by boring or cutting · CPC title

  • Total factory control, e.g. smart factories, flexible manufacturing systems [FMS] or integrated manufacturing systems [IMS] · CPC title

  • Real time statistical process monitoring · CPC title

  • characterised by quality surveillance of production · CPC title

  • by means of a monitoring system capable of detecting and responding to faults · CPC title

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What does patent US12053840B2 cover?
A method determines at least one parameter for a process quality during a processing process. The method includes: processing a workpiece while moving a processing tool and the workpiece relative to one another; monitoring a region on the workpiece; determining the at least one parameter for the process quality based on the monitored region; and determining at least one position-dependent param…
Who is the assignee on this patent?
Trumpf Werkzeugmaschinen Gmbh Co Kg, Trumpf Werkzeugmaschinen Se Co Kg
What technology area does this patent fall under?
Primary CPC classification B23K26/705. Mapped technology areas include Operations & Transport.
When was this patent published?
Publication date Tue Aug 06 2024 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 12 related publications on this page (citations in our corpus or others sharing the same primary CPC).