Stack for an energy storage device

US12040452B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-12040452-B2
Application numberUS-201917261516-A
CountryUS
Kind codeB2
Filing dateJul 19, 2019
Priority dateJul 20, 2018
Publication dateJul 16, 2024
Grant dateJul 16, 2024

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A method comprises obtaining a stack for an energy storage device, the stack comprising one or more layers: laser ablating the stack so as to form a cut through one or more of the layers, thereby producing one or more laser ablation products: and analysing, using a mass spectrometry-based analysis technique, the laser ablation products thereby to determine one or more characteristics of the stack. Also disclosed is an apparatus.

First claim

Opening claim text (preview).

The invention claimed is: 1. A method comprising: obtaining a stack for an energy storage device, the stack comprising one or more layers; laser ablating the stack so as to form a cut at least part way through one or more of the layers, thereby producing one or more laser ablation products; analysing, using a mass spectrometry based analysis technique, the laser ablation products thereby to determine one or more characteristics of the stack; correlating a position of the laser ablating with the determined one or more characteristics; and determining a parameter, based on the correlated position and the determined one or more characteristics, wherein the parameter comprises a number of energy storage device cells formed from the laser ablated stack that are to be included in a given energy storage device. 2. The method of claim 1 , wherein the position comprises at least one location in the plane of the stack. 3. The method of claim 1 , wherein the method comprises moving, concurrently with or intermittently of the laser ablating, the stack in a first direction, and the position comprises a location along an axis parallel to the first direction. 4. The method of claim 1 , wherein the method comprises moving, concurrently with or intermittently of the laser ablating, the stack in a first direction, and the position comprises a location along an axis perpendicular to the first direction. 5. The method of claim 1 , wherein the position comprises a depth into stack. 6. The method of claim 1 , wherein the method comprises storing, in a storage medium, data representing the correlated position and data representing the determined one or more characteristics in association with one another. 7. The method of claim 1 , wherein the method comprises processing the laser ablated stack based on at least one of the correlated position and determined one or more characteristics or the determined parameter. 8. The method of claim 1 , wherein the method comprises: moving the stack relative to a laser beam used for the laser ablating; laser ablating the stack so as to form a further cut through one or more of the layers, thereby producing one or more further laser ablation products; analysing, using the mass spectrometry based analysis technique, the further laser ablation products thereby to determine one or more further characteristics of the stack; and correlating a position of the further laser ablating with the determined one or more further characteristics. 9. The method of claim 1 , wherein the method comprises using the determined one or more characteristics, or the correlated position and determined one or more characteristics, to adjust a production of the obtained stack. 10. The method of claim 1 , wherein the determined one or more characteristics comprise one or more of: an identity of one or more of the laser ablation products, an identity of one or more components of one or more of the layers of the stack, and a quality control parameter for the stack. 11. The method of claim 1 , wherein the mass spectrometry based technique comprises Inductively Coupled Plasma Mass Spectrometry, ICP-MS. 12. Apparatus for determining one or more characteristics of a stack for an energy storage device, the stack comprising one or more layers, the apparatus comprising: a laser system arranged to laser ablate the stack in use so as to form a cut at least part way through one or more of the layers, thereby producing one or more laser ablation products in use; an analyser arranged to analyse the laser ablation products produced in use thereby to determine one or more characteristics of the stack; and a correlator arranged to correlate a position of the laser ablation with the determined one or more characteristics; wherein the position comprises at least one location in the plane of the stack ablated by the laser system in use; and wherein the apparatus is configured to determine a parameter, based on the correlated position and the determined one or more characteristics, wherein the parameter comprises a number of energy storage device cells formed from the laser ablated stack that are to be included in a given energy storage device. 13. The apparatus of claim 12 , wherein the analyser is arranged to analyse, using a mass-spectrometry based technique, the laser products produced in use thereby to determine the one or more characteristics of the stack. 14. The apparatus of claim 13 , wherein, in use, concurrently with or intermittently of the laser ablation, the stack moves in a direction of travel, and wherein the correlator is arranged to correlate the position of the laser ablation with the determined one or more characteristics based on a speed at which the stack is moved.

Assignees

Inventors

Classifications

  • H01J49/164Primary

    Laser desorption/ionisation, e.g. matrix-assisted laser desorption/ionisation [MALDI] (sample holders H01J49/0418) · CPC title

  • using high-frequency excitation, e.g. microwave excitation, Inductively Coupled Plasma [ICP] · CPC title

  • Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components · CPC title

  • Imaging particle spectrometry · CPC title

  • inorganic · CPC title

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What does patent US12040452B2 cover?
A method comprises obtaining a stack for an energy storage device, the stack comprising one or more layers: laser ablating the stack so as to form a cut through one or more of the layers, thereby producing one or more laser ablation products: and analysing, using a mass spectrometry-based analysis technique, the laser ablation products thereby to determine one or more characteristics of the sta…
Who is the assignee on this patent?
Dyson Technology Ltd
What technology area does this patent fall under?
Primary CPC classification H01J49/164. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Jul 16 2024 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 5 related publications on this page (citations in our corpus or others sharing the same primary CPC).