Optical position-measuring device for suppressing disturbing higher diffraction orders

Patent metadata

Field	Value
Publication number	US-11946782-B2
Application number	US-202217960148-A
Country	US
Kind code	B2
Filing date	Oct 5, 2022
Priority date	Oct 20, 2021
Publication date	Apr 2, 2024
Grant date	Apr 2, 2024

Abstract

An optical position-measuring device for determining a relative position of scales includes a light source, the scales and a detector. The scales are movable relative to each other along measurement directions and disposed in different planes in crossed relation to each other, and each have a graduation having grating regions which are arranged periodically and have different optical properties. At the first scale, the illumination beam is split into sub-beams, the sub-beams subsequently impinge on the second scale and are reflected back toward the first scale, and the reflected-back sub-beams strike the first scale again, where they are recombined, so that a resulting signal beam subsequently propagates toward the detector. The measuring graduation of one or more of the scales is configured as a two-dimensional cross grating which has a filtering effect that suppresses disturbing higher diffraction orders.

First claim

The invention claimed is:

1. An optical position-measuring device for determining a relative position of at least two scales, the optical position-measuring device comprising:
a light source configured to emit an illumination beam along a scanning beam path; and
the at least two scales, which are movable relative to each other along at least two measurement directions and disposed in different planes in crossed relation to each other, the at least two scales each having at least one measuring graduation having grating regions which are arranged periodically along at least one of the measurement directions and have different optical properties, each of the at least two scales having a direction of longitudinal extent oriented parallel to a first or a second one of the measurement directions; and
a detector configured to generate one or more position-dependent scanning signals with respect to relative movement of the scales along the first or second measurement direction,
wherein the scanning beam path is configured such that:
at the first scale, the illumination beam is split into at least two sub-beams,
the at least two sub-beams subsequently impinge on the second scale and are reflected back toward the first scale, and
the reflected-back sub-beams strike the first scale again, where the reflected-back sub-beams are recombined, so that at least one resulting signal beam subsequently propagates toward the detector,
wherein the at least one measuring graduation of at least one of the scales is configured as a two-dimensional cross grating which has a filtering effect that suppresses disturbing higher diffraction orders at the cross grating, and
wherein the cross grating has first and second areal measuring graduation regions which are arranged in a checkerboard-like pattern and have different optical properties and which are arranged periodically with a first regional periodicity along a direction of longitudinal extent of the cross grating and periodically with a second regional periodicity along a direction of transverse extent of the cross grating that is oriented orthogonally to the direction of longitudinal extent, the first and second areal measuring graduation regions having superimposed thereon a one-dimensional or two-dimensional periodic line grating.

2. The optical position-measuring device as recited in claim 1 , wherein in each areal measuring graduation region, the line grating has a line grating region which:
includes at least a first pair of straight grating lines which extend over an entire length of the respective areal measuring graduation region and are arranged parallel to a first one of the directions of extent at a first distance relative to each other, the line grating region along the first direction of extent having same periodicities as the respective areal measuring graduation region, and
in a case of a two-dimensional line grating, further includes a second pair of straight grating lines which extend over the entire length of the respective areal measuring graduation region and are arranged along a second one of the directions of extent, which is oriented perpendicular to the first direction of extent, at a second distance relative to each other, the line grating region along the second direction of extent also having same periodicities as the respective areal measuring graduation region.

3. The optical position-measuring device as recited in claim 2 , wherein at least three regions separated from one another by the grating lines are present in each of the areal measuring graduation regions along the first direction of extent and/or along the second direction of extent.

4. The optical position-measuring device as recited in claim 1 , wherein the different optical properties provided in the cross grating are:
different transmission properties,
different reflective properties, and/or
different phase-shifting effects.

5. The optical position-measuring device as recited in claim 1 , wherein the cross grating is configured as a binary grating having two different optical properties, and the grating lines of the line grating in each case have a respective other optical property with respect to the optical properties of the first and second areal measuring graduation regions.

6. The optical position-measuring device as recited in claim 1 , wherein the cross grating has spacing regions between the first and second areal measuring graduation regions, the spacing regions having a third optical property different from the optical properties of the first and second areal measuring graduation regions.

7. The optical position-measuring device as recited in claim 6 , wherein the spacing regions between the first and second areal measuring graduation regions have identical widths along the direction of longitudinal extent and the direction of transverse extent.

8. The optical position-measuring device as recited in claim 6 , wherein the spacing regions are patterned.

9. The optical position-measuring device as recited in claim 1 , wherein the measuring graduation of the second scale is configured as a reflective linear grating having measuring graduation regions which are arranged periodically along the direction of longitudinal extent of the second scale and which have different phase-shifting effects on the beams reflected thereby.

10. The optical position-measuring device as recited in claim 9 , wherein the linear grating of the second scale has a filtering effect that suppresses certain diffraction orders n>1.

11. The optical position-measuring device as recited in claim 1 , wherein at least one of the measuring graduations is further configured such that diffraction orders generated thereby each have a defined polarization.

12. The optical position-measuring device as recited in claim 1 , wherein at least one of the scales is disposed tilted about its direction of longitudinal extent.

13. An arrangement, comprising:
a plurality of optical position-measuring devices, each of the optical position-measuring devices comprising:
a light source configured to emit an illumination beam along a scanning beam path; and
at least two scales, which are movable relative to each other along at least two measurement directions and disposed in different planes in crossed relation to each other, the at least two scales each having at least one measuring graduation having grating regions which are arranged periodically along at least one of the measurement directions and have different optical properties, each of the at least two scales having a direction of longitudinal extent oriented parallel to a first or a second one of the measurement directions; and
a detector configured to generate one or more position-dependent scanning signals with respect to relative movement of the scales along the first or second measurement direction,
wherein the scanning beam path is configured such that:
at the first scale, the illumination beam is split into at least two sub-beams,
the at least two sub-beams subsequently impinge on the second scale and are reflected back toward the first scale, and
the reflected-back sub-beams strike the first scale again, where the reflected-back sub-beams are recombined, so that at least one resulting signal beam subsequently propagates toward the detector, and
wherein the at least one measuring graduation of at least one of the scales is configured as a two-dimensional cross grating which has a filtering effect that suppresses disturbing higher diffraction orders at the cross grating; and

a stage disposed in a horizontal plane of movement in such a manner that the stage is movable along two orthogonal ones of the measurem

Assignees

• Heidenhain Gmbh Dr Johannes

Inventors

• Kaelberer Thomas

Classifications

• G01D5/34715 Primary

  Scale reading or illumination devices · CPC title

• G01D5/38 Primary

  by diffraction gratings · CPC title

• G01D2205/90

  Two-dimensional encoders, i.e. having one or two codes extending in two directions · CPC title