Semiconductor device manufacturing method and semiconductor device manufactured using the same
US-2024395745-A1 · Nov 28, 2024 · US
US11901389B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-11901389-B2 |
| Application number | US-202117325308-A |
| Country | US |
| Kind code | B2 |
| Filing date | May 20, 2021 |
| Priority date | May 26, 2020 |
| Publication date | Feb 13, 2024 |
| Grant date | Feb 13, 2024 |
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An infrared sensor including: a detection substrate that includes a first substrate in which infrared detection elements are arranged in a lattice shape and first terminals each of which is associated with one of the infrared detection elements are arranged; a readout substrate that includes a second substrate in which second terminals each of which is associated with one of the first terminals are arranged and a readout circuit that reads an electrical signal based on infrared light detected by each one of the infrared detection elements is formed; and bumps that electrically connect each one of the first terminals to one of the second terminals associated with the one of the first terminals, in which at least one of the first terminals, the second terminals, or the bumps is partially arranged at a position between the infrared detection elements that are adjacent in a top view.
Opening claim text (preview).
The invention claimed is: 1. An infrared sensor comprising: a detection substrate that includes a first substrate in which a plurality of infrared detection elements are arranged in a lattice shape and a plurality of first terminals each of which is associated with one of the infrared detection elements are arranged; a readout substrate that includes a second substrate in which a plurality of second terminals each of which is associated with one of the plurality of first terminals are arranged and a readout circuit that reads an electrical signal based on infrared light detected by each one of the plurality of infrared detection elements is formed; and a plurality of bumps that electrically connects each one of the plurality of first terminals to one of the plurality of second terminals associated with the one of the plurality of first terminals, wherein at least one of the plurality of first terminals, the plurality of second terminals, or the plurality of bumps is partially arranged at a position between the infrared detection elements that are adjacent in a top view. 2. The infrared sensor according to claim 1 , wherein at least one of the plurality of bumps is partially arranged at a position in a gap formed between the plurality of first terminals and the plurality of second terminals. 3. The infrared sensor according to claim 1 , wherein at least one of the plurality of bumps is arranged to be shifted from centers of the plurality of infrared detection elements within a range from equal to or more than 10% to equal to or less than 50% of a pitch size of the plurality of infrared detection elements. 4. The infrared sensor according to claim 2 , wherein the first substrate and the second substrate are rectangular, and at least one of the plurality of bumps is arranged to be shifted in a longitudinal direction of the first substrate and the second substrate. 5. The infrared sensor according to claim 2 , wherein every one of the plurality of bumps is arranged at a position in a gap formed between the plurality of first terminals and the plurality of second terminals. 6. The infrared sensor according to claim 2 , wherein the plurality of first terminals and the plurality of second terminals are deformed in accordance with shifts of the plurality of bumps. 7. The infrared sensor according to claim 1 , wherein at least one of sets of the plurality of first terminals and the plurality of second terminals associated with each other is arranged at a position between the infrared detection elements that are adjacent to each other in a top view. 8. The infrared sensor according to claim 7 , wherein corners of the plurality of first terminals and the plurality of second terminals are deformed to avoid electrical contact with the plurality of first terminals and the plurality of second terminals that are adjacent to the corners. 9. The infrared sensor according to claim 7 , wherein the first substrate and the second substrate are rectangular, and at least one of sets of the plurality of first terminals and the plurality of second terminals associated with each other is arranged to be shifted in a longitudinal direction of the first substrate and the second substrate. 10. An imaging apparatus comprising: the infrared sensor according to claim 1 ; a lens that condenses infrared light on a light receiving surface of the infrared sensor; a cooler that cools the infrared sensor; and a controller configured to acquire an electrical signal output from the infrared sensor, and generate image data associated to light received by the plurality of infrared detection elements included in the infrared sensor.
between a chip and a stacked insulating package substrate, interposer or RDL · CPC title
protecting against mechanical damage (H10W76/00, H10W74/00 take precedence) · CPC title
Top-view layouts, e.g. mirror arrays · CPC title
changes in dispositions · CPC title
Plan-view shape, i.e. in top view · CPC title
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