Sandwiched XBAR for third harmonic operation

Patent metadata

Field	Value
Publication number	US-11894835-B2
Application number	US-202017129911-A
Country	US
Kind code	B2
Filing date	Dec 22, 2020
Priority date	Sep 21, 2020
Publication date	Feb 6, 2024
Grant date	Feb 6, 2024

Abstract

A filter device has a first piezoelectric plate spanning a first and second cavity of a substrate. A first and second interdigital transducer (IDT) are on a front surface of the first piezoelectric plate over the first and second cavity. A dielectric layer is formed on the first piezoelectric plate and covers the first IDT and second IDT. A second piezoelectric plate is bonded to a front surface of the dielectric layer over the first cavity and the second cavity. A second dielectric layer is formed on a front surface of the second piezoelectric plate over the first cavity but not over the second cavity. The thickness of the dielectric layer, the first piezoelectric plate and the second piezoelectric plate can be selected to tune a shunt resonator over the first cavity and a series resonator over the second cavity.

First claim

The invention claimed is:

1. A filter device comprising:
a substrate having at least a first cavity and a second cavity on a single die comprised of a plurality of layers;
a first piezoelectric plate spanning the first cavity and the second cavity;
a first interdigital transducer (IDT) on a front surface of the first piezoelectric plate that is opposite the substrate, the first IDT having interleaved fingers over the first cavity;
a second IDT on the front surface of the first piezoelectric plate and having interleaved fingers over the second cavity;
a first dielectric layer on the first piezoelectric plate, covering the first IDT and covering the second IDT;
a second piezoelectric plate on a surface of the first dielectric layer, over the first cavity and over the second cavity, such that the first and second IDTs are sandwiched between the first and second piezoelectric plates; and
a second dielectric layer on a front surface of the second piezoelectric plate opposite the first dielectric layer and over the first cavity but not over the second cavity,
wherein the second dielectric layer is coupled to the front surface of the second piezoelectric plate without any electrodes therebetween.

2. The device of claim 1 , wherein:
a first resonator of the filter device has the first piezoelectric plate, the first IDT, the first dielectric layer, the second piezoelectric plate, and the second dielectric layer; and
a second resonator of the filter device has the first piezoelectric plate, the second IDT, the dielectric layer, and the second piezoelectric plate.

3. The device of claim 2 , wherein a thickness of the second dielectric layer is selected to tune the third harmonic shear mode in the first resonator.

4. The device of claim 2 , further comprising connections between the first and second IDT that form an RF filter input and output.

5. The device of claim 1 , wherein the first and second piezoelectric plates are both either lithium niobate or lithium tantalate.

6. The device of claim 5 , wherein the first piezoelectric plate and the second piezoelectric plate have a same thickness.

7. The device of claim 1 , wherein each of the first and second dielectric layer is one of Al2O3 or SiO2; and wherein the first piezoelectric plate and the second piezoelectric plate have a same thickness.

8. The device of claim 1 , wherein the first dielectric layer is a bonding layer that bonds the first piezoelectric plate to the second piezoelectric plate.

9. The device of claim 1 , wherein respective radio frequency signals applied to the first and second IDTs excite respective third harmonic shear mode in the first and second piezoelectric plates over the first and second cavities.

10. An acoustic resonator comprising:
a back surface of a first piezoelectric plate bonded to a top surface of a substrate comprised of a plurality of layers and having at least a first cavity;
a planarized top surface of the first piezoelectric plate forming a first thickness of the first piezoelectric plate with the back surface of the first piezoelectric plate;
the first piezoelectric plate spanning the first cavity;
a first interdigital transducer (IDT) on a front surface of the first piezoelectric plate that is opposite the substrate and having interleaved fingers over the first cavity;
a first dielectric layer on a top surface of the first piezoelectric plate and covering the first IDT;
a back surface of a second piezoelectric plate bonded to a top surface of the first dielectric layer that is opposite the first piezoelectric plate; and
a second dielectric layer coupled to a top surface of the second piezoelectric plate that is opposite the back surface without any electrodes therebetween,
wherein the second piezoelectric plate spans the first cavity.

11. The resonator of claim 10 , wherein respective radio frequency signals applied to the first and second IDTs excite respective third harmonic shear mode in the first and second piezoelectric plates.

12. The resonator of claim 11 , wherein the thickness of the first and second piezoelectric plates are selected to tune the third harmonic shear mode.

13. The resonator of claim 10 , wherein
the first piezoelectric plate and the second piezoelectric plate have a same thickness; and
the first and second piezoelectric plates are both either lithium niobate or lithium tantalate.

14. The resonator of claim 10 , wherein
the first and second dielectric first and second layers are each one of Al2O3 or SiO2; and
the first dielectric layer is a bonding layer for bonding the first to the second piezoelectric plate.

15. An acoustic filter device comprising:
a plurality of acoustic resonators connected in a ladder filter circuit, each acoustic resonator comprising:
a first single-crystal piezoelectric membrane;
a first dielectric layer on a surface of the first single-crystal piezoelectric membrane;
an interdigital transducer (IDT) embedded in the first dielectric layer;
a second single-crystal piezoelectric membrane bonded to the first dielectric layer; and
a second dielectric layer on a surface of the second single-crystal piezoelectric membrane that is opposite the IDT without any electrodes between the second dielectric layer and the second single-crystal piezoelectric membrane.

16. The device of claim 15 , wherein the second dielectric layer forms a portion of a shunt resonator subset of the plurality of acoustic resonators but not a series resonator subset of the plurality of acoustic resonators.

17. The device of claim 16 , wherein the shunt and series resonator subsets are configured such that respective radio frequency signals applied IDTs of the shunt and series resonator excite respective third harmonic shear modes in the shunt and series resonators.

18. The device of claim 17 , wherein the thickness of the dielectric layer, the first piezoelectric plate and the second piezoelectric plate are selected to tune the respective third harmonic shear modes of the shunt and series resonators.

19. The device of claim 16 , wherein the first piezoelectric plate and the second piezoelectric plate have a same thickness.

20. The device of claim 16 , wherein each of the first and second dielectric layers are one of Al2O3 or SiO2; and wherein the first dielectric layer is a bonding layer bonding the first to the second piezoelectric plate.

Assignees

• Murata Manufacturing Co

Inventors

• Garcia Bryant
• Adhikari Pintu
• Guyette Andrew

Classifications

• H03H9/205 Primary

  having multiple resonators (crystal tuning forks H03H9/21) · CPC title

• H03H3/02

  for the manufacture of piezoelectric or electrostrictive resonators or networks (H03H3/08 takes precedence) · CPC title

• H03H9/02015

  Characteristics of piezoelectric layers, e.g. cutting angles · CPC title

• H03H9/02157

  Dimensional parameters, e.g. ratio between two dimension parameters, length, width or thickness · CPC title

• H03H9/02228 Primary

  Guided bulk acoustic wave devices or Lamb wave devices having interdigital transducers situated in parallel planes on either side of a piezoelectric layer · CPC title