Mold detecting device using electromagnetic waves

Patent metadata

Field	Value
Publication number	US-11867603-B2
Application number	US-201916711975-A
Country	US
Kind code	B2
Filing date	Dec 12, 2019
Priority date	Dec 31, 2018
Publication date	Jan 9, 2024
Grant date	Jan 9, 2024

Abstract

A mold sensor is configured with an enclosed chamber in which a nutrient-treated substrate is positioned. The mold sensor includes an optical sensor that is configured to measure optical properties in the enclosed chamber. A controller operates the optical sensor and is programmed to detect a presence of mold growing in the chamber based on the optical properties measured by the optical sensor.

First claim

What is claimed is:

1. A mold sensor comprising:
a housing defining a chamber;
a substrate treated to promote mold growth and exposed within the chamber;
an optical source disposed in the chamber and configured to direct light toward the substrate; and
an optical sensor disposed in the chamber and configured to receive light from the optical source that is reflected from the substrate and provide optical data indicative of one or more optical properties; and
a controller programmed to drive the optical sensor, receive the optical data from the optical sensor, and output a signal indicative of mold growth on the substrate based on the optical data, the controller is further programmed to estimate an out-of-plane mold growth on the substrate by measuring a time shift between a drive signal provided to the optical source and corresponding optical data from the optical sensor.

2. The mold sensor of claim 1 , wherein the optical source and the optical sensor are integrated as single unit.

3. The mold sensor of claim 1 , wherein the optical source and the optical sensor are mounted on opposed side walls of the housing.

4. The mold sensor of claim 1 , wherein the optical source and the optical sensor are mounted on a top cover of the housing.

5. The mold sensor of claim 1 , wherein the optical data includes color information.

6. The mold sensor of claim 5 , wherein the substrate is treated with a pH indicator that changes color as a pH characteristic of the substrate changes due to mold growth.

7. The mold sensor of claim 6 , wherein the controller is further programmed to identify a color of mold growing on the substrate and generate the signal indicative of mold growth based on the color.

8. The mold sensor of claim 1 , wherein the optical sensor is an array of photodiodes.

9. The mold sensor of claim 1 , wherein the optical source is a laser and the optical sensor is one or more photodiodes.

10. The mold sensor of claim 1 , wherein the controller is further programmed to generate the signal based on changes in intensity observed in the optical data from the optical sensor.

11. The mold sensor of claim 1 , wherein the controller is further programmed to generate the signal by comparing a baseline feedback measured prior to mold growth and the optical data received during mold growth.

12. The mold sensor of claim 1 , wherein the optical source is one or more monochromatic optical lasers and the optical sensor is an optical spectrometer configured to provide optical data including a signature of fluorescence spectra, and the controller is further programmed to generate the signal based on the signature of fluorescence spectra.

13. A mold sensor comprising:
a housing defining a chamber;
a substrate treated to promote mold growth and exposed within the chamber;
an optical source coupled within the chamber and configured to direct light toward the substrate; and
an optical sensor mounted to a frame below the substrate and configured to receive light from the optical source that passes through the substrate and provide optical data indicative of one or more optical properties; and
a controller programmed to drive the optical sensor, receive the optical data from the optical sensor, and output a signal indicative of mold growth on the substrate based on the optical data, the controller is further programmed to estimate an out-of-plane mold growth on the substrate by measuring a time shift between a drive signal provided to the optical source and corresponding optical data from the optical sensor.

14. The mold sensor of claim 13 , wherein the optical sensor is configured to identify a wavelength of light passing through the substrate, and the controller is further programmed to generate the signal based on a change in the wavelength.

15. The mold sensor of claim 13 , wherein the optical sensor includes a plurality of photodetectors, each of the photodetectors being tuned for a predetermined wavelength range.

16. The mold sensor of claim 13 , wherein the controller is further programmed to generate the signal by comparing baseline optical data measured prior to mold growth and the optical data measured during a mold detection cycle.

17. A method comprising:
driving, by a controller, an optical source coupled within a housing that defines a chamber and directed toward a nutrient-treated substrate to project light waves toward the nutrient-treated substrate;
receiving, by the controller, optical data indicative of one or more optical properties from an optical sensor that represents an interaction of the light waves with the nutrient-treated substrate;
outputting, by the controller, a signal based on the optical data being indicative of mold growth on the nutrient-treated substrate; and
estimating an out-of-plane mold growth on the nutrient-treated substrate by measuring a time shift between a signal driving the optical source and corresponding optical data.

18. The method of claim 17 , wherein the interaction is one or more of a reflection of the light waves from the nutrient-treated substrate, an absorption of the light waves by the nutrient-treated substrate, and a scattering of light waves from the nutrient-treated substrate.

19. The method of claim 17 , wherein the interaction is a transmission of the light waves passing through the nutrient-treated substrate.

20. The method of claim 17 , further comprising computing, by the controller, the out-of-plane growth on the nutrient-treated substrate.

Assignees

• Bosch Gmbh Robert

Inventors

• Yee Seow Yuen
• Laermer Franz
• Peters Christian
• Peters Oliver
• Duerichen Robert
• Wang Ning
• Rocznik Thomas

Classifications

• G01N15/0656 Primary

  using electric, e.g. electrostatic methods or magnetic methods (by investigating individual particles G01N15/1031, G01N15/12) · CPC title

• G01N1/2273

  Atmospheric sampling · CPC title

• G01N15/0625

  Optical scan of the deposits · CPC title

• G08B21/18

  Status alarms (G08B21/02 takes precedence) · CPC title

• G01N21/64

  Fluorescence; Phosphorescence · CPC title