Atomic layer deposition of rhenium containing thin films
US-10619242-B2 · Apr 14, 2020 · US
US11821084B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-11821084-B2 |
| Application number | US-202117448586-A |
| Country | US |
| Kind code | B2 |
| Filing date | Sep 23, 2021 |
| Priority date | Dec 2, 2016 |
| Publication date | Nov 21, 2023 |
| Grant date | Nov 21, 2023 |
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Methods for depositing rhenium-containing thin films are provided. In some embodiments metallic rhenium-containing thin films are deposited. In some embodiments rhenium sulfide thin films are deposited. In some embodiments films comprising rhenium nitride are deposited. The rhenium-containing thin films may be deposited by cyclic vapor deposition processes, for example using rhenium halide precursors. The rhenium-containing thin films may find use, for example, as 2D materials.
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What is claimed is: 1. A method for depositing a thin film comprising rhenium sulfide on a substrate, the method comprising two or more sequential deposition cycles each comprising alternately and sequentially contacting the substrate with a vapor-phase rhenium precursor comprising a rhenium halide compound and a vapor-phase sulfur reactant, wherein the deposition cycles are carried out at a deposition temperature of 200 to 350° C. 2. The method of claim 1 , wherein the method is an atomic layer deposition (ALD) process. 3. The method of claim 1 , wherein the method is a sequential or pulsed chemical vapor deposition (CVD) process. 4. The method of claim 1 , wherein the vapor-phase rhenium precursor comprises ReCl 5 or ReF 6 . 5. The method of claim 1 , wherein the vapor-phase sulfur reactant comprises hydrogen and sulfur. 6. The method of claim 1 , wherein the vapor-phase sulfur reactant is an alkylsulfur compound. 7. The method of claim 1 , wherein the vapor-phase sulfur reactant comprises elemental sulfur. 8. The method of claim 1 , wherein the vapor-phase sulfur reactant has the formula R-S-H, wherein R is a substituted or unsubstituted hydrocarbon. 9. The method of claim 8 , wherein R is a C1-C8 alkyl or substituted alkyl. 10. The method of claim 1 , wherein the vapor-phase sulfur reactant comprises H 2 S n , wherein n is from 4 to 10. 11. The method of claim 1 , wherein the vapor-phase sulfur reactant comprises one or more of H 2 S, (CH 3 ) 2 S, (NH 4 ) 2 S, ((CH 3 ) 2 SO), and H 2 S 2 . 12. The method of claim 1 , wherein the vapor-phase sulfur reactant comprises (NH 4 ) 2 S. 13. The method of claim 1 , wherein the rhenium sulfide thin film comprises ReS 2 . 14. The method of claim 1 , wherein the rhenium sulfide thin film comprises ReS 2 , the vapor-phase rhenium precursor comprises ReCl 5 and the vapor-phase sulfur reactant comprises H 2 S. 15. The method of claim 1 , wherein the rhenium sulfide thin film comprises a two-dimensional material. 16. The method of claim 1 , wherein the rhenium sulfide thin film serves as a high mobility channel material in a logic device. 17. The method of claim 1 , wherein the deposition cycles are repeated sequentially to form 20 molecular layers of ReS 2 or less. 18. The method of claim 1 , wherein the rhenium sulfide thin film has an S:Re ratio from 0.5 to 3. 19. The method of claim 1 , wherein the rhenium sulfide thin film is deposited on a three-dimensional structure with step coverage of greater than 90%. 20. The method of claim 1 , wherein the rhenium sulfide thin film contains less than 20-at % hydrogen, less than 2 at-% carbon and less than 20 at-% oxygen. 21. The method of claim 1 , wherein the rhenium sulfide thin film contains less than 10 at-% Cl.
characterized by the use of precursors specially adapted for ALD · CPC title
Chemical deposition, e.g. chemical vapour deposition [CVD] · CPC title
deposition by cyclic CVD, e.g. ALD, ALE or pulsed CVD · CPC title
Use of auxiliary reactants other than used for contributing to the composition of the main film, e.g. catalysts, activators or scavengers · CPC title
characterised by the deposition of metallic material · CPC title
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