Atomic layer deposition of rhenium containing thin films

US11821084B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-11821084-B2
Application numberUS-202117448586-A
CountryUS
Kind codeB2
Filing dateSep 23, 2021
Priority dateDec 2, 2016
Publication dateNov 21, 2023
Grant dateNov 21, 2023

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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Abstract

Official abstract text for this publication.

Methods for depositing rhenium-containing thin films are provided. In some embodiments metallic rhenium-containing thin films are deposited. In some embodiments rhenium sulfide thin films are deposited. In some embodiments films comprising rhenium nitride are deposited. The rhenium-containing thin films may be deposited by cyclic vapor deposition processes, for example using rhenium halide precursors. The rhenium-containing thin films may find use, for example, as 2D materials.

First claim

Opening claim text (preview).

What is claimed is: 1. A method for depositing a thin film comprising rhenium sulfide on a substrate, the method comprising two or more sequential deposition cycles each comprising alternately and sequentially contacting the substrate with a vapor-phase rhenium precursor comprising a rhenium halide compound and a vapor-phase sulfur reactant, wherein the deposition cycles are carried out at a deposition temperature of 200 to 350° C. 2. The method of claim 1 , wherein the method is an atomic layer deposition (ALD) process. 3. The method of claim 1 , wherein the method is a sequential or pulsed chemical vapor deposition (CVD) process. 4. The method of claim 1 , wherein the vapor-phase rhenium precursor comprises ReCl 5 or ReF 6 . 5. The method of claim 1 , wherein the vapor-phase sulfur reactant comprises hydrogen and sulfur. 6. The method of claim 1 , wherein the vapor-phase sulfur reactant is an alkylsulfur compound. 7. The method of claim 1 , wherein the vapor-phase sulfur reactant comprises elemental sulfur. 8. The method of claim 1 , wherein the vapor-phase sulfur reactant has the formula R-S-H, wherein R is a substituted or unsubstituted hydrocarbon. 9. The method of claim 8 , wherein R is a C1-C8 alkyl or substituted alkyl. 10. The method of claim 1 , wherein the vapor-phase sulfur reactant comprises H 2 S n , wherein n is from 4 to 10. 11. The method of claim 1 , wherein the vapor-phase sulfur reactant comprises one or more of H 2 S, (CH 3 ) 2 S, (NH 4 ) 2 S, ((CH 3 ) 2 SO), and H 2 S 2 . 12. The method of claim 1 , wherein the vapor-phase sulfur reactant comprises (NH 4 ) 2 S. 13. The method of claim 1 , wherein the rhenium sulfide thin film comprises ReS 2 . 14. The method of claim 1 , wherein the rhenium sulfide thin film comprises ReS 2 , the vapor-phase rhenium precursor comprises ReCl 5 and the vapor-phase sulfur reactant comprises H 2 S. 15. The method of claim 1 , wherein the rhenium sulfide thin film comprises a two-dimensional material. 16. The method of claim 1 , wherein the rhenium sulfide thin film serves as a high mobility channel material in a logic device. 17. The method of claim 1 , wherein the deposition cycles are repeated sequentially to form 20 molecular layers of ReS 2 or less. 18. The method of claim 1 , wherein the rhenium sulfide thin film has an S:Re ratio from 0.5 to 3. 19. The method of claim 1 , wherein the rhenium sulfide thin film is deposited on a three-dimensional structure with step coverage of greater than 90%. 20. The method of claim 1 , wherein the rhenium sulfide thin film contains less than 20-at % hydrogen, less than 2 at-% carbon and less than 20 at-% oxygen. 21. The method of claim 1 , wherein the rhenium sulfide thin film contains less than 10 at-% Cl.

Assignees

Inventors

Classifications

  • characterized by the use of precursors specially adapted for ALD · CPC title

  • Chemical deposition, e.g. chemical vapour deposition [CVD] · CPC title

  • deposition by cyclic CVD, e.g. ALD, ALE or pulsed CVD · CPC title

  • Use of auxiliary reactants other than used for contributing to the composition of the main film, e.g. catalysts, activators or scavengers · CPC title

  • characterised by the deposition of metallic material · CPC title

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What does patent US11821084B2 cover?
Methods for depositing rhenium-containing thin films are provided. In some embodiments metallic rhenium-containing thin films are deposited. In some embodiments rhenium sulfide thin films are deposited. In some embodiments films comprising rhenium nitride are deposited. The rhenium-containing thin films may be deposited by cyclic vapor deposition processes, for example using rhenium halide prec…
Who is the assignee on this patent?
Asm Ip Holding Bv
What technology area does this patent fall under?
Primary CPC classification C23C16/45553. Mapped technology areas include Chemistry & Metallurgy.
When was this patent published?
Publication date Tue Nov 21 2023 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 3 related publications on this page (citations in our corpus or others sharing the same primary CPC).