Atomic force microscopy apparatus, methods, and applications

Patent metadata

Field	Value
Publication number	US-11808783-B2
Application number	US-202117507104-A
Country	US
Kind code	B2
Filing date	Oct 21, 2021
Priority date	May 10, 2017
Publication date	Nov 7, 2023
Grant date	Nov 7, 2023

Abstract

Atomic force microscopy apparatus and method that enable observing charge generation transients with nanometer spatial resolution and nanosecond to picosecond time resolution, the timescale relevant for studying photo-generated charges in the world's highest efficiency photovoltaic films. The AFM apparatus includes an AFM, a light source for illumination of a sample operatively coupled to the AFM, a voltage source operatively coupled to the AFM, and a control circuitry operatively coupled to the light source and the voltage source. The AFM apparatus improves the time resolution and enables rapid acquisition of photocapacitance transients in a wide array of solar-energy-harvesting materials.

First claim

What is claimed is:

1. An atomic force microscope (AFM) apparatus, comprising:
a cantilever having a tip at a distal end;
a driving element arranged to control movement of the cantilever;
a first light source directed toward an AFM sample disposed adjacent a tip of the cantilever;
a second light source directed toward the tip of the cantilever;
a photodetector disposed to receive incident light from the second light source reflected from the tip of the cantilever and to output a signal relating to at least one of a position of the tip of the cantilever and movement of the tip of the cantilever;
a voltage source configured to provide a pulsed voltage to the cantilever and to the first light source to cause the first light source to output a light pulse toward an AFM sample; and
a control circuit operatively coupled at least to the first light source and the voltage source.

2. The AFM apparatus of claim 1 , further comprising a timing component operatively coupled to the control circuit to trigger the voltage source and the first light source.

3. The AFM apparatus of claim 1 , wherein the voltage source comprises a pulse generator operatively coupled to the control circuit.

4. The AFM apparatus of claim 1 , wherein said first light source comprises a laser providing pulsed coherent light at a predetermined energy.

5. The AFM apparatus of claim 4 , wherein said first light source and said second light source are configured to emit light at different wavelengths.

6. The AFM apparatus of claim 3 , wherein the pulse generator is configured to modulate the pulsed voltage.

7. A system for measuring the time-evolution of charge or polarization induced by light in a sample, comprising:
a first laser positioned to illuminate a sample;
an atomic force microscope (AFM) having:
a controller,
a cantilever with a tip located at a height above the sample;
a drive mechanism operatively coupling the cantilever and the controller;
a second laser configured to emit light at the tip of the cantilever; and
a photodetector coupled to the controller;

a pulse generator operatively coupled to provide a first pulsed voltage to the first laser to drive the first laser to illuminate the sample and to provide a second pulsed voltage to the cantilever to generate a voltage at the tip of the cantilever; and
and
a timing component configured to trigger the pulse generator.

8. The system of claim 7 , wherein the first laser is configured to emit the pulsed light at a first wavelength and the second laser is configured to emit light at a second wavelength different than the first wavelength.

9. The system of claim 7 , wherein the drive mechanism is a piezoelectric element
configured to oscillate the cantilever.

10. The system of claim 7 , wherein the timing component triggering the pulse generator comprises one or more user selectable time intervals.

11. The system of claim 7 , wherein the controller is configured to determine a frequency of the cantilever as a function of time.

12. The system of claim 7 , wherein the controller is configured to determine a phase of the cantilever as a function of time.

13. The system of claim 7 , wherein the pulsed second voltage comprises a step voltage.

14. The system of claim 7 , wherein the pulsed second voltage comprises a sinusoidal voltage.

15. The system of claim 7 , wherein a pulse width of the first pulsed voltage is different than a pulse width of the second pulsed voltage.

16. The system of claim 7 , wherein the pulse generator is configure to temporally offset an initiation of the first pulsed voltage from an initiation of the second pulsed voltage.

17. The system of claim 7 , wherein the controller is configured to determine a cantilever phase shift and/or a cantilever amplitude shift via a lock-in amplifier.

18. The system of claim 1 , wherein the controller is configured to determine a time-evolution of a photocapacitance of a sample using measured changes in the cantilever amplitude and/or measured changes in the cantilever phase over time.

19. The system of claim 1 , wherein the light pulse is synchronized to an oscillation of the cantilever.

20. The system of claim 3 , wherein the control circuit is configured to cause the pulse generator to sequentially provide the pulsed voltage to the cantilever, terminate the pulsed voltage to the cantilever, and provide the pulsed voltage to the first light source, wherein the first light source outputs the light pulse subsequent to termination of the pulsed voltage to the cantilever.

Assignees

• Univ Cornell

Inventors

• Marohn John
• Nathan Sarah
• Dwyer Ryan

Classifications

• G01Q30/00 Primary

  Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices · CPC title

• G01Q60/30 Primary

  Scanning potential microscopy · CPC title

• G01Q60/48

  Probes, their manufacture, or their related instrumentation, e.g. holders · CPC title

• H02S50/15

  using optical means, e.g. using electroluminescence · CPC title

• Y02E10/50

  Photovoltaic [PV] energy · CPC title