Atomic force microscopy apparatus, methods, and applications

Patent metadata

Field	Value
Publication number	US-11175306-B2
Application number	US-201816612473-A
Country	US
Kind code	B2
Filing date	May 10, 2018
Priority date	May 10, 2017
Publication date	Nov 16, 2021
Grant date	Nov 16, 2021

Abstract

Atomic force microscopy apparatus and method that enable observing charge generation transients with nanometer spatial resolution and nanosecond to picosecond time resolution, the timescale relevant for studying photo-generated charges in the world's highest efficiency photovoltaic films. The AFM apparatus includes an AFM, a light source for illumination of a sample operatively coupled to the AFM, a voltage source operatively coupled to the AFM, and a control circuitry operatively coupled to the light source and the voltage source. The AFM apparatus improves the time resolution and enables rapid acquisition of photocapacitance transients in a wide array of solar-energy-harvesting materials.

First claim

What is claimed is:

1. A method for measuring the time-evolution of charge or polarization induced by light in a sample, comprising the steps of:
providing an atomic force microscope (AFM) in operating condition including a light source for illumination of a sample, and further including a voltage source;
obtaining a reference measurement of at least one of an amplitude, a frequency, and a phase of a cantilever of the operating AFM;
applying, with the voltage source, a ΔV pulse between the cantilever and the sample, and illuminating the sample with a light pulse from the light source;
determining at least one of a change in the cantilever amplitude or phase by measuring the amplitude or phase after the ΔV pulse; and
determining the time-evolution of charge or polarization based at least in part on a determined change in the cantilever amplitude or phase, wherein the change in cantilever amplitude or phase is a function of a duration of the ΔV pulse, a duration of the light pulse, or a relative time delay between two or more ΔV pulses or two or more light pulses.

2. The method of claim 1 , further comprising triggering a timing component operatively coupled to the AFM.

3. The method of claim 2 , wherein the timing component is a gated cantilever clock.

4. The method of claim 2 , wherein the step of applying the ΔV pulse between the cantilever and the sample and illuminating the sample with the light pulse occurs for a length of time programmed at the timing component.

5. The method of claim 4 , further comprising terminating application of the ΔV pulse between the cantilever and the sample after the length of time.

6. The method of claim 4 , further comprising terminating illumination of the sample with the light pulse after the length of time.

7. The method of claim 1 , further comprising detecting deflection of the cantilever via a photodetector of the AFM.

8. The method of claim 1 , wherein the sample is an organic photovoltaic (OPV) material.

9. The method of claim 1 , wherein the time-evolution of sample charge is extracted from measurements of a cantilever phase shift as a function of the duration of the ΔV pulse.

10. The method of claim 1 , further comprising varying the duration of the ΔV pulse, the duration of the light pulse, or the relative time delay between two or more ΔV pulses or two or more light pulses.

11. A method for measuring the time-evolution of charge or polarization induced by light in a sample, comprising the steps of:
providing an atomic force microscope (AFM) in operating condition including a light source for illumination of a sample, and further including a voltage source;
obtaining a reference measurement of at least one of an amplitude, a frequency, and a phase of a cantilever of the operating AFM;
applying, with the voltage source, a ΔV pulse between the cantilever and the sample and illuminating the sample with a light pulse from the light source, wherein the light source comprises a first laser configured to emit light pulses at a tip of the cantilever, and further comprises a second laser configured to emit light pulses at the tip of the cantilever; and
determining at least one of a change in the cantilever amplitude or phase versus: (i) a duration of the ΔV pulse, (ii) a duration of the light pulse, or (iii) a relative time delay between two or more ΔV pulses or two or more light pulses.

12. The method of claim 11 , wherein the first laser is configured to emit light at approximately 405 nm, and the second laser is configured to emit light at approximately 1490 nm.

13. The method of claim 11 , further comprising a splitter between the second laser and the cantilever.

14. The method of claim 13 , wherein the splitter is a 10/90 splitter.

15. A method for measuring the time-evolution of charge or polarization induced by light in a sample, comprising the steps of:
providing an atomic force microscope (AFM) in operating condition including a light source for illumination of a sample, and further including a voltage source;
obtaining a reference measurement of at least one of an amplitude, a frequency, and a phase of a cantilever of the operating AFM;
applying, with the voltage source, a ΔV pulse between the cantilever and the sample and illuminating the sample with a light pulse from the light source;
determining at least one of a change in the cantilever amplitude or phase versus: (i) a duration of the ΔV pulse, (ii) a duration of the light pulse, or (iii) a relative time delay between two or more ΔV pulses or two or more light pulses; and
deriving a photocapacitance measurement of the sample from the determined at least one of a change in the cantilever amplitude or phase versus a duration of the ΔV pulse, a duration of the light pulse, or a relative time delay between two or more ΔV pulses or two or more light pulses.

16. The method of claim 15 , wherein the photocapacitance measurement of the sample comprises a sub-microsecond photocapacitance change.

Assignees

• Univ Cornell

Inventors

• Marohn John
• Nathan Sarah
• Dwyer Ryan

Classifications

• G01Q60/30 Primary

  Scanning potential microscopy · CPC title

• H02S50/15

  using optical means, e.g. using electroluminescence · CPC title

• Y02E10/50

  Photovoltaic [PV] energy · CPC title

• G01Q60/48

  Probes, their manufacture, or their related instrumentation, e.g. holders · CPC title

• G01Q30/00 Primary

  Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices · CPC title