Somatostatin modulators and uses thereof
US-2022048924-A1 · Feb 17, 2022 · US
US11773076B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-11773076-B2 |
| Application number | US-202217673579-A |
| Country | US |
| Kind code | B2 |
| Filing date | Feb 16, 2022 |
| Priority date | Feb 17, 2021 |
| Publication date | Oct 3, 2023 |
| Grant date | Oct 3, 2023 |
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Described herein are crystalline forms of 4-[(3S)-3-aminopyrrolidin-1-yl]-6-cyano-5-(3,5-difluorophenyl)-N-[(2S)-1,1,1-trifluoropropan-2-yl]pyridine-3-carboxamide, uses of such crystalline forms in the preparation of pharmaceutical compositions for the treatment of diseases or conditions that would benefit by administration with a somatostatin modulator compound.
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What is claimed is: 1. A crystalline form of 4-[(3S)-3-aminopyrrolidin-1-yl]-6-cyano-5-(3,5-difluorophenyl)-N-[(2S)-1,1,1-trifluoropropan-2-yl]pyridine-3-carboxamide (Compound 1): wherein the crystalline form is crystalline Pattern A of Compound 1 characterized as having: an XRPD pattern with peaks at 9.4±0.2° 2-Theta, 12.9±0.2° 2-Theta, 13.3±0.2° 2-Theta, 17.1±0.2° 2-Theta, 18.8±0.2° 2-Theta, 19.3±0.2° 2-Theta, and 20.7±0.2° 2-Theta as measured with Cu Kα1 radiation; wherein the crystalline form is crystalline Pattern B of Compound 1 characterized as having: an X-Ray Powder Diffraction (XRPD) pattern substantially the same as shown in FIG. 4 as measured with Cu Kα1 radiation; wherein the crystalline form is crystalline Pattern C of Compound 1 characterized as having an X-Ray Powder Diffraction (XRPD) pattern substantially the same as shown in FIG. 6 as measured with Cu Kα1 radiation; or wherein the crystalline form is crystalline Pattern D of Compound 1 characterized as having: an X-Ray Powder Diffraction (XRPD) pattern substantially the same as shown in FIG. 7 as measured with Cu Kα1 radiation. 2. The crystalline form of claim 1 , wherein the crystalline form is crystalline Pattern A of Compound 1. 3. The crystalline form of claim 2 , wherein the crystalline Pattern A of Compound 1 is characterized as having: an X-Ray Powder Diffraction (XRPD) pattern substantially the same as shown in FIG. 1 as measured with Cu Kα1 radiation; an XRPD pattern with peaks at 9.4±0.2° 2-Theta, 12.9±0.2° 2-Theta, 13.3±0.2° 2-Theta, 17.1±0.2° 2-Theta, 18.8±0.2° 2-Theta, 19.3±0.2° 2-Theta, and 20.7±0.2° 2-Theta as measured with Cu Kα1 radiation; a Differential Scanning calorimetry (DSC) thermogram substantially the same as shown in: FIG. 2 ; or FIG. 3 ; a DSC thermogram with: an endotherm having onset at about 96.5° C. and peak at about 106.0° C.; or an endotherm having onset at about 86.6° C. and peak at about 101.4° C.; a Thermogravimetric Analysis (TGA) pattern substantially the same as shown in FIG. 3 ; a TGA pattern with a w/w loss of about 3.08% from 50 to 145° C.; reversible water uptake of about 0.7% between 2% and 95% relative humidity; an unchanged XRPD pattern after Dynamic Vapor Sorption (DVS) analysis between 2% and 95% relative humidity; an unchanged XRPD pattern after storage at 40° C./75% relative humidity for 7 days; an unchanged XRPD pattern after DSC analysis with thermal cycling from 30° C. to 118° C.; an XRPD pattern that converts to amorphous material after DSC analysis with thermal cycling from 30° C. to 150° C.; unit cell parameters substantially equal to the following at 100 K: Crystal System Monoclinic Space Group P2 1 a (Å) 10.1810(2) b (Å) 9.9510(2) c (Å) 10.7342(2) α 90° β 114.6748(5)° γ 90° V (Å 3 ) 988.20(3) Z 2 Calculated Density (Mg/m 3 ) 1.537 Absorption coefficient (mm −1 ) 1.169 F(000) 472 or combinations thereof. 4. The crystalline form of claim 2 , wherein the crystalline Pattern A of Compound 1 is characterized as having: an X-Ray Powder Diffraction (XRPD) pattern with peaks at 9.4±0.2° 2-Theta, 12.9±0.2° 2-Theta, 13.3±0.2° 2-Theta, 17.1±0.2° 2-Theta, 18.8±0.2° 2-Theta, 19.3±0.2° 2-Theta, and 20.7±0.2° 2-Theta as measured with Cu Kα1 radiation. 5. The crystalline form of claim 2 , wherein the crystalline Pattern A of Compound 1 is characterized as having: an X-Ray Powder Diffraction (XRPD) pattern substantially the same as shown in FIG. 1 as measured with Cu Kα1 radiation. 6. The crystalline form of claim 5 , wherein the crystalline Pattern A of Compound 1 is characterized as having: a Differential Scanning calorimetry (DSC) thermogram substantially the same as shown in FIG. 2 . 7. The crystalline form of claim 4 , wherein the crystalline Pattern A of Compound 1 is characterized as having: a Differential Scanning calorimetry (DSC) thermogram with an endotherm having onset at about 96.5° C. and peak at about 106.0° C. 8. The crystalline form of claim 4 , wherein the crystalline Pattern A of Compound 1 is characterized as having: a Differential Scanning calorimetry (DSC) thermogram with an endotherm having onset at about 86.6° C. and peak at about 101.4° C. 9. The crystalline form of claim 5 , wherein the crystalline Pattern A of Compound 1 is characterized as having: a Differential Scanning calorimetry (DSC) thermogram substantially the same as shown in FIG. 3 . 10. The crystalline form of claim 4 , wherein the crystalline Pattern A of Compound 1 is characterized as having: a Thermogravimetric Analysis (TGA) pattern with a w/w loss of about 3.08% from 50 to 145° C. 11. The crystalline form of claim 5 , wherein the crystalline Pattern A of Compound 1 is characterized as having: a Thermogravimetric Analysis (TGA) pattern substantially the same as shown in FIG. 3 . 12. The crystalline form of claim 4 , wherein the crystalline Pattern A of Compound 1 is characterized as having: reversible water uptake of about 0.7% between 2% and 95% relative humidity. 13. The crystalline form of claim 4 , wherein the crystalline Pattern A of Compound 1 is characterized as having: an unchanged X-Ray Powder Diffraction (XRPD) pattern after Dynamic Vapor Sorption (DVS) analysis between 2% and 95% relative humidity; an unchanged XRPD pattern after storage at 40° C./75% relative humidity for 7 days; an unchanged XRPD pattern after Differential Scanning calorimetry (DSC) analysis with thermal cycling from 30° C. to 118° C.; or an XRPD pattern that converts to amorphous material after DSC analysis with thermal cycling from 30° C. to 150° C. 14. The crystalline form of claim 2 , wherein the crystalline Pattern A of Compound 1 is characterized as having unit cell parameters substantially equal to the following at 100 K: Crystal System Monoclinic Space Group
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