Integrated Semiconductor Device Having a Level Shifter
US-2015311196-A1 · Oct 29, 2015 · US
US11770010B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-11770010-B2 |
| Application number | US-202218064209-A |
| Country | US |
| Kind code | B2 |
| Filing date | Dec 9, 2022 |
| Priority date | Sep 16, 2014 |
| Publication date | Sep 26, 2023 |
| Grant date | Sep 26, 2023 |
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GaN-based half bridge power conversion circuits employ control, support and logic functions that are monolithically integrated on the same devices as the power transistors. In some embodiments a low side GaN device communicates through one or more level shift circuits with a high side GaN device. Various embodiments of level shift circuits and their inventive aspects are disclosed.
Opening claim text (preview).
What is claimed is: 1. A circuit, comprising: a low-side circuit disposed on a first semiconductor die, the first semiconductor die formed from at least one layer of gallium-nitride disposed on a layer of silicon, wherein the low-side circuit comprises: a low-side switch comprising a low-side switch control gate, a low-side source, and a low-side drain; a low-side driver circuit coupled to the low-side switch control gate and arranged to control a conductivity state of the low-side switch in response to receiving a first input signal; wherein the first semiconductor die is disposed within a first electronic package that includes a first die-attach pad attached to the first semiconductor die, a first external terminal electrically connected to the low-side source and a second external terminal electrically connected to the low-side drain; and a high-side circuit disposed on a second semiconductor die, the second semiconductor die formed from at least one layer of gallium-nitride disposed on a layer of silicon, wherein the high-side circuit comprises: a high-side switch comprising a high-side switch control gate, a high-side source, and a high-side drain; and a high-side driver circuit coupled to the high-side switch control gate and arranged to control a conductivity state of the high-side switch in response to receiving a second input signal; wherein the second semiconductor die is disposed within a second electronic package that includes a second die-attach pad attached to the second semiconductor die, a third external terminal electrically connected to the high-side source and a fourth external terminal electrically connected to the high-side drain; wherein the low-side drain is electrically connected to the high-side source forming a half-bridge circuit. 2. The circuit of claim 1 wherein the first and second electronic packages are quad-flat no-lead electronic packages. 3. The circuit of claim 1 further comprising a first mold compound at least partially encapsulating the first semiconductor die and a second mold compound at least partially encapsulating the second semiconductor die. 4. The circuit of claim 1 wherein the at least one layer of gallium-nitride comprises a composite stack of III-nitride layers. 5. The circuit of claim 1 wherein the at least one layer of gallium-nitride comprises a layer of aluminum gallium nitride. 6. The circuit of claim 1 wherein the low-side switch and the high-side switch are each enhancement-mode transistors. 7. The circuit of claim 1 further comprising a level-shift circuit electrically coupled to the high-side driver circuit. 8. The circuit of claim 1 wherein the low-side drain and the high-side source are electrically connected through the second external terminal and the third external terminal. 9. A half-bridge circuit, comprising: a low-side circuit disposed on one or more gallium-nitride layers of a first semiconductor device, wherein the low-side circuit comprises: a low-side transistor comprising a low-side transistor control gate, a low-side source, and a low-side drain wherein the low-side transistor is controlled by a low-side transistor driver circuit arranged to change a conductivity state of the low-side transistor in response to receiving a first input signal; wherein the first semiconductor device is disposed within a first electronic package that includes a first die-attach pad attached to the first semiconductor device, a first external terminal electrically connected to the low-side source, and a second external terminal electrically coupled to the low-side drain; and a high-side circuit disposed on one or more gallium-nitride layers of a second semiconductor device, wherein the high-side circuit comprises: a high-side transistor comprising a high-side transistor control gate, a high-side source, and a high-side drain wherein the high-side transistor is controlled by a high-side transistor driver circuit arranged to change a conductivity state of the high-side transistor in response to receiving a second input signal; wherein the second semiconductor device is disposed within a second electronic package that includes a second die-attach pad attached to the second semiconductor device, a third external terminal electrically connected to the high-side source and a fourth external terminal electrically connected to the high-side drain; wherein the low-side drain is electrically connected to the high-side source forming a switch node of the half-bridge circuit. 10. The half-bridge circuit of claim 9 wherein the first and second electronic packages are quad-flat no-lead electronic packages. 11. The half-bridge circuit of claim 9 wherein the one or more gallium-nitride layers comprises a composite stack of III-nitride layers. 12. The half-bridge circuit of claim 9 wherein the low-side transistor and the high-side transistor are each enhancement-mode transistors. 13. The half-bridge circuit of claim 9 further comprising a level-shift circuit electrically coupled to the high-side transistor driver circuit. 14. The half-bridge circuit of claim 9 wherein the low-side drain and the high-side source are electrically connected through the second external terminal and the third external terminal. 15. The half-bridge circuit of claim 9 wherein the low-side transistor driver circuit is disposed on the first semiconductor device. 16. The half-bridge circuit of claim 9 wherein the low-side transistor driver circuit is disposed on a third semiconductor device. 17. The half-bridge circuit of claim 9 wherein the high-side transistor driver circuit is disposed on the second semiconductor device. 18. The half-bridge circuit of claim 9 wherein the high-side transistor driver circuit is disposed on a third semiconductor device. 19. A half-bridge power converter, comprising: a low-side circuit disposed on a first semiconductor device, the first semiconductor device formed from a first semiconductor substrate comprising gallium-nitride, wherein the low-side circuit comprises: a low-side transistor including a low-side switch control gate, a low-side source, and a low-side drain wherein the low-side transistor is controlled by a low-side transistor driver circuit arranged to control a conductivity state of the low-side transistor in response to receiving a first input signal; wherein the first semiconductor device is attached to a first die-attach pad, the low-side source is electrically connected to a first external terminal, and the low-side drain is electrically connected to a second external terminal; and a high-side circuit disposed on a second semiconductor device, the second semiconductor device formed from a second semiconductor substrate comprising gallium-nitride, wherein the high-side circuit comprises: a high-side transistor including a high-side switch control gate, a high-side source, and a high-side drain wherein the high-side transistor is controlled by a high-side transistor driver circuit arranged to control a conductivity state of the high-side transistor in response to receiving a second input signal; wherein the second semiconductor device is attached to a second die-attach pad, the high-side source is electrically connected to a third external terminal and the high-side drain is electrically connected to a fourth external terminal; wherein the low-side drain is electrically connected to the high-side source forming a switch-node of the half-bridge power converter. 20. The half-bridge power converter of claim 19 wherein t
Multiple chips on leadframes · CPC title
Package configurations · CPC title
for devices being provided for in groups H10D8/00 - H10D48/00 · CPC title
Chip-supporting parts, e.g. die pads · CPC title
protecting against overcurrent or overload, e.g. fuses or shunts (integrated devices comprising arrangements for electrical protection H10D89/60) · CPC title
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