What is claimed is:
1. A device for measuring a plasma ion density, comprising:
a transceiver antenna configured to apply and receive a microwave, of which a frequency is varied, to and from plasma; and
a frequency analyzer configured to analyze one frequency of the microwave received from the transceiver antenna and measure a cut-off frequency of mass center momentum of a plurality of types of ions,
wherein the frequency of the microwave applied to the plasma is varied in a range of 100 kHz to 500 MHz.
2. The device of claim 1 , further comprising a converter configured to convert the cut-off frequency, which is measured by the frequency analyzer, into the plasma ion density.
3. The device of claim 1 , wherein the transceiver antenna includes a probe-type antenna.
4. The device of claim 1 , wherein the transceiver antenna includes a loop-type antenna.
5. The device of claim 1 , wherein the transceiver antenna includes a planar ring-type antenna.
6. The device of claim 1 , wherein the transceiver antenna includes a planar cone-type antenna.
7. The device of claim 1 , wherein the transceiver antenna includes a planar bar-type antenna.
8. A method of diagnosing plasma, comprising:
generating plasma in a vacuum chamber;
applying and receiving a microwave, of which a frequency is varied in the vacuum chamber, to and from the plasma;
analyzing the frequency of the microwave received from a transceiver antenna and measuring a cut-off frequency;
converting the cut-off frequency, which is measured by a frequency analyzer, into a plasma ion density and a plasma electron density; and
comparing the plasma ion density with the plasma electron density, which are converted by a converter.