Semiconductor memory device and method of fabricating the same
US-2022399367-A1 · Dec 15, 2022 · US
US11728304B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-11728304-B2 |
| Application number | US-202117240641-A |
| Country | US |
| Kind code | B2 |
| Filing date | Apr 26, 2021 |
| Priority date | Sep 28, 2020 |
| Publication date | Aug 15, 2023 |
| Grant date | Aug 15, 2023 |
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A nonvolatile memory device including a substrate extending in a first direction, a ground selection line extending in the first direction on the substrate, a plurality of word lines stacked sequentially on the ground selection line and extending in the first direction, a landing pad spaced apart from the ground selection line and the plurality of word lines in the first direction, a rear contact plug connected to a lower face of the landing pad and extending in a second direction intersecting the first direction, a front contact plug connected to an upper face of the landing pad opposite the lower face and extending in the second direction, an input/output pad electrically connected to the rear contact plug, and an upper bonding pad electrically connected to the front contact plug and connected to at least a part of a plurality of circuit elements of the nonvolatile memory device.
Opening claim text (preview).
What is claimed is: 1. A nonvolatile memory device comprising: a substrate extending in a first direction; a ground selection line extending in the first direction on the substrate; a plurality of word lines stacked sequentially on the ground selection line and extending in the first direction; a landing pad spaced apart from the ground selection line and the plurality of word lines in the first direction; a rear contact plug connected to a lower face of the landing pad and extending in a second direction intersecting the first direction and perpendicular to an upper surface of the substrate; a front contact plug connected to an upper face of the landing pad that is opposite the lower face, the front contact plug extending in the second direction; an input/output pad connected to the rear contact plug; and an upper bonding pad electrically connected to the front contact plug and connected to at least a part of a plurality of circuit elements of the nonvolatile memory device. 2. The nonvolatile memory device of claim 1 , wherein at least a part of a rear contact face at which the landing pad and the rear contact plug converge overlaps at least a part of a front contact face at which the landing pad and the front contact plug converge, when viewed in the second direction. 3. The nonvolatile memory device of claim 2 , wherein the front contact face overlaps the rear contact face when viewed in the second direction. 4. The nonvolatile memory device of claim 1 , wherein a rear contact face at which the landing pad and the rear contact plug converge does not overlap a front contact face at which the landing pad and the front contact plug converge, when viewed in the second direction. 5. The nonvolatile memory device of claim 1 , wherein a first length of the upper bonding pad in the first direction is smaller than a second length of the landing pad in the first direction. 6. The nonvolatile memory device of claim 1 , wherein the landing pad includes at least four landing pads formed sequentially in the second direction. 7. The nonvolatile memory device of claim 1 , wherein the landing pad is disposed at a same height as the ground selection line. 8. The nonvolatile memory device of claim 1 , wherein the landing pad is disposed at a same height as at least one of the plurality of word lines. 9. The nonvolatile memory device of claim 1 , wherein the landing pad includes at least four landing pads spaced apart from each other in the first direction. 10. A nonvolatile memory device comprising: a peripheral region including a plurality of circuit elements; and a cell region which is electrically connected to the plurality of circuit elements and that stores data, wherein the cell region comprises a substrate extending in a first direction, a ground selection line extending in the first direction on the substrate, a plurality of word lines stacked sequentially on the ground selection line and extending in the first direction, a channel structure penetrating the ground selection line and the plurality of word lines, and extending in a second direction intersecting the first direction and perpendicular to an upper surface of the substrate, a landing pad spaced apart from the ground selection line and the plurality of word lines in the first direction, a rear contact plug connected to a lower face of the landing pad and extending in the second direction intersecting the first direction, a front contact plug connected to an upper face of the landing pad that is opposite the lower face, the front contact plug extending in the second direction, an input/output pad electrically connected to the rear contact plug; and an upper bonding pad electrically connected to the front contact plug and connected to at least a part of the plurality of circuit elements of the nonvolatile memory device. 11. The nonvolatile memory device of claim 10 , wherein at least a part of a rear contact face at which the landing pad and the rear contact plug converge overlaps at least a part of a front contact face at which the landing pad and the front contact plug converge, when viewed in the second direction. 12. The nonvolatile memory device of claim 11 , wherein the front contact face overlaps the rear contact face when viewed in the second direction. 13. The nonvolatile memory device of claim 10 , wherein a rear contact face at which the landing pad and the rear contact plug converge does not overlap a front contact face at which the landing pad and the front contact plug converge, when viewed in the second direction. 14. The nonvolatile memory device of claim 10 , wherein a first length of the upper bonding pad in the first direction is smaller than a second length of the landing pad in the first direction. 15. The nonvolatile memory device of claim 10 , wherein the landing pad includes at least four landing pads formed sequentially in the second direction. 16. The nonvolatile memory device of claim 10 , wherein the landing pad is disposed at a same height as the ground selection line. 17. The nonvolatile memory device of claim 10 , wherein the landing pad is disposed at a same height as at least one of the plurality of word lines. 18. The nonvolatile memory device of claim 10 , wherein the landing pad includes at least four landing pads spaced apart from each other in the first direction. 19. A nonvolatile memory system comprising: a main board; a nonvolatile memory device on the main board; and a controller electrically connected to the nonvolatile memory device on the main board, wherein the nonvolatile memory device comprises a substrate extending in a first direction, a ground selection line extending in the first direction on the substrate, a plurality of word lines stacked sequentially on the ground selection line and extending in the first direction, a channel structure penetrating the ground selection line and the plurality of word lines and extending in a second direction intersecting the first direction and perpendicular to an upper surface of the substrate, the channel structure storing data, a landing pad spaced apart from the ground selection line and the plurality of word lines in the first direction, a rear contact plug connected to a lower face of the landing pad and extending in the second direction intersecting the first direction, a front contact plug connected to an upper face of the landing pad that is opposite the lower face, the front contact plug extending in the second direction, an input/output pad electrically connected to the rear contact plug, and an upper bonding pad electrically connected to the front contact plug and connected to at least a part of a plurality of circuit elements of the nonvolatile memory device. 20. The nonvolatile memory system of claim 19 , wherein at least a part of a rear contact face at which the landing pad and the rear contact plug converge overlaps at least a part of a front contact face at which the landing pad and the front contact plug converge, when viewed in the second direction.
between multiple chips · CPC title
Package configurations · CPC title
Local interconnections · CPC title
the openings being via holes penetrating underlying conductors · CPC title
Interconnections within wafers or substrates, e.g. through-silicon vias [TSV] · CPC title
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