Two datum vial mounting system and method

US11725936B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-11725936-B2
Application numberUS-202117528847-A
CountryUS
Kind codeB2
Filing dateNov 17, 2021
Priority dateJan 17, 2019
Publication dateAug 15, 2023
Grant dateAug 15, 2023

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

An automatic process and structural features for accurately producing levels is provided. The process enables more rapid production of levels, less operator work or error, and the ability to quantify errors and tolerances in the manufacture of the level. Coupling a level datum plane formed on the endcaps of a vial with a level datum plane of a frame ensures accurate construction of a level that can be automated and toleranced. Ensuring that the level datum plane created at the endcaps remains parallel (or at some other predesigned angle) to the measuring surfaces of the level reduces labor to manufacture the level and ensures measurement accuracy.

First claim

Opening claim text (preview).

What is claimed is: 1. A level, comprising: a vial comprising: first and second endcaps sealed on opposite ends of the vial, each endcap comprising a level surface, wherein the level surface of the first endcap and the level surface of the second endcap are coplanar and define a first plane; and a level indicator located within the vial; and a frame comprising: two mounting surfaces that engage the level surfaces of the first and second endcaps of the vial; and a level measuring surface parallel to the first plane. 2. The level of claim 1 , wherein the level measuring surface defines a lower surface of the level. 3. The level of claim 1 , wherein the vial is coupled to the frame with an adhesive. 4. The level of claim 1 , comprising a magnet located in the level measuring surface. 5. The level of claim 1 , wherein the level measuring surface extends along a longitudinal axis of the frame. 6. The level of claim 5 , comprising: a detent in the level measuring surface; and a magnet located in the detent. 7. A level, comprising: a vial comprising: a first endcap sealed to a first end of the vial; a second endcap sealed to a second end of the vial opposite the first end, each endcap comprising a lower surface; and a level indicator located within the vial; and a frame comprising: a mounting surface that defines a first plane, the mounting surface configured to engage the lower surfaces of the first and second endcaps; and a level measuring surface that is parallel to the first plane. 8. The level of claim 7 , wherein the level measuring surface defines a lower surface of the level. 9. The level of claim 7 , wherein the vial is coupled to the frame with an adhesive. 10. The level of claim 9 , wherein the adhesive is inserted into first and second gaps between the first and second endcaps and the frame, wherein the first and second gaps are at opposing ends of the vial. 11. The level of claim 7 , comprising a lens that surrounds the vial. 12. The level of claim 7 , comprising a shroud that surrounds the first and second endcaps and the vial. 13. The level of claim 7 , wherein the lower surface of the first endcap and the lower surface of the second endcap are coplanar and define a second plane. 14. The level of claim 13 , wherein the second plane is parallel to the level measuring surface. 15. The level of claim 7 , wherein the first and second endcaps are spot welded to the mounting surface of the frame. 16. A method of installing a vial within a level frame, the method comprising: forming the vial with endcaps on opposite sides of the vial, the vial comprising a level indicator located within the vial; providing a level frame having a planar measuring surface and a flat vial mounting surface; determining a location of the level indicator within the vial when the measuring surface of the frame is oriented in a level configuration; orienting the vial at the endcaps in a level position until the level indicator is centered within a tolerance; cutting the endcaps of the oriented vial to form level surfaces on each endcap that define a level plane, wherein the level surfaces on each endcap are cut when the vial is oriented in a level position; and engaging the endcaps with the flat vial mounting surface of the frame. 17. The method of claim 16 , wherein the step of engaging the endcaps with the flat vial mounting surface of the frame comprises spot welding the endcaps to the flat vial mounting surface of the frame. 18. The method of claim 16 , wherein the step of engaging the endcaps with the flat vial mounting surface of the frame comprises inserting adhesive into gaps between the endcaps and the frame. 19. The method of claim 18 , wherein the gaps are defined between the frame and opposing ends of the vial. 20. The method of claim 16 , wherein the level frame comprises a detent in the planar measuring surface, and a magnet located in the detent.

Assignees

Inventors

Classifications

  • G01C9/28Primary

    Mountings · CPC title

  • of the tubular type, i.e. for indicating the level in one direction only · CPC title

  • G01C9/32Primary

    Means for facilitating the observation of the position of the bubble, e.g. illuminating means · CPC title

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Frequently asked questions

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What does patent US11725936B2 cover?
An automatic process and structural features for accurately producing levels is provided. The process enables more rapid production of levels, less operator work or error, and the ability to quantify errors and tolerances in the manufacture of the level. Coupling a level datum plane formed on the endcaps of a vial with a level datum plane of a frame ensures accurate construction of a level that…
Who is the assignee on this patent?
Milwaukee Electric Tool Corp
What technology area does this patent fall under?
Primary CPC classification G01C9/28. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Aug 15 2023 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 3 related publications on this page (citations in our corpus or others sharing the same primary CPC).