Control apparatus of radiation imaging apparatus, control method of the same, and radiation imaging system
US-2021067711-A1 · Mar 4, 2021 · US
US11701080B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-11701080-B2 |
| Application number | US-202117358355-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jun 25, 2021 |
| Priority date | Jun 29, 2020 |
| Publication date | Jul 18, 2023 |
| Grant date | Jul 18, 2023 |
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Provided is a radiographic imaging device including: a first hardware processor; a sensor that includes multiple semiconductor elements arranged two-dimensionally and multiple switch elements respectively connected to the semiconductor elements; a gate driver that causes each of the switch elements of the sensor to switch between a conductive state and non-conductive state so as to release charge from each of the semiconductor elements; and a reader that performs readout of a signal value according to an amount of the charge released by the each of the semiconductor elements of the sensor. The first hardware processor sets an imaging condition that affects a dose of radiation reaching the sensor, selects a gate readout pattern according to the set imaging condition among different gate readout patterns, and drives the gate driver and the reader using the selected gate readout pattern.
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What is claimed is: 1. A radiographic imaging device comprising: a first hardware processor; a sensor that includes multiple semiconductor elements arranged two-dimensionally and multiple switch elements respectively connected to the semiconductor elements; a gate driver that causes each of the switch elements of the sensor to switch between a conductive state and non-conductive state so as to release charge from each of the semiconductor elements; and a reader that performs readout of a signal value according to an amount of the charge released by the each of the semiconductor elements of the sensor; wherein the first hardware processor: sets an imaging condition that affects a dose of radiation reaching the sensor; selects a gate readout pattern according to the set imaging condition among different gate readout patterns; and drives the gate driver and the reader using the selected gate readout pattern, wherein the reader performs a first sampling action to hold a first output voltage after the each of the switch elements is in the non-conductive state, wherein the reader performs a second sampling action to hold a second output voltage after the each of the switch elements is in the conductive state, and wherein the gate readout pattern is defined by: at least one of a duration of the first sampling action, a duration of the second sampling action, and a duration of the conductive state of the each of the switch elements; and a gate period for repeating the readout of the signal value. 2. The radiographic imaging device according to claim 1 , wherein the reader comprises a charge amplifier that converts the amount of the charge released from the each of the semiconductor elements into a voltage, and the first output voltage and the second output voltage are output voltages of the charge amplifier. 3. The radiographic imaging device according to claim 1 , wherein the first hardware processor drives the reader in obtaining an exposure image using the gate readout pattern which is used in obtaining an offset image. 4. The radiographic imaging device according to claim 1 further comprising: an operation interface operable by a user; and an input unit that obtains the imaging condition input via a device other than the radiographic imaging device, wherein the first hardware processor sets the imaging condition according to a user operation via the operation interface. 5. The radiographic imaging device according to claim 1 , wherein the first hardware processor: obtains the imaging condition from a device other than the radiographic imaging device; and sets the obtained imaging condition. 6. The radiographic imaging device according to claim 1 , wherein the imaging condition is at least one of a site to be imaged and a position of the imaging device relative to the site to the imaged. 7. The radiographic imaging device according to claim 2 , wherein the first hardware processor is capable of performing binning using a binning number, wherein the first hardware processor sets the binning number, and determines a settable range of a frame rate based on the set binning number and the selected gate readout pattern. 8. The radiographic imaging device according to claim 7 , wherein the multiple semiconductor elements are arranged in a matrix, wherein the hardware processor determines a range of the frame rate based on a number of rows of the semiconductor elements, the gate period, and the binning number. 9. The radiographic imaging device according to claim 7 , wherein the first hardware processor: selects, among different sets of correction data, a set of correction data according to at least one of the binning number set by the first hardware processor, the frame rate set by the first hardware processor, and the gate readout pattern selected by the first hardware processor; and corrects the image using the selected set of correction data. 10. The radiographic imaging device according to claim 8 , wherein the first hardware processor determines the range of the frame rate based on a duration of irradiation necessary to generate a frame. 11. The radiographic imaging device according to claim 4 , wherein the hardware processor sets the binning number and the frame rate according to the user operation via the operation interface. 12. A radiographic imaging system comprising: a first hardware processor; a sensor that includes multiple semiconductor elements arranged two-dimensionally and multiple switch elements respectively connected to the semiconductor elements; a gate driver that causes each of the switch elements of the sensor to switch between a conductive state and non-conductive state so as to release charge from each of the semiconductor elements; a reader that performs readout of a signal value according to an amount of the charge released from the each of the semiconductor elements; and a second hardware processor that receives input of an imaging condition that affects a dose of radiation reaching the sensor according to a user operation, wherein the first hardware processor: sets the imaging condition received by the second hardware processor, selects a gate readout pattern according to the set imaging condition set among different gate readout patterns, and drives the readout unit using the selected gate readout pattern, wherein the reader performs a first sampling action to hold a first output voltage after the each of the switch elements is in the non-conductive state, wherein the reader performs a second sampling action to hold a second output voltage after the each of the switch elements is in the conductive state, and wherein the gate readout pattern is defined by: at least one of a duration of the first sampling action, a duration of the second sampling action, and a duration of the conductive state of the each of the switch elements; and a gate period for repeating the readout of the signal value. 13. A non-transitory storage medium storing a computer-readable program for a radiographic imaging device, the radiographic imaging device comprising: a first hardware processor; a sensor that includes multiple semiconductor elements arranged two-dimensionally and multiple switch elements respectively connected to the semiconductor elements; a gate driver that causes each of the switch elements of the sensor to switch between a conductive state and non-conductive state so as to release charge from each of the semiconductor elements; and a reader that performs readout of a signal value according to an amount of the charge released by the each of the semiconductor elements of the sensor, wherein the program causes the first hardware processor of the radiographic imaging device to: set an imaging condition that affects a dose of radiation reaching the sensor; select a gate readout pattern according to the set imaging condition among different gate readout patterns; and drive the gate driver and the reader using the selected gate readout pattern, wherein the program causes the reader to perform a first sampling action to hold a first output voltage after the each of the switch elements is in the non-conductive state, wherein the program causes the reader to perform a second sampling action to hold a second output voltage after the each of the switch elements is in the conductive state, and wherein the gate readout pattern is defined by: at least one of a duration of the first sampling action, a duration of the second sampling action, and a duration of the conductive state of the each of the switch elements; and a gate period for repeating the readout of the
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