Multiple channel locating

Patent metadata

Field	Value
Publication number	US-11680790-B2
Application number	US-201916392285-A
Country	US
Kind code	B2
Filing date	Apr 23, 2019
Priority date	Jul 8, 2008
Publication date	Jun 20, 2023
Grant date	Jun 20, 2023

Abstract

Methods, systems, and apparatuses are provided for estimating a location on an object in a three-dimensional scene. Multiple radiation patterns are produced by spatially modulating each of multiple first radiations with a distinct combination of one or more modulating structures, each first radiation having at least one of a distinct radiation path, a distinct source, a distinct source spectrum, or a distinct source polarization with respect to the other first radiations. The location on the object is illuminated with a portion of each of two or more of the radiation patterns, the location producing multiple object radiations, each object radiation produced in response to one of the multiple radiation patterns. Multiple measured values are produced by detecting the object radiations from the location on the object due to each pattern separately using one or more detector elements. The location on the object is estimated based on the multiple measured values.

First claim

What is claimed is:

1. A system comprising:
a plurality of projectors, wherein each projector from the plurality of projectors emits one or more illumination patterns and the plurality of projectors includes a first projector and a second projector wherein the first projector emits a first illumination pattern that illuminates a location on an object and the second projector emits a second illumination pattern that illuminates the location on the object; and
an imaging system that collects a plurality of object radiations from the location on the object that includes collecting a first object radiation produced at the location in response to the first illumination pattern and a second object radiation produced at the location in response to the second illumination pattern to estimate the location on the object independently from other locations on the object and to facilitate forming a three-dimensional surface image of the object, wherein the imaging system includes one or more detecting elements positioned between the first projector and the second projector.

2. The system of claim 1 , wherein the plurality of object radiations from the location are produced in response to at least the first illumination pattern and another illumination pattern from the first projector from the plurality of projectors.

3. The system of claim 1 , wherein the one or more illumination patterns from each projector from the plurality of projectors includes a set of two or more patterns.

4. The system of claim 3 , wherein the set of two or more patterns are projected in sequence.

5. The system of claim 1 , wherein the one or more illumination patterns include one or more two-dimensional illumination patterns.

6. The system of claim 5 , wherein the one or more two dimensional illumination patterns include one or more stripe patterns.

7. The system of claim 1 , wherein each projector from the plurality of projectors is oriented to project towards the object at a different angle with respect to the other projectors in the plurality of projectors.

8. The system of claim 1 , wherein each projector from the plurality of projectors includes one or more radiation sources.

9. The system of claim 8 , wherein the one or more radiation sources include one or more light emitting diodes.

10. The system of claim 1 , wherein at least two projectors from the plurality of projectors operate in sequence.

11. The system of claim 1 , wherein at least two projectors from the plurality of projectors operate simultaneously.

12. The system of claim 1 , wherein the imaging system includes a charge coupled device.

13. The system of claim 1 , wherein the imaging system includes a complementary metal-oxide-semiconductor device.

14. The system of claim 1 , wherein each projector from the plurality of projectors includes a pattern mask.

15. The system of claim 8 , wherein each projector from the plurality of projectors modulates an amplitude of radiation from the one or more radiation sources of the respective projector.

16. The system of claim 1 , wherein the one or more illumination patterns from each projector from the plurality of projectors vary across one or more illumination angles for each projector from the plurality of projectors.

17. The system of claim 1 , wherein the imaging system includes one or more processors configured to estimate the location on the object based on the plurality of object radiations.

Assignees

• Cognex Corp

Inventors

• Braker Benjamin
• Moore Eric
• Feldkhun Daniel

Classifications

• G01B11/2536

  using several gratings with variable grating pitch, projected on the object with the same angle of incidence · CPC title

• G01C3/08

  Use of electric radiation detectors · CPC title

• G01S17/89

  for mapping or imaging · CPC title

• G01S7/499

  using polarisation effects · CPC title

• G01S7/486

  Receivers · CPC title