Spatially self-similar patterned illumination for depth imaging

Patent metadata

Field	Value
Publication number	US-10088556-B2
Application number	US-201615389804-A
Country	US
Kind code	B2
Filing date	Dec 23, 2016
Priority date	Mar 10, 2014
Publication date	Oct 2, 2018
Grant date	Oct 2, 2018

Abstract

Methods, systems, and devices involving patterned radiation are provided in accordance with various embodiments. Some embodiments include a device for projecting pattern radiation. Some embodiments include a method for estimating coordinates of a location on an object in a 3D scene. Some embodiments include a system for estimating the coordinates of a location on an object in a 3D scene. A variety of radiation patterns are provided in accordance with various embodiments. Some embodiments may relate to the use of patterned illumination to identify the angular information that may be utilized to measure depth by triangulation.

First claim

What is claimed is:

1. A method for estimating coordinates of a location on an object in a 3D scene, the method comprising:
illuminating at least a portion of the 3D scene with a radiation pattern, wherein the radiation pattern includes:
a plurality of spatial symbols, wherein each spatial symbol from the plurality of spatial symbols comprises a radiation distribution such that at least one characteristic of the radiation distribution varies spatially and wherein the plurality of spatial symbols are configured such that:
each respective spatial symbol from the plurality of spatial symbols is distinguishable from the other spatial symbols from the plurality of spatial symbols; and
each respective spatial symbol from the plurality of spatial symbols is related to a master spatial symbol through a transformation operation;

detecting the radiation pattern illuminating at least the portion of the illuminated 3D scene using one or more radiation detectors; and
estimating the coordinates of the location on the object based on the detected radiation pattern.

2. The method of claim 1 , wherein the plurality of spatial symbols are further configured such that:
the plurality of spatial symbols are arranged in a spatial arrangement of spatial symbols; and
an operation taking the spatial arrangement of spatial symbols and the master spatial symbol as inputs and operating over a domain of locations within the spatial arrangement of spatial symbol yields an output with values corresponding to locations of the spatial symbols from the plurality of spatial symbols that are distinct from values corresponding to locations that are offset from the locations of the spatial symbols from the plurality of spatial symbols.

3. The method of claim 2 , wherein the operation taking the spatial arrangement of spatial symbols and the master spatial symbol as inputs and operating over the domain of locations within the spatial arrangement of spatial symbols is a spatial cross correlation operation.

4. The method of claim 3 , wherein the plurality of spatial symbols are further configured such that:
an output of the spatial cross correlation operation at locations within the domain of locations within the spatial arrangement of spatial symbols corresponding to the locations of the spatial symbols from the plurality of spatial symbols exceed a first threshold; and
an output of the spatial cross correlation operation at locations within the domain of locations within the spatial arrangement of spatial symbols corresponding to locations offset from the locations of the spatial symbols from the plurality of spatial symbols are less than a second threshold.

5. The method of claim 1 , wherein the detected radiation pattern forms an image of the 3D scene.

6. The method of claim 5 , wherein estimating the coordinates of the location on the object based on the formed image of the 3D scene comprises:
detecting one or more spatial symbols from the plurality of spatial symbols within the formed image of the 3D scene;
locating the one or more detected spatial symbols within the formed image of the 3D scene; and
identifying one or more of the detected spatial symbols.

7. The method of claim 6 , further comprising identifying one or more pattern elements within the identified spatial symbols.

8. The method of claim 7 , wherein estimating the coordinates of the location on the object utilizes a location of the one or more identified pattern elements within the formed image.

9. The method of claim 6 , wherein detecting the one or more spatial symbols includes comparing two or more regions within the formed image to the master spatial symbol.

10. The method of claim 9 , wherein comparing the two or more regions includes using a cross correlation operation.

11. The method of claim 9 , further comprising identifying one or more pattern elements within the identified spatial symbols based on a location of the one or more pattern elements within the identified spatial symbol.

12. A system for estimating coordinates of a location on an object in a 3D scene, the system comprising:
a device for projecting patterned radiation, the device comprising:
a radiation source, and
a pattern-generating element configured to produce a radiation pattern, wherein the radiation pattern includes:
a plurality of spatial symbols, wherein each spatial symbol from the plurality of spatial symbols comprises a radiation distribution such that at least one characteristic of the radiation distribution varies spatially and wherein the plurality of spatial symbols are configured such that:
each respective spatial symbol from the plurality of spatial symbols is distinguishable from the other spatial symbols from the plurality of spatial symbols; and
each respective spatial symbol from the plurality of spatial symbols is related to a master spatial symbol through a transformation operation;

one or more detector elements configured to detect the radiation pattern illuminating at least a portion of the 3D scene, and
one or more processors configured to estimate the coordinates of the location on the object in the 3D scene based on the detected radiation pattern.

13. The system of claim 12 , wherein the radiation source includes at least a laser diode, an array of vertical-cavity surface-emitting lasers, a light-emitting diode, or a lamp.

14. The system of claim 12 , wherein the pattern-generating element includes at least a mask, a diffractive optical element, or a hologram.

Assignees

• Cognex Corp

Inventors

• Braker Benjamin
• Wegner Aaron
• Zimmerman Ronald
• Moore Eric
• Mcdonald Trevor

Classifications

• G06T2207/20056

  Discrete and fast Fourier transform, [DFT, FFT] · CPC title

• G01S7/4814 Primary

  of transmitters alone · CPC title

• G01S17/42

  Simultaneous measurement of distance and other co-ordinates (indirect measurement G01S17/46) · CPC title

• G06T7/521

  from laser ranging, e.g. using interferometry; from the projection of structured light · CPC title

• G01B11/2531 Primary

  using several gratings, projected with variable angle of incidence on the object, and one detection device · CPC title