Plasma erosion resistant rare-earth oxide based thin film coatings

US11680308B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-11680308-B2
Application numberUS-202117339248-A
CountryUS
Kind codeB2
Filing dateJun 4, 2021
Priority dateJun 20, 2013
Publication dateJun 20, 2023
Grant dateJun 20, 2023

How to read this patent

A practical reading order for non-experts. Skip the full description unless you need deep technical detail.

  1. Title

    What the patent document calls the invention.

  2. Abstract

    A short plain-language summary of the technical disclosure.

  3. Assignees and inventors

    Who owns or filed the patent and who is credited as inventor.

  4. Key dates

    Filing, priority, publication, and grant dates set the timeline.

  5. First independent claim

    The legal scope of protection — read this for what is actually claimed.

  6. CPC / IPC classifications

    Technology tags used to group this patent with similar filings.

  7. Citations and related patents

    Prior art links and similar publications in this corpus.

Abstract

Official abstract text for this publication.

A chamber component for a process chamber comprises a ceramic body and one or more protective layer on at least one surface of the ceramic body, wherein the one or more protective layer comprises Y3Al5O12 having a dielectric constant of 9.76+/−up to 30% and a hermiticity of 4.4E-10 cm3/s+/−up to 30%.

First claim

Opening claim text (preview).

What is claimed is: 1. A chamber component for a process chamber, comprising: a ceramic body; and one or more protective layers on at least one surface of the ceramic body, wherein the one or more protective layers comprises Y 3 Al 5 O 12 having a dielectric constant of 9.76+/−up to 30% and a hermiticity of 4.4E-10 cm 3 /s+/−up to 30%. 2. The chamber component of claim 1 , wherein the chamber component is a chamber lid. 3. The chamber component of claim 1 , wherein the ceramic body comprises Al 2 O 3 . 4. The chamber component of claim 1 , wherein the one or more protective layers has an erosion rate of about 1 nm/hr+/−up to 30% when exposed to a CH 4 /Cl 2 plasma chemistry. 5. The chamber component of claim 1 , wherein the one or more protective layers further has at least one of a hardness of 8.5 GPa+/−up to 30%, a volume resistivity of 11.3E16 Ω·cm+/−up to 30%, or a thermal conductivity of 20.1 W/m·K+/−up to 30%. 6. The chamber component of claim 1 , wherein the one or more protective layers has a porosity of less than 1%. 7. The chamber component of claim 1 , wherein the one or more protective layers comprises 30-40 mol % Y 2 O 3 and 60-70 mol % Al 2 O 3 . 8. The chamber component of claim 1 , wherein the one or more protective layers comprises a bulk sintered ceramic that has been bonded to the ceramic body. 9. The chamber component of claim 8 , wherein the one or more protective layers comprises a thin ceramic wafer having a thickness of 200 microns+/−30%. 10. The chamber component of claim 1 , wherein the one or more protective layers comprises a thick film protective layer. 11. The chamber component of claim 10 , wherein the one or more protective layers has a thickness of about 50 microns to about 200 microns. 12. The chamber component of claim 1 , wherein the one or more protective layers comprises a thin film protective layer. 13. The chamber component of claim 12 , wherein the one or more protective layers has a thickness of below about 20 microns. 14. The chamber component of claim 1 , wherein the one or more protective layers comprises a stack of a plurality of protective layers. 15. The chamber component of claim 1 , wherein the one or more protective layers comprises a sintered ceramic. 16. The chamber component of claim 1 , wherein the one or more protective layers comprises a thick film protective layer and a thin film protective layer over the thick film protective layer. 17. The chamber component of claim 1 , wherein the process chamber is a plasma etch process chamber. 18. The chamber component of claim 17 , wherein the one or more protective layers comprises a plasma resistant layer, and wherein an external surface of the plasma resistant layer is to be exposed to a plasma. 19. A process chamber comprising: a chamber body; a substrate support within the chamber body; and a lid over the chamber body, the lid comprising: a ceramic body comprising Al 2 O 3 ; and a protective layer on at least one surface of the ceramic body, wherein the protective layer comprises Y 3 Al 5 O 12 having a dielectric constant of 9.76+/−up to 30% and a hermiticity of 4.4E-10 cm 3 /s+/−up to 30%. 20. The process chamber of claim 19 , wherein the protective layer has a porosity of less than 1% and comprises 30-40 mol % Y 2 O 3 and 60-70 mol % Al 2 O 3 .

Assignees

Inventors

Classifications

  • C23C14/08Primary

    Oxides (C23C14/10 takes precedence) · CPC title

  • characterised by the means for protecting vessels or internal parts, e.g. coatings · CPC title

  • No layer or component greater than 5 mils thick · CPC title

  • Continuous and nonuniform or irregular surface on layer or component [e.g., roofing, etc.] · CPC title

  • characterised by the process of coating · CPC title

Patent family

Related publications grouped by family.

External sources

Frequently asked questions

Answers are generated from the same data shown on this page.

What does patent US11680308B2 cover?
A chamber component for a process chamber comprises a ceramic body and one or more protective layer on at least one surface of the ceramic body, wherein the one or more protective layer comprises Y3Al5O12 having a dielectric constant of 9.76+/−up to 30% and a hermiticity of 4.4E-10 cm3/s+/−up to 30%.
Who is the assignee on this patent?
Applied Materials Inc
What technology area does this patent fall under?
Primary CPC classification C23C14/08. Mapped technology areas include Chemistry & Metallurgy.
When was this patent published?
Publication date Tue Jun 20 2023 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 12 related publications on this page (citations in our corpus or others sharing the same primary CPC).