Microscopy imaging

Patent metadata

Field	Value
Publication number	US-11635447-B2
Application number	US-202017103246-A
Country	US
Kind code	B2
Filing date	Nov 24, 2020
Priority date	Oct 28, 2009
Publication date	Apr 25, 2023
Grant date	Apr 25, 2023

Abstract

Among other things, an imaging device has a photosensitive array of pixels, and a surface associated with the array is configured to receive a specimen with at least a part of the specimen at a distance from the surface equivalent to less than about half of an average width of the pixels.

First claim

The invention claimed is:

1. An apparatus comprising:
an imaging sensor comprising
an array of photosensitive pixels at a sensor surface, and
a first surface configured to receive a specimen;

a specimen chamber configured to hold the specimen statically during imaging by the imaging sensor; and
a light source configured to illuminate the specimen at a first wavelength in a fluorescence or phosphorescence excitation band of the specimen, wherein the first surface and the sensor surface are arranged such that at least part of the specimen is at a distance from the sensor surface that is less than five times the first wavelength when the specimen is disposed on the first surface,
wherein the imaging sensor is configured to capture light at a second wavelength in a fluorescence or phosphorescence emission band of the specimen at a time after the specimen has been illuminated at the first wavelength.

2. The apparatus of claim 1 in which the first wavelength is in the far ultraviolet wavelength band.

3. The apparatus of claim 2 , in which the first wavelength is less than 300 nm.

4. The apparatus of claim 1 , in which the photosensitive pixels are insensitive to the first wavelength and sensitive to the second wavelength.

5. The apparatus of claim 1 in which the light source comprises a modulated source.

6. The apparatus of claim 1 , comprising an imaging integrated circuit coupled to the imaging sensor,
wherein the imaging integrated circuit is configured to disable sensing by the imaging sensor during illumination by the light source, and
wherein the imaging integrated circuit is configured to enable sensing by the imaging sensor in a time period after the illumination by the light source.

7. The apparatus of claim 6 in which the imaging integrated circuit is configured to enable the sensing by the imaging sensor during a decay period of fluorescence or phosphorescence after illumination by the light source.

8. The apparatus of claim 7 , wherein the decay period comprises a period of tens of nanoseconds.

9. The apparatus of claim 7 , wherein the decay period comprises a period of milliseconds.

10. A method comprising:
situating a specimen statically at an imaging sensor, wherein the imaging sensor comprises an array of photosensitive pixels,
wherein situating the specimen comprises situating the specimen at least partially within a distance from the array of photosensitive pixels that is less than five times a first wavelength, and wherein the first wavelength is in a fluorescence or phosphorescence excitation band of the specimen;

illuminating the specimen with light of the first wavelength; and
after illumination of the specimen, capturing, using the imaging sensor, while the specimen is held statically, light of a second wavelength in a fluorescence or phosphorescence emission band of the specimen, the light of the second wavelength emitted by the specimen in response to illumination by the light of the first wavelength.

11. The method of claim 10 , wherein the first wavelength is in the far ultraviolet wavelength band.

12. The method of claim 11 , wherein the first wavelength is less than 300 nm.

13. The method of claim 10 , wherein illuminating the specimen comprises illuminating the specimen with a modulated light source.

14. The method of claim 10 , comprising:
disabling sensing by the imaging sensor during the illumination with the light of the first wavelength; and
enabling sensing by the imaging sensor in a time period after the illumination with the light of the first wavelength.

15. The method of claim 14 , comprising enabling the sensing by the imaging sensor during a decay period of fluorescence or phosphorescence after illumination with the light of the first wavelength.

16. The method of claim 15 , wherein the decay period comprises a period of tens of nanoseconds.

17. The method of claim 16 , wherein the decay period comprises a period of milliseconds.

Assignees

• Alentic Microscience Inc

Inventors

• Fine Alan Marc

Classifications

• H10F39/18

  Complementary metal-oxide-semiconductor [CMOS] image sensors; Photodiode array image sensors · CPC title

• G02B21/36

  arranged for photographic purposes or projection purposes (G02B21/18 takes precedence){or digital imaging or video purposes including associated control and data processing arrangements (image data processing per se G06T)} · CPC title

• G01N2201/062

  LED's · CPC title

• G02B21/002

  Scanning microscopes (scanning near field optical microscopes G01Q60/18) · CPC title

• G02B21/0008

  Microscopes having a simple construction, e.g. portable microscopes · CPC title