Memory system capable of performing a bit partitioning process and an internal computation process

US11600319B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-11600319-B2
Application numberUS-202117351280-A
CountryUS
Kind codeB2
Filing dateJun 18, 2021
Priority dateFeb 17, 2021
Publication dateMar 7, 2023
Grant dateMar 7, 2023

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A memory system includes a plurality of first memory units, a plurality of read word lines, and a plurality of read bit lines. Each first memory unit of the plurality of first memory units includes a second memory unit, a first transistor coupled to the second memory unit, and a second transistor coupled to the second memory unit and the first transistor. Each read word line of the plurality of read word lines is coupled to a plurality of first transistors disposed along a corresponding row. Each read bit line of the plurality of read bit lines is coupled to a plurality of second transistors disposed along a corresponding column.

First claim

Opening claim text (preview).

What is claimed is: 1. A memory system comprising: a plurality of first memory units, each first memory unit of the plurality of first memory units comprising: a second memory unit; a first transistor coupled to the second memory unit; and a second transistor coupled to the second memory unit and the first transistor; a plurality of read word lines, each read word line of the plurality of read word lines being coupled to a plurality of first transistors disposed along a corresponding row; and a plurality of read bit lines, each read bit line of the plurality of read bit lines being coupled to a plurality of second transistors disposed along a corresponding column; wherein a current of the each read bit line is generated by performing a linear combination on a plurality of currents of the plurality of read word lines. 2. The system of claim 1 , further comprising: an input register array configured to receive a plurality of input data vectors; a plurality of multiplexers coupled to the input register array and the plurality of read word lines, each multiplexer of the plurality of multiplexers being configured to generate a multiplexer output signal according to the plurality of input data vectors; and a control signal generator coupled to the plurality of multiplexers and configured to generate a plurality of control signals for controlling the plurality of multiplexers. 3. The system of claim 1 , wherein the second memory unit comprises: a third transistor comprising: a first terminal coupled to a first bit line; a second terminal; and a control terminal; a fourth transistor comprising: a first terminal; a second terminal coupled to a second bit line; and a control terminal coupled to the control terminal of the third transistor; a first inverter comprising: an input terminal coupled to the second terminal of the third transistor; and an output terminal coupled to the first terminal of the fourth transistor and a control terminal of the second transistor; and a second inverter comprising: an input terminal coupled to the output terminal of the first inverter; and an output terminal coupled to the input terminal of the first inverter and a first terminal of the first transistor; wherein a second terminal of the first transistor is coupled to a first terminal of the second transistor, a control terminal of the first transistor is coupled to a read word line of the plurality of read word lines, a second terminal of the second transistor is coupled to a read bit line of the plurality of read bit lines, and two signals of the first bit line and the second bit line are complementary. 4. The system of claim 3 , wherein when the input terminal of the first inverter is at a high voltage, the input terminal of the second inverter is at a low voltage, and the first transistor and the second transistor are enabled for outputting a current to the read bit line. 5. The system of claim 3 , wherein when the input terminal of the first inverter is at a low voltage, the input terminal of the second inverter is at a high voltage, and the second transistor is disabled so that a current of the read bit line is blocked. 6. The system of claim 1 , wherein the first transistor is an N-type metal-oxide-semiconductor field-effect transistor, and the second transistor is a P-type metal-oxide-semiconductor field-effect transistor. 7. The system of claim 1 , further comprising: a plurality of voltage-to-time converters coupled to the plurality of read bit lines and configured to generate a plurality of output signals in a time domain; a plurality of analog-to-digital(A/D) converters, each A/D converter of the plurality of A/D converters being coupled to a corresponding voltage-to-time converter for outputting a digital signal; and an output synthesizer coupled to the plurality of A/D converters and configured to generate an output signal; wherein a dimension of the each A/D converter is NADC, and NADC is a positive integer. 8. The system of claim 7 , wherein the each A/D converter quantizes the output signal of the each read bit line in a time domain into a digital signal with 2 NADC levels, and the number of A/D converters is smaller than or equal to a column dimension of the plurality of first memory units. 9. The system of claim 7 , wherein the output synthesizer sums up sequentially shifted digital signals generated by the plurality of A/D converters for generating the output signal. 10. The system of claim 7 , wherein the plurality of A/D converters are a plurality of time-to-digital converters for converting the plurality of output signals in a time domain generated by the voltage-to-time converters into the plurality of digital signals, and sampling accuracy of the voltage-to-time converters increases with improvement of manufacturing process of the voltage-to-time converters.

Assignees

Inventors

Classifications

  • Read-write [R-W] circuits · CPC title

  • Read-write [R-W] circuits · CPC title

  • Word line control circuits, e.g. word line drivers, - boosters, - pull-up, - pull-down, - precharge · CPC title

  • G11C11/413Primary

    Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing, timing or power reduction · CPC title

  • G11C11/412Primary

    using field-effect transistors only · CPC title

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What does patent US11600319B2 cover?
A memory system includes a plurality of first memory units, a plurality of read word lines, and a plurality of read bit lines. Each first memory unit of the plurality of first memory units includes a second memory unit, a first transistor coupled to the second memory unit, and a second transistor coupled to the second memory unit and the first transistor. Each read word line of the plurality of…
Who is the assignee on this patent?
Univ Nat Cheng Kung
What technology area does this patent fall under?
Primary CPC classification G11C11/413. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Mar 07 2023 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 3 related publications on this page (citations in our corpus or others sharing the same primary CPC).