Apparatus for providing a test signal from a device under test (DUT) to a measurement instrument

Patent metadata

Field	Value
Publication number	US-11573249-B2
Application number	US-201916724470-A
Country	US
Kind code	B2
Filing date	Dec 23, 2019
Priority date	Dec 23, 2019
Publication date	Feb 7, 2023
Grant date	Feb 7, 2023

Abstract

An apparatus for providing a test signal from a device under test (DUT) to a measurement instrument is disclosed. The apparatus includes a probe head configured to receive an electrical signal from the DUT. The probe head includes an electro-optic modulator. The apparatus also includes a control box, which includes an optical source. The optical source is configured to provide an input optical signal to the electro-optic modulator, which is configured to provide an output optical signal based on the electrical signal from the DUT. The control box also includes an optical bias control circuit. Only a bias control signal is provided to the electro-optic modulator.

First claim

The invention claimed is:

1. An apparatus for providing a test signal from a device under test (DUT) to a measurement instrument, the apparatus comprising:
a probe head configured to receive an electrical signal from the DUT, the probe head comprising an electro-optic modulator; and
a control box comprising: an optical source, the optical source configured to provide an input optical signal having an input power level (P IN ) to the electro-optic modulator, which is configured to provide an output optical signal based on the electrical signal from the DUT, wherein the output optical signal has an output power level (P OUT ); and
an optical bias control circuit, wherein a ratio of the input power level to the output power level (P IN /P OUT ) is maintained at a substantially constant value.

2. The apparatus of claim 1 , wherein the optical bias control circuit receives a portion of an output optical signal from the electro-optic modulator and maintains a bias of the electro-optic modulator substantially at a quadrature point.

3. The apparatus of claim 2 , wherein the output optical signal from the electro-optic modulator provided to the optical bias control circuit is first converted to the electrical signal.

4. The apparatus of claim 1 , wherein the electro-optic modulator comprises a Mach-Zehnder modulator (MZM).

5. The apparatus of claim 1 , wherein the ratio of the input power level to the output power level (P IN /P OUT ) is substantially equal to 0.5.

6. The apparatus of claim 1 , wherein the output optical signal has an output power level and the output power level is maintained at a substantially constant value.

7. The apparatus of claim 1 , wherein the electrical signal has an alternating current (AC) component, and a direct current (DC) component.

8. The apparatus of claim 7 , wherein a frequency response of the optical bias control circuit is substantially DC.

9. The apparatus of claim 8 , wherein the DC component of the bias is combined with the AC component received from the electro-optic modulator to reconstruct an original electrical signal.

10. An apparatus for providing a test signal from a device under test (DUT) to a measurement instrument, the apparatus comprising:
a probe head configured to receive an electrical signal from the DUT, the probe head comprising an electro-optic modulator; and
a control box comprising: an optical source, the optical source configured to provide an input optical signal to the electro-optic modulator, which is configured to provide an output optical signal based on the electrical signal from the DUT, the electrical signal having a direct current (DC) component, and an alternating current (AC) component; and an optical bias control circuit configured to provide a bias control signal to the electro-optic modulator, wherein the bias control signal to the electro-optic modulator is proportional to a magnitude of the DC component.

11. The apparatus of claim 10 , wherein the bias control signal to the electro-optic modulator comprises the DC component of the electrical signal and the signal received from the electro-optic modulator comprises the AC component of the electrical signal.

12. The apparatus of claim 10 , wherein the optical bias control circuit receives a portion of an output optical signal from the electro-optic modulator and maintains the bias of the electro-optic modulator substantially at a quadrature point.

13. The apparatus of claim 12 , wherein the output optical signal from the electro-optic modulator provided to the optical bias control circuit is first converted to the electrical signal.

14. The apparatus of claim 10 , wherein the electro-optic modulator comprises a Mach-Zehnder modulator (MZM).

15. The apparatus of claim 10 , wherein the input optical signal has an input power level, and the output optical signal has an output power level, wherein a ratio of the input power level to the output power level is maintained at a substantially constant value.

16. An apparatus for providing a test signal from a device under test (DUT) to a measurement instrument, the apparatus comprising:
a probe head configured to receive an electrical signal from the DUT, the probe head comprising: an electro-optic modulator; a crossover filter having low frequency output and a high frequency output, the high frequency output being provided to the electro-optic modulator; and
a control box comprising an optical source, the optical source configured to provide an input optical signal to the electro-optic modulator, which is configured to provide an output optical signal based on the electrical signal from the DUT, wherein the control box is configured to receive a direct current (DC) component from the crossover filter and an alternating current (AC) component from the electro-optic modulator.

17. The apparatus of claim 16 , wherein the control box further comprises an optical bias control circuit.

18. The apparatus of claim 17 , wherein the optical bias control circuit receives a portion of an output optical signal from the electro-optic modulator and maintains the bias of the electro-optic modulator substantially at a quadrature point.

19. The apparatus of claim 16 , wherein the electro-optic modulator comprises a Mach-Zehnder modulator (MZM).

20. The apparatus of claim 16 , wherein the input optical signal has an input power level, and the output optical signal has an output power level, wherein a ratio of the input power level to the output power level is maintained at a substantially constant value.

21. The apparatus of claim 16 , wherein the electrical signal has an AC component, and a DC component, and the probe head further comprises a circuit adapted to prevent the DC component from being input to the electro-optic modulator, and to provide the DC component to the control box.

22. The apparatus of claim 16 , wherein the DC component received from the low frequency output of the crossover filter is combined with the AC component received from the electro-optic modulator to reconstruct the electrical signal from the DUT.

Assignees

• Keysight Technologies Inc

Inventors

• Scott Ryan
• Szafraniec Bogdan
• Mctigue Mike T
• Lankford Howard

Classifications

• G02F1/21 Primary

  by interference · CPC title

• G01R13/0281 Primary

  using electro-optic elements · CPC title

• G02F1/212

  Mach-Zehnder type · CPC title

• G01R31/00 Primary

  Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere ({measuring superconductive properties G01R33/1238;} testing line transmission systems H04B3/46; testing or measuring semiconductors or solid state devices during manufacture {H10P74/00}) · CPC title

• G01R1/06777

  High voltage probes · CPC title