Time-domain incremental two-step capacitance-to-digital converter

US11569826B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-11569826-B2
Application numberUS-202117176341-A
CountryUS
Kind codeB2
Filing dateFeb 16, 2021
Priority dateFeb 16, 2020
Publication dateJan 31, 2023
Grant dateJan 31, 2023

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  1. Title

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  2. Abstract

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  5. First independent claim

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

An exemplary incremental two-step capacitance-to-digital converter (CDC) with a time-domain sigma-delta modulator (TDΔΣM) includes a voltage-controlled oscillator (VCO)-based integrator that can be used in a low-order loop configuration. Example prototypes are disclosed, which when fabricated in 40-nm CMOS technology, provides CDC resolution of 0.29 fF while dissipating only 0.083 nJ per conversion.

First claim

Opening claim text (preview).

What is claimed is: 1. A capacitance-to-digital converter (CDC) comprising: a first stage successive approximation register capacitance-to-digital converter (1 st stage SAR CDC) circuit portion configured to perform a plurality of successive approximations of an input capacitance signal to generate a SAR conversion residue and a first set of converted outputs; and a second stage time-domain incremental delta-sigma modulator capacitance-to-digital converter (2 nd stage TD incremental ΔΣM CDC) circuit portion that quantizes the SAR conversion residue, using, in part, a voltage-controlled oscillator (VCO) based integrator of the 2 nd stage TD incremental ΔΣM CDC operating in a closed-loop control with a digital-to-analog converted signal generated, in part, by the first set of converted outputs, wherein the 2 nd stage TD incremental ΔΣM CDC generates a second set of converted outputs as a representation of an input sensed capacitance signal, and wherein the VCO integrator provides intrinsic clocked averaging (ICLA) capability that can address mismatches between the digital-to-analog converted signal and the first set of converted outputs. 2. The capacitance-to-digital converter of claim 1 , wherein the 2 nd stage TD incremental ΔΣM CDC circuit portion comprises: a N-stage ring VCO circuit; and a phase and frequency detector (PFD) coupled to the N-stage ring VCO circuit to an output for the closed-loop control. 3. The capacitance-to-digital converter of claim 2 , wherein the 2 nd stage TD incremental ΔΣM CDC circuit portion further comprises a passive charge sharing (CS) circuit coupled to the N-stage ring VCO circuit. 4. The capacitance-to-digital converter of claim 2 , wherein the N-stage ring VCO circuit is implemented as a G m -stage-driven current-controlled oscillator (CCO). 5. The capacitance-to-digital converter of claim 4 , wherein the G m -stage-driven CCO is configured to convert the SAR conversion residue into a frequency variation at the output N-stage ring VCO and generate output a phase difference signal. 6. The capacitance-to-digital converter of claim 5 , wherein the PFD is configured to detect and integrate the phase difference signal to generate an integrated phase difference signal. 7. The capacitance-to-digital converter of claim 6 , wherein the PFD comprises a multi-phase quantizer configured to transform the integrated phase difference signal to a multi-level output, the PFD further comprising a sampling circuit to sample the multi-level output. 8. The capacitance-to-digital converter of claim 1 , wherein the closed-loop control comprises a first-order loop. 9. The capacitance-to-digital converter of claim 1 , wherein the 2 nd stage TD incremental ΔΣM CDC is configured to operate in an incremental mode. 10. The capacitance-to-digital converter of claim 1 , wherein the 2 nd stage TD incremental ΔΣM CDC is configured to disable operation during SAR operation of the 1 st stage SAR CDC. 11. The capacitance-to-digital converter of claim 1 , further comprising a capacitance sensing network circuit coupled to the 1 st stage SAR CDC circuit portion, the capacitance sensing network circuit being configured to switch between a first capacitance sensing input associated with a first capacitive plate and a second capacitance sensing input associated with a second capacitive plate. 12. The capacitance-to-digital converter of claim 11 , wherein the capacitance sensing network circuit comprises a chopper circuit, the chopper circuit being configured to perform the switching between the first capacitance sensing input and the second capacitance sensing input. 13. The capacitance-to-digital converter of claim 6 , wherein the 2 nd stage TD incremental ΔΣM CDC is configured to disable operations during sensing operation of the capacitance sensing network circuit. 14. The capacitance-to-digital converter of claim 1 , wherein the 2 nd stage TD incremental ΔΣM CDC is configured as an N-bit incremental ΔΣM CDC selected from the group consisting of: a 2-bit incremental ΔΣM CDC, a 3-bit incremental ΔΣM CDC, a 4-bit incremental ΔΣM CDC, a 5-bit incremental ΔΣM CDC, a 6-bit incremental ΔΣM CDC, a 7-bit incremental ΔΣM CDC, an 8-bit incremental ΔΣM CDC, a 9-bit incremental ΔΣM CDC, and a 10-bit incremental ΔΣM CDC. 15. The capacitance-to-digital converter of claim 1 , wherein the capacitance-to-digital converter is configured in a microcontroller. 16. The capacitance-to-digital converter of claim 1 , wherein the capacitance-to-digital converter is configured as an integrated chip. 17. A method of converting a sensed capacitance signal, associated with a capacitance source, to an output digital signal representing the sensed capacitance signal, the method comprising: successively approximating over a first set of plurality of approximations, the sensed capacitance signal to generate i) a residue signal and ii) a first set of converted outputs of the digital signal; generating a first digital-to-analog converted signal of the first set of converted outputs of the digital signal; quantizing the residue signal, using, in part, a voltage-controlled oscillator (VCO) based integrator operating in a closed-loop control with a digital-to-analog converted signal generated, in part, by the first set of converted outputs; and generating a second digital-to-analog converted signal of the second set of converted outputs of the digital signal representing the sensed capacitance signal; and combining the first digital-to-analog converted signal and second digital-to-analog converted signal to generate a capacitance-to-digital conversion output, wherein the VCO integrator provides intrinsic clocked averaging (ICLA) capability that can address mismatches between the first digital-to-analog converted signal and the second digital-to-analog converted signal. 18. The method of claim 17 , wherein the quantification operation comprises: converting the residue signal into a frequency variation to generate an output a phase difference signal; integrating the phase difference signal to generate an integrated phase difference signal; and transforming the integrated phase difference signal to a multi-level output for the closed-loop control. 19. The method of claim 17 , wherein the quantization operation is performed via a time-domain sigma-delta modulator (TD ΔΣM). 20. An apparatus comprising: a first stage successive approximation register capacitance-to-digital converter (1 st stage SAR CDC) circuit portion configured to perform a plurality of successive approximations of an input capacitance signal to generate a SAR conversion residue and a first set of converted outputs; and a second stage time-domain incremental delta-sigma modulator capacitance-to-digital converter (2 nd stage TD incremental ΔΣM CDC) circuit portion that quantizes the SAR conversion residue, using, in part, a voltage-controlled oscillator (VCO) based integrator of the 2 nd stage TD incremental ΔΣM CDC operating in a closed-loop control with a digital-to-analog converted signal generated, in part, by the first set of converted outputs, wherein the 2 nd stage TD incremental ΔΣM CDC generates a second set of converted outputs as a representation of an input sensed capacitance signal, and wherein the VCO integrator provides intrinsic clocked averaging (ICLA) capability that can address mismatches between the digital-to-analog converted signal and the first set of converted outputs.

Assignees

Inventors

Classifications

  • H03M1/002Primary

    Provisions or arrangements for saving power, e.g. by allowing a sleep mode, using lower supply voltage for downstream stages, using multiple clock domains or by selectively turning on stages when needed · CPC title

  • Analogue/digital converters using delta-sigma modulation as an intermediate step · CPC title

  • with digital/analogue converter for supplying reference values to converter · CPC title

  • H03M3/34Primary

    by chopping · CPC title

  • the steps being performed sequentially in series-connected stages (H03M1/141, H03M1/143, H03M1/16 take precedence) · CPC title

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What does patent US11569826B2 cover?
An exemplary incremental two-step capacitance-to-digital converter (CDC) with a time-domain sigma-delta modulator (TDΔΣM) includes a voltage-controlled oscillator (VCO)-based integrator that can be used in a low-order loop configuration. Example prototypes are disclosed, which when fabricated in 40-nm CMOS technology, provides CDC resolution of 0.29 fF while dissipating only 0.083 nJ per conver…
Who is the assignee on this patent?
Univ Texas
What technology area does this patent fall under?
Primary CPC classification H03M1/002. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Jan 31 2023 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 11 related publications on this page (citations in our corpus or others sharing the same primary CPC).