Surface shape measuring device and surface shape measuring method

Patent metadata

Field	Value
Publication number	US-11525660-B2
Application number	US-202217749209-A
Country	US
Kind code	B2
Filing date	May 20, 2022
Priority date	Nov 22, 2019
Publication date	Dec 13, 2022
Grant date	Dec 13, 2022

Abstract

When an index table is installed on a rotary table in a surface shape measuring device, deterioration in measurement accuracy can be suppressed. The surface shape measuring device includes: a rotary table which is configured to place a workpiece thereon and to be freely rotatable around a rotation center axis; and a detector configured to detect a displacement of a probe brought into contact with the workpiece. The rotary table has a centering mechanism configured to align a center axis of the workpiece and the rotation center axis. An index table freely detachably mounted on the rotary table is provided, the index table configured so as to be able to perform indexing along a first axis and a second axis which are perpendicular to the rotation center axis. Eccentric load cancelling means configured to cancel an eccentric load caused by the indexing of the index table is provided.

First claim

What is claimed is:

1. A surface shape measuring device including:
a rotary table which is configured to place a workpiece thereon and to be freely rotatable around a rotation center axis; and
a detector including a probe to be brought into contact with the workpiece placed on the rotary table, the detector configured to detect a displacement of the probe,
wherein the rotary table has a centering mechanism configured to align a center axis of the workpiece and the rotation center axis,
an index table freely detachably mounted on the rotary table is provided, the index table configured so as to be able to perform indexing along a first axis and a second axis which are perpendicular to the rotation center axis, and
eccentric load cancelling means configured to cancel an eccentric load caused by the indexing of the index table is provided.

2. The surface shape measuring device according to claim 1 , further comprising
a sensor configured to detect a tilt amount of the rotation center axis to acquire the eccentric load.

3. The surface shape measuring device according to claim 1 , further comprising:
a shared drive circuit configured to drive the rotary table and the index table;
a switching circuit configured to switch the drive circuit between the rotary table and the index table; and
a detachable mechanism configured to electrically connect the switching circuit and the index table.

4. The surface shape measuring device according to claim 1 , wherein a maximum movable range of the index table is larger than a maximum movable range of the rotary table.

5. The surface shape measuring device according to claim 1 , wherein a moving speed of the index table is higher than a moving speed of the rotary table.

6. The surface shape measuring device according to claim 1 , wherein the eccentric load cancelling means is a counterweight provided to the index table, and the counterweight is provided movably in the index table.

7. The surface shape measuring device according to claim 1 , wherein the eccentric load cancelling means is movement of the rotary table.

8. A surface shape measuring method using the surface shape measuring device according to claim 1 , comprising:
a placing step of placing a workpiece on either the rotary table or the index table;
a detection step of detecting a displacement of the probe which is brought into contact with the workpiece by the detector; and
a cancelling step of cancelling an eccentric load before the detection step, in a case where the workpiece is placed on the index table.

Assignees

• Tokyo Seimitsu Co Ltd

Inventors

• Sekimoto Michihiro

Classifications

• G01B5/0004

  Supports (G01B5/025 takes precedence) · CPC title

• G01B5/201 Primary

  for measuring roundness · CPC title

• G01B5/25

  for testing the alignment of axes · CPC title

• G01B3/002

  Details · CPC title