Over-the-air testing of millimeter wave antenna arrays

Patent metadata

Field	Value
Publication number	US-11515950-B2
Application number	US-202117464170-A
Country	US
Kind code	B2
Filing date	Sep 1, 2021
Priority date	Sep 4, 2020
Publication date	Nov 29, 2022
Grant date	Nov 29, 2022

Abstract

A system and method for testing (e.g., rapidly and inexpensively) devices such as integrated circuits (IC) with integrated antennas configured for millimeter wave transmission and/or reception. The method may first perform a calibration operation on a reference device under test (DUT). The calibration operation may determine a set of reference DUT FF base functions and may also generate a set of calibration coefficients. After the calibration step using the reference DUT, the resulting reference DUT FF base functions and the calibration coefficients (or reconstruction matrix) may be used in determining far-field patterns of DUTs based on other field measurements, e.g., measurements taken in the near field of the DUT.

First claim

The invention claimed is:

1. A method for determining a far-field (FF) pattern of wireless signals generated by a device under test (DUT), wherein the DUT includes an antenna array comprising a plurality of DUT antenna elements, the method comprising:
obtaining a plurality of probe-based field measurements of the wireless signals generated by the DUT;
computing a set of FF scaling factors, using the plurality of probe-based field measurements and a set of calibration coefficients, a quantity of the set of FF scaling factors being equal to a quantity of a set of reference DUT FF base functions;
determining the FF pattern of wireless signals based on the FF scaling factors and the set of reference DUT FF base functions;
wherein the FF pattern of wireless signals generated by the DUT is useable to assess operation of the DUT in the FF.

2. The method of claim 1 ,
wherein the obtaining is performed by a probe antenna system (PAS) having a plurality of PAS antenna elements, wherein the plurality of PAS elements is equal to or greater than the plurality of DUT antenna elements.

3. The method of claim 1 ,
wherein obtaining the plurality of field measurements of the wireless signals generated by the DUT comprises:
configuring the plurality of antenna elements of the DUT with certain beamformer settings while driving a beamformer with a signal; and
measuring, at at least one frequency, amplitude and phase of a plurality of electromagnetic fields generated by the plurality of antenna elements of the DUT.

4. The method of claim 1 , further comprising:
determining the set of reference DUT FF base functions by:
obtaining a set of reference DUT FF patterns generated by a plurality of antenna elements of a reference DUT under a set of different beamformer settings, such that the set of reference DUT FF patterns is useable to enable the calculation of a beamformer setting-specific FF pattern as a linear combination of the set of reference DUT FF patterns;
wherein the set of reference DUT FF patterns is the set of reference DUT FF base functions; and

generating the calibration coefficients by:
obtaining a series of a plurality of reference DUT probe-based field measurements of the wireless signals generated by the reference DUT under the set of different beamformer settings; and
processing the series of the plurality of reference DUT probe-based field measurements.

5. The method of claim 4 , wherein the series of the reference DUT probe-based field measurements are processed by applying a singular value decomposition method.

6. The method of claim 4 , wherein obtaining the set of reference DUT FF patterns generated by the plurality of antenna elements of the reference DUT under the different beamformer settings comprises:
for each antenna element n of the reference DUT,
configuring the reference DUT to radiate predominantly from the antenna element n using at least one beamformer setting; and
measuring far-field electromagnetic amplitude and phase produced by antenna element n at at least one frequency,

wherein the measurement of the far-field electromagnetic amplitude and phase produced by antenna element n using the at least one beamformer setting results in the reference DUT base function for the antenna element n.

7. The method of claim 6 , further comprising:
for each antenna element n of the reference DUT:
minimizing radiation of the plurality of antenna elements of the reference DUT;
measuring FF electromagnetic amplitude and phase to determine a FF interference pattern;
subtracting the FF interference pattern from the far-field electromagnetic amplitude and phase produced by antenna element n using the at least one beamformer setting.

8. The method of claim 4 , wherein obtaining the series of the plurality of reference DUT probe-based field measurements of the wireless signals generated by the reference DUT under the set of different beamformer settings comprises:
for each antenna element n of the reference DUT:
configuring the reference DUT to radiate only from the antenna element n at at least one frequency using the set of different beamformer settings; and
measuring the plurality of reference DUT probe-based field measurements produced by antenna element n at at least one frequency.

9. The method of claim 8 , further comprising:
for each antenna element n of the reference DUT:
minimizing radiation of the plurality of antenna elements of the reference DUT;
measuring the plurality of reference DUT probe-based field measurements to determine a probe-based interference indication;
subtracting the interference indication from the plurality of reference DUT probe-based field measurements produced by antenna element n for the at least one beamformer setting.

10. The method of claim 4 ,
wherein the set of reference DUT FF patterns comprises phase and amplitude information, wherein the method further comprises:
obtaining a plurality of fixed reference FF measurements of the plurality of antenna elements of the reference DUT under the set of different beamformer settings,
utilizing phase information of the plurality of fixed reference FF measurements to obtain a reference phase for the phase information of the set of reference DUT FF patterns.

11. The method of claim 4 ,
wherein the set of reference DUT FF patterns comprises phase and amplitude information, wherein the method further comprises:
extracting phase information from an input signal driving the wireless signals generated by the DUT,
utilizing the phase information of the input signal to obtain a reference phase for the phase information of the set of reference DUT FF patterns.

12. The method of claim 1 ,
wherein the probe-based field measurements are obtained in the near-field (NF) of the DUT.

13. The method of claim 1 ,
wherein the wireless signals generated by the DUT are generated according to a plurality of sets of beamformer settings of the plurality of DUT antenna elements, and
wherein the plurality of sets of beamformer settings span a vector space of the sets of beamformer settings.

14. The method of claim 13 ,
wherein the plurality of sets of beamformer settings is equal or greater in number than the plurality of DUT antenna elements.

15. The method of claim 1 ,
wherein the plurality of probe-based field measurements comprises phase and amplitude information, wherein the method further comprises:
obtaining a plurality of reference probe field measurements of the wireless signals generated by the DUT,
utilizing phase information of the plurality of reference probe field measurements to obtain a reference phase for the phase information of the plurality of probe-based field measurements.

16. The method of claim 1 ,
wherein the plurality of probe-based field measurements comprises phase and amplitude information, wherein the method further comprises:
extracting phase information from an input signal driving the wireless signals generated by the DUT,
utilizing the phase information of the input signal to obtain a reference phase for the phase information of the plurality of probe-based field measurements.

17. A non-transitory computer readable memory medium comprising program instructions for determining a far-field (FF) pattern of wireless signals generated by a device under test (DUT), wherein the DUT includes an antenna array comprising a plurality of DUT antenna elements, wherein the program instructions are executable by a processor to:
obtain a plurality of probe-based near-field measurements of the wireless signals generated by the DUT, w

Assignees

• Nat Instruments Corp

Inventors

• Laabs Martin
• Plettemeier Dirk
• Deckert Thomas
• Lange Johannes Dietmar Herbert
• Vanden Bossche Marc

Classifications

• H04B17/12 Primary

  of transmit antennas, e.g. of the amplitude or phase · CPC title

• H04B17/104 Primary

  of other parameters, e.g. DC offset, delay or propagation times · CPC title

• H01Q21/06

  Arrays of individually energised antenna units similarly polarised and spaced apart · CPC title