System, Methods and Apparatus Using Virtual Appliances in a Semiconductor Test Environment
US-2015370248-A1 · Dec 24, 2015 · US
US9483372B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9483372-B2 |
| Application number | US-201414206865-A |
| Country | US |
| Kind code | B2 |
| Filing date | Mar 12, 2014 |
| Priority date | Mar 14, 2013 |
| Publication date | Nov 1, 2016 |
| Grant date | Nov 1, 2016 |
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Power leveling a system under test (SUT). An input signal is provided at an initial power level to the SUT. Multiple iterations are performed, each including measuring, over a specified measuring interval, power of a signal produced by the SUT in response to the input signal, and dynamically adjusting the power of the input signal in response. The measuring interval is increased over the iterations, thereby increasing accuracy of the measuring over the iterations while converging the signal to a specified power level. An initial power leveling operation may be performed for the SUT to establish a specified power level, after which the SUT is tested, during which multiple power leveling operations are performed, each including measuring power of a signal from the SUT over a specified measuring interval, and adjusting the input signal in response, thereby maintaining the specified power level during the testing while correcting for thermal droop.
Opening claim text (preview).
I claim: 1. A method, comprising: executing an initial power leveling operation for a system under test (SUT), thereby establishing a specified power level; testing the SUT after executing the initial power leveling operation, wherein said testing includes taking performance measurements of the SUT; and performing, during said testing the SUT, a plurality of power leveling operations for the power signal, wherein each of the plurality of power leveling operations comprises: measuring power of a signal generated by the SUT over a specified measuring interval, wherein the signal is generated by the SUT in response to an input signal provided to the SUT; and adjusting the input signal provided to the SUT based on said measuring; wherein said performing the plurality of power leveling operations operates to maintain the specified power level during said testing the SUT, thereby correcting for thermal droop. 2. The method of claim 1 , wherein said adjusting the input signal based on said measuring comprises: determining a difference between the measured power of the signal and the specified power level; and adjusting the input signal based on the difference; wherein said adjusting the input signal provided to the SUT uses a sufficiently small adjustment such that performance of the SUT is not substantially affected. 3. The method of claim 1 , wherein said testing includes determining a gain of the SUT. 4. The method of claim 1 , wherein the SUT is a radio frequency power amplifier. 5. The method of claim 1 , further comprising: performing said executing, testing, and performing multiple times using a different center frequency provided to the SUT and different specified power level each time. 6. The method of claim 1 , wherein said measuring the output power of the signal generated by the SUT over the specified measuring interval includes accumulating raw measured power samples over the specified measuring interval. 7. The method of claim 1 , wherein said executing an initial power leveling operation for a system under test (SUT) comprises: providing an input signal at an initial power level to the SUT; and performing a plurality of iterations, wherein each iteration includes: measuring, over a specified measuring interval, a signal produced by the SUT in response to the input signal; and dynamically adjusting the power level of the input signal provided to the SUT based on said measuring; wherein said performing the plurality of iterations comprises: increasing the specified measuring interval over the plurality of iterations, thereby increasing accuracy of said measuring over the plurality of iterations while converging the signal to a specified power level. 8. The method of claim 1 , wherein said performing a plurality of power leveling operations for the power signal is controlled by a programmable hardware element. 9. An apparatus, comprising: a signal generator, configured to provide an input signal to a system under test (SUT); and a measurement device, configured to measure, over a specified measuring interval, power of a signal produced by the SUT in response to the input signal; wherein the apparatus is configured to: execute an initial power leveling operation for the SUT, thereby establishing a specified power level; test the SUT after executing the initial power leveling operation, wherein said testing includes taking performance measurements of the SUT; and perform, during said testing the SUT, a plurality of power leveling operations for the power signal, wherein each of the plurality of power leveling operations comprises: measuring power of a signal generated by the SUT over a specified measuring interval, wherein the signal is generated by the SUT in response to an input signal provided to the SUT; and adjusting the input signal provided to the SUT based on said measuring; wherein said performing the plurality of power leveling operations operates to maintain the specified power level during said testing the SUT, thereby correcting for thermal droop. 10. The apparatus of claim 9 , wherein said measuring power comprises measuring an average power of the signal over the specified measuring interval. 11. The apparatus of claim 9 , wherein the measurement device is included in a signal analyzer. 12. The apparatus of claim 9 , wherein the SUT comprises a radio frequency power amplifier. 13. The apparatus of claim 9 , wherein the signal generator includes a digital gain control. 14. The apparatus of claim 9 , wherein the measurement device comprises a programmable hardware element, configured to control performance of the plurality of power leveling operations, including the adjusting the input signal. 15. The apparatus of claim 9 , wherein to execute the initial power leveling operation for the SUT, the apparatus is configured to: provide an input signal at an initial power level to the SUT; and perform a plurality of iterations, wherein for each iteration: the measurement device measures the power of the signal produced by the SUT over the specified measuring interval in response to the input signal from the signal generator; and the apparatus dynamically adjusts the power level of the input signal from the signal generator based on the measured power of the signal produced by the SUT; wherein the apparatus is configured to increase the specified measuring interval over the plurality of iterations, thereby increasing accuracy of said measuring over the plurality of iterations while converging the signal to a specified power level. 16. A non-transitory computer-readable storage medium that stores program instructions executable by a computing device and/or deployable to a programmable hardware element to perform: executing an initial power leveling operation for a system under test (SUT), thereby establishing a specified power level; testing the SUT after executing the initial power leveling operation, wherein said testing includes taking performance measurements of the SUT; and performing, during said testing the SUT, a plurality of power leveling operations for the power signal, wherein each of the plurality of power leveling operations comprises: measuring power of a signal generated by the SUT over a specified measuring interval, wherein the signal is generated by the SUT in response to an input signal provided to the SUT; and adjusting the input signal provided to the SUT based on said measuring; wherein said performing the plurality of power leveling operations operates to maintain the specified power level during said testing the SUT, thereby correcting for thermal droop. 17. The non-transitory computer-readable storage medium of claim 16 , wherein said adjusting the input signal based on said measuring comprises: determining a difference between the measured power of the signal and the specified power level; and adjusting the input signal based on the difference; wherein said adjusting the input signal provided to the SUT uses a sufficiently small adjustment such that performance of the SUT is not substantially affected. 18. The non-transitory computer-readable storage medium of claim 16 , wherein the SUT is a radio frequency power amplifier. 19. The non-transitory computer-readable storage medium of claim 16 , wherein the program instructions are further executable to perform: performing said executing, testing, and performing multiple times using a different center frequency provided to the SUT and different specified power level each time.
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