Simultaneous pattern-scan placement during sample processing
US-2024207969-A1 · Jun 27, 2024 · US
US11504803B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-11504803-B2 |
| Application number | US-201916256031-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jan 24, 2019 |
| Priority date | Jan 30, 2018 |
| Publication date | Nov 22, 2022 |
| Grant date | Nov 22, 2022 |
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A laser processing apparatus includes a light source which outputs a laser light, and a waveform control unit which controls a pulse waveform of the laser light irradiating the workpiece, in which the pulse waveform of the laser light controlled by the waveform control unit includes a main pulse and a foot pulse temporally preceding the main pulse, and a peak intensity of the foot pulse is smaller than a peak intensity of the main pulse, and a peak position of the main pulse is positioned in a retention time period of plasma generated due to an incidence of the foot pulse on the workpiece.
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What is claimed is: 1. A laser processing apparatus which performs laser peening by irradiating a workpiece with a laser light, the laser processing apparatus comprising: a light source which outputs the laser light; and a waveform controller which controls a pulse waveform of the laser light irradiating the workpiece, wherein the pulse waveform of the laser light controlled by the waveform controller includes a main pulse incident on the workpiece that plastically deforms the workpiece and a foot pulse temporally preceding the main pulse that generates plasma on a surface of the workpiece, and a peak intensity of the foot pulse is smaller than a peak intensity of the main pulse, and a peak position of the main pulse is positioned in a retention time period of the plasma generated due to an incidence of the foot pulse on the workpiece. 2. The laser processing apparatus according to claim 1 , wherein the pulse waveform of the laser light includes a single main pulse and a single foot pulse. 3. The laser processing apparatus according to claim 1 , wherein the peak intensity of the foot pulse is 2% or more and less than 100%, when the peak intensity of the main pulse is 100%. 4. The laser processing apparatus according to claim 1 , wherein a time interval between a peak position of the foot pulse and the peak position of the main pulse is 1 ns or more and 20 ns or less. 5. A laser processing method which performs laser peening by irradiating a workpiece with a laser light, the laser processing method comprising: a waveform control step of controlling a pulse waveform of the laser light irradiating the workpiece; and an irradiation step of irradiating the workpiece with the laser light whose pulse waveform is controlled in the waveform control step, wherein, in the waveform control step, a main pulse incident on the workpiece to plastically deform the workpiece and a foot pulse temporally preceding the main pulse to generate plasma on a surface of the workpiece are formed into the pulse waveform of the laser light in the waveform control step, and a peak intensity of the foot pulse is made smaller than a peak intensity of the main pulse, and a peak position of the main pulse is made to be positioned in a retention time period of the plasma generated due to an incidence of the foot pulse on the workpiece. 6. The laser processing method according to claim 5 , wherein a single main pulse and a single foot pulse are formed into the pulse waveform of the laser light in the waveform control step. 7. The laser processing method according to claim 5 , wherein the peak intensity of the foot pulse is set to 2% or more and less than 100%, when the peak intensity of the main pulse is 100% in the waveform control step. 8. The laser processing method according to claim 5 , wherein a time interval between a peak position of the foot pulse and the peak position of the main pulse is set to 1 ns or more and 20 ns or less in the waveform control step. 9. The laser processing method according to claim 5 , wherein irradiation of a surface of the workpiece with the laser light is performed in a state in which a protective film is formed thereon in the irradiation step. 10. The laser processing method according to claim 5 , wherein irradiation of the workpiece with the laser light is performed in a state in which a plasma confinement film is formed thereon in the irradiation step.
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