Exposure apparatus, exposure method, and method of manufacturing article

US11474439B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-11474439-B2
Application numberUS-202016900209-A
CountryUS
Kind codeB2
Filing dateJun 12, 2020
Priority dateJun 25, 2019
Publication dateOct 18, 2022
Grant dateOct 18, 2022

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  1. Title

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  2. Abstract

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  5. First independent claim

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

An exposure apparatus includes a first temperature controller for controlling a temperature distribution on an optical element of a projection optical system, and a second temperature controller for controlling a temperature distribution on an optical element of the projection optical system, wherein in a first period in which the exposure operation is executed, at least one of the first temperature controller and the second temperature controller operates to reduce a change in an aberration of the projection optical system due to the exposure operation being executed, and in a second period which follows the first period and in which the exposure operation is not executed, at least one of the first temperature controller and the second temperature controller operates to reduce a change in an aberration due to the exposure operation not being executed.

First claim

Opening claim text (preview).

What is claimed is: 1. An exposure apparatus that performs an exposure operation to expose a substrate via a projection optical system, the exposure apparatus comprising: a temperature adjuster, including a first temperature controller and a second temperature controller arranged at positions different from each other, configured to control a temperature distribution on an optical element of the projection optical system, wherein the temperature adjuster controls the first temperature controller to control heating of a first region of the optical element and controls the second temperature controller to control heating of a second region of the optical element, the second region being different from the first region, so that: during a first period in which the exposure operation is performed, the optical element has a first non-uniform temperature distribution to reduce a change in an aberration of the projection optical system due to the exposure operation being performed; and during a second period, which follows the first period, in which the exposure operation is not performed, the optical element has a second non-uniform temperature distribution to reduce a change in the aberration of the projection optical system due to the exposure operation being not performed. 2. The apparatus according to claim 1 , wherein: the first temperature controller applies a first temperature distribution to the optical element in the first period and the second temperature controller applies a second temperature distribution to the optical element in the second period, and the first temperature distribution and the second temperature distribution have opposite phases. 3. The apparatus according to claim 1 , wherein the first and second temperature controllers are arranged outside an effective diameter of the optical element. 4. The apparatus according to claim 1 , wherein the temperature adjuster is configured to reduce at least one NO component, where N is a natural number, of Zernike polynomials as the aberration. 5. The apparatus according to claim 1 , wherein the temperature adjuster is configured to reduce astigmatism as the aberration. 6. The apparatus according to claim 1 , wherein the first period is from a start of a first exposure operation on a substrate to an end of a final exposure operation on the substrate. 7. The apparatus according to claim 6 , wherein the second period starts from the end of the final exposure operation on the substrate. 8. The apparatus according to claim 1 , wherein the first period is from a start of a first exposure operation on a first substrate of a first lot to an end of a final exposure operation on a final substrate of the first lot. 9. The apparatus according to claim 8 , wherein the second period is from the end of the final exposure operation on the final substrate of the first lot to the start of the first exposure operation on the first substrate of a second lot following the first lot. 10. The apparatus according to claim 1 , wherein the first period is from a start of an exposure operation on one shot region of a substrate to an end of the exposure operation on the one shot region of the substrate. 11. The apparatus according to claim 10 , wherein the second period is from the end of the exposure operation on the one shot region of the substrate to a start of the exposure operation on a next shot region of the substrate. 12. The apparatus according to claim 1 , wherein: the first temperature controller operates so as to reduce the change in the aberration of the projection optical system in the first period, and the second temperature controller operates so as to reduce the change in the aberration of the projection optical system in the second period. 13. The apparatus according to claim 1 , wherein: the first temperature controller and the second temperature controller operate so as to reduce the change in the aberration of the projection optical system in the first period, and the first temperature controller and the second temperature controller operate so as to reduce the change in the aberration of the projection optical system in the second period. 14. The apparatus according to claim 13 , wherein, in the first and second periods, the first and second temperature controllers operate so that the aberration does not fall outside a predetermined range while allowing the aberration to change within the predetermined range. 15. A method of manufacturing an article, the method comprising: exposing a substrate with the exposure apparatus according to claim 1 ; developing the substrate exposed in the exposing; and processing the substrate developed in the developing to obtain the article. 16. An exposure method of performing an exposure operation to expose a substrate via a projection optical system including a temperature adjuster, including a first temperature controller and a second temperature controller arranged at positions different from each other, configured to control a temperature distribution on an optical element of the projection optical system, the method comprising: controlling the temperature adjuster during a first period in which the exposure operation is performed, so that the optical element has a first non-uniform temperature distribution to reduce change in the aberration of the projection optical system due to the exposure operation being performed; and controlling the temperature adjuster during a second period, which follows the first period, in which the exposure operation is not performed, so that the optical element has a second non-uniform temperature distribution to reduce a change in the aberration of the projection optical system due to the exposure operation being not performed, wherein the optical element has the first non-uniform temperature distribution and the second non-uniform temperature distribution by controlling the first temperature controller to control heating of a first region of the optical element and controls the second temperature controller to control heating of a second region of the optical element, the second region being different from the first region. 17. The method according to claim 16 , wherein: in the controlling in the first period, the first temperature controller to applies a first temperature distribution to the optical element, in the controlling in the second period, the second temperature controller applies a second temperature distribution to the optical element, and the first temperature distribution and the second temperature distribution have opposite phases. 18. The method according to claim 16 , wherein: the controlling in the first period controls the first temperature controller in accordance with a first command value corresponding to an elapsed time from a start of the first period, and the controlling in the second period controls the second temperature controller in accordance with a second command value corresponding to an elapsed time from a start of the second period. 19. The method according to claim 16 , wherein the first and second temperature controllers are arranged outside an effective diameter of the optical element. 20. The method according to claim 16 , wherein the temperature adjuster is configured to reduce at least one Nθ component, where N is a natural number, of Zernike polynomials as the aberration. 21. The method according to claim 16 , wherein the temperature adjuster is configured to reduce astigmatism as the aberration.

Assignees

Inventors

Classifications

  • Temperature · CPC title

  • Controlling normal operating mode, e.g. matching different apparatus, remote control or prediction of failure · CPC title

  • Aberration measurement · CPC title

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What does patent US11474439B2 cover?
An exposure apparatus includes a first temperature controller for controlling a temperature distribution on an optical element of a projection optical system, and a second temperature controller for controlling a temperature distribution on an optical element of the projection optical system, wherein in a first period in which the exposure operation is executed, at least one of the first temper…
Who is the assignee on this patent?
Canon Kk
What technology area does this patent fall under?
Primary CPC classification G03F7/70891. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Oct 18 2022 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 2 related publications on this page (citations in our corpus or others sharing the same primary CPC).