Method for calibrating a device for producing a three-dimensional object and device configured for implementing said method

US11458686B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-11458686-B2
Application numberUS-201715714506-A
CountryUS
Kind codeB2
Filing dateSep 25, 2017
Priority dateSep 30, 2016
Publication dateOct 4, 2022
Grant dateOct 4, 2022

How to read this patent

A practical reading order for non-experts. Skip the full description unless you need deep technical detail.

  1. Title

    What the patent document calls the invention.

  2. Abstract

    A short plain-language summary of the technical disclosure.

  3. Assignees and inventors

    Who owns or filed the patent and who is credited as inventor.

  4. Key dates

    Filing, priority, publication, and grant dates set the timeline.

  5. First independent claim

    The legal scope of protection — read this for what is actually claimed.

  6. CPC / IPC classifications

    Technology tags used to group this patent with similar filings.

  7. Citations and related patents

    Prior art links and similar publications in this corpus.

Abstract

Official abstract text for this publication.

A calibration method serves for calibrating a manufacturing device for additively producing a three-dimensional object by applying layer by layer and selectively solidifying a building material. The manufacturing device comprises at least two scanning units, each of which is capable of directing a beam to different target points in the working plane, which are located within a scanning region assigned to the respective scanning unit, wherein the scanning regions region of the at least two scanning units overlap in an overlap area. At least a first of the at least two scanning units is assigned a first monitoring unit whose monitoring region extends to a target point of the first scanning unit and its proximity, wherein a change of a position of the monitoring region is carried out as a function of a change of a position of the target point.

First claim

Opening claim text (preview).

The invention claimed is: 1. A calibration method for calibrating a manufacturing device for additively producing a three-dimensional object by applying layer by layer and selectively solidifying a building material, within a build area in a working plane, wherein the manufacturing device comprises at least a first scanning unit which is capable of directing a first beam to a first target point in the working plane and a second scanning unit which is capable of directing a second beam to a second target point in the working plane, the first scanning unit comprising a first mirror, where the first target point is located within a first scanning region assigned to the first scanning unit and the second target point is located within a second scanning region assigned to the second scanning unit, the first and second scanning regions of the first and second scanning units overlapping in an overlap area, the method comprising: locating the first and second scanning units in an upper region of a build chamber and spaced above the build area; providing a first monitoring unit which is suited to detect a radiation emitted or reflected from the surface of an applied powder layer, the first monitoring unit being spaced above the build area working plane with the scanning units, the first monitoring unit monitoring a first monitoring region on the working plane from above; controlling the first scanning unit to position the first target point in a region on the working plane within the overlap area without the first beam emanating from the first scanning unit; changing a position of the first monitoring region of the first monitoring unit on the working plane depending on a change of a position of the first target point of the first scanning unit on the working plane so that the first monitoring region comprises the first target point and its proximity, wherein the changing the position of the first target point of the first scanning unit on the working plane and the changing the position of the first monitoring region of the first monitoring unit on the working plane are performed simultaneously by the first mirror; irradiating at least a portion of the first monitoring region of the first monitoring unit with the second beam via the second scanning unit; detecting, by the first monitoring unit, the radiation emitted by the second beam; and evaluating an output signal of the first monitoring unit. 2. The calibration method according to claim 1 , further comprising: providing a second monitoring unit which is suited to detect the radiation emitted or reflected from the surface of an applied powder layer, the second monitoring unit being spaced above the build area working plane with the scanning units, the second monitoring unit monitoring a second monitoring region on the working plane from above; changing a position of the second monitoring region of the second monitoring unit on the working plane depending on a change of a position of the second target point of the second scanning unit on the working plane so that the second monitoring region comprises the second target point and its proximity; and evaluating an output signal of the second monitoring unit. 3. The calibration method according to claim 2 , wherein the calibration method is carried out in the overlap area several times in succession, by moving the second beam of the second scanning unit across the working plane, with the first monitoring region of the first monitoring unit following the movement. 4. The calibration method according to claim 2 , wherein the second monitoring region of the second monitoring unit is limited to the target point of the second scanning unit and its proximity. 5. The calibration method according to claim 2 , wherein the second scanning unit comprises a second mirror, and wherein changing a position of the second target point of the second scanning unit on the working plane and changing a position of the second monitoring region of the second monitoring unit on the working plane are performed by moving the second mirror. 6. The calibration method according to claim 1 , further comprising: providing a second monitoring unit which is suited to detect a radiation emitted or reflected from the surface of an applied powder layer, the second monitoring unit being spaced above the build area working plane with the scanning units, the second monitoring unit monitoring a second monitoring region on the working plane from above; controlling the second scanning unit to position the second target point in a region on the working plane within the overlap area without the second beam emanating from the second scanning unit; changing a position of the second monitoring region of the second monitoring unit on the working plane depending on a change of a position of the second target point of the second scanning unit on the working plane so that the second monitoring region comprises the second target point and its proximity; irradiating at least a portion of the second monitoring region of the second monitoring unit with the first beam via the first scanning unit; and evaluating an output signal of the second monitoring unit. 7. The calibration method according to claim 6 , wherein the second monitoring region of the second monitoring unit is limited to the target point of the second scanning unit and its proximity. 8. The calibration method according to claim 6 , wherein the second scanning unit comprises a second mirror, and further comprising: changing a position of the second target point of the second scanning unit on the working plane and changing a position of the second monitoring region of the second monitoring unit on the working plane are performed by moving the second mirror. 9. The calibration method according to claim 1 , wherein: the first monitoring region of the first monitoring unit is limited to the target point of the first scanning unit and its proximity. 10. The calibration method according to claim 1 , wherein the beam of at least one of the scanning units is a beam of a radiation suited for solidifying the building material. 11. The calibration method according to claim 1 , wherein irradiating the first monitoring region of the first monitoring unit by the second beam of the second scanning unit is performed in the form of scanning, wherein the scanning is implemented according to a predetermined pattern. 12. The calibration method according to claim 1 , wherein the evaluation of the output signal includes determining an extreme value of the output signal and/or comparing a signal curve of the output signal with a predetermined comparison pattern. 13. The calibration method according to claim 1 , wherein a beam path of the radiation for monitoring the first monitoring region of the first monitoring unit is at least within a section of the first monitoring region but in a reversed direction as a beam path of the beam of a radiation suited to solidify the building material, or of a target beam whose energy is not sufficient to solidify the building material. 14. The calibration method according to claim 1 , wherein correction data for positioning at least one of the beams is determined from the evaluation of the output signal, wherein a difference between a wavelength of a radiation used for monitoring the first monitoring region of the first monitoring unit and a wavelength of a radiation suited for solidifying the building material and/or a target beam and/or a laser beam whose energy is not sufficient to solidify the building material is incorporated for determining the correction data. 15. A production method

Assignees

Inventors

Classifications

Patent family

Related publications grouped by family.

External sources

Frequently asked questions

Answers are generated from the same data shown on this page.

What does patent US11458686B2 cover?
A calibration method serves for calibrating a manufacturing device for additively producing a three-dimensional object by applying layer by layer and selectively solidifying a building material. The manufacturing device comprises at least two scanning units, each of which is capable of directing a beam to different target points in the working plane, which are located within a scanning region a…
Who is the assignee on this patent?
Eos Gmbh Electro Optical Systems
What technology area does this patent fall under?
Primary CPC classification B33Y10/00. Mapped technology areas include Operations & Transport.
When was this patent published?
Publication date Tue Oct 04 2022 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 2 related publications on this page (citations in our corpus or others sharing the same primary CPC).