Method for automatic calibration of a device for generative production of a three-dimensional object

Patent metadata

Field	Value
Publication number	US-10336008-B2
Application number	US-201414888969-A
Country	US
Kind code	B2
Filing date	May 8, 2014
Priority date	May 10, 2013
Publication date	Jul 2, 2019
Grant date	Jul 2, 2019

Abstract

A method for automatically calibrating a device for generatively producing a three-dimensional object (8) comprises the following steps: irradiating an applied layer of a material (3) or a target by means of a first scanner (14) in order to produce a first test pattern (33) in the material (3) or the target; irradiating the applied layer of the material (3) or the target by means of a second scanner (15) in order to produce a second test pattern (34) in the material (3) or the target; detecting the first and second test patterns (33, 34) by means of a camera (24) and assigning the first and second test patterns (33, 34) to the first and second scanners (14, 15), respectively; comparing the first and/or the second test pattern (33, 34) with a reference pattern and/or comparing the first and second test patterns (33, 34) with one another; determining a first deviation of the first test pattern (33) from the reference pattern and/or a second deviation of the second test pattern (34) from the reference pattern and/or a relative deviation between the first test pattern (33) and the second test pattern (34); and calibrating the first and/or the second scanner (14, 15) in such a way that the first and/or the second deviation from the reference pattern and/or the relative deviation between the first test pattern (33) and the second test pattern (34) falls below a setpoint value.

First claim

The invention claimed is:

1. A method for automatically calibrating an apparatus for generatively producing a three-dimensional object, comprising:
providing a construction zone, in which the object is to be constructed layer by layer by selective consolidation of a pulverulent material;
providing a control unit for controlling the apparatus,
providing an irradiation device for emitting electromagnetic radiation onto selective regions of an applied layer of the material, wherein the irradiation device comprises at least one first and at least one second scanner;
operating the irradiation device with the first scanner, irradiating a first scan zone in the construction zone, and the second scanner irradiating a second scan zone in the construction zone; and
irradiating the applied layer of the material or a target by means of the first scanner in order to produce a first test pattern in the material or the target;
irradiating the applied layer of the material or the target by means of the second scanner in order to produce a second test pattern in the material or the target;
detecting the first and second test patterns by means of a camera and assigning the first and second test patterns to the first and second scanners, respectively;
comparing the first and second test patterns with one another;
determining a relative deviation between the first test pattern and the second test pattern comprising at least a deviation of a lattice constant of the test patterns, a deviation of a position of the test patterns in a coordinate system, a deviation of an orientation of the test patterns in the coordinate system or a deviation of size of the test patterns; and
calibrating the first and/or the second scanner in such a way that the relative deviation between the first test pattern and the second test pattern falls below a predetermined setpoint value.

2. The method as claimed in claim 1 , wherein the first and second scan zones mutually overlap in an overlap region in the construction zone.

3. The method as claimed in claim 2 , wherein the first and second test patterns are produced in pairs in the overlap region.

4. The method as claimed in claim 2 , wherein the first test pattern is situated nearer to the second scanner than the second test pattern.

5. The method as claimed in claim 1 , wherein the first and/or the second test pattern are/is a lattice pattern or a point pattern.

6. The method as claimed in claim 1 , wherein the first and second test patterns in each case have a partial pattern having an identical shape.

7. The method as claimed in claim 1 , wherein the calibrating comprises an offset, a rotation, a scaling or an adaptation of the intensity or of the focus shape of the electromagnetic radiation on the first and/or the second scanner.

8. The method as claimed in claim 1 , wherein the calibrating is carried out by means of an autocorrelation algorithm or a matching method.

9. The method as claimed in claim 1 , wherein the calibrating is carried out during the production of the three-dimensional object.

10. The method as claimed in claim 1 , wherein the pulverulent material is a metal powder.

11. The method as claimed in claim 1 , wherein the pulverulent material is a plastic powder.

Assignees

• Eos Gmbh Electro Optical Systems

Inventors

• Perret Hans
• Philippi Jochen

Classifications

• B29C64/277

  using multiple radiation means, e.g. micromirrors or multiple light-emitting diodes [LED] · CPC title

• B29C64/393

  for controlling or regulating additive manufacturing processes · CPC title

• B33Y50/02

  for controlling or regulating additive manufacturing processes · CPC title

• G05B2219/37558

  Optical sensor, scanner · CPC title

• B33Y10/00

  Processes of additive manufacturing · CPC title