Ultrasonic lens cleaning system with impedance monitoring to detect faults or degradation
US-2018117642-A1 · May 3, 2018 · US
US11420238B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-11420238-B2 |
| Application number | US-201815907125-A |
| Country | US |
| Kind code | B2 |
| Filing date | Feb 27, 2018 |
| Priority date | Feb 27, 2017 |
| Publication date | Aug 23, 2022 |
| Grant date | Aug 23, 2022 |
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In described examples, a transducer vibrates a lens element in a heating mode and a cleaning mode. Controller circuitry activates the transducer in the heating mode in response to an estimated temperature, and activates the transducer in the cleaning mode after the transducer is activated in the heating mode.
Opening claim text (preview).
What is claimed is: 1. An apparatus, comprising: a lens element; a transducer coupled to the lens element configured to vibrate the lens element at a first frequency and a different second frequency; and controller circuitry coupled to the transducer configured to: determine a first temperature of the lens element; generate a first comparison between the first temperature and a freezing point of water; responsive to the first temperature being less than the freezing point of water, activate the transducer by vibrating the lens element at the first frequency to thaw moisture on the lens element; after the lens element vibrates at the first frequency, responsive to thawed moisture on at least a portion of the lens element, activate the transducer by vibrating the lens element at the second frequency to reduce a size of the thawed moisture; determine a second temperature of the lens element; generate a second comparison between the second temperature and a depolarization temperature of the transducer; and responsive to the second temperature being greater than or equal to the depolarization temperature, deactivate the transducer. 2. The apparatus of claim 1 , wherein the transducer is configured to reduce a size of a foreign material on the lens element by vibrating the lens element at the second frequency, and the transducer is configured to further reduce the size of the foreign material by vibrating the lens element at a different third frequency. 3. The apparatus of claim 2 , wherein the foreign material includes moisture thawed responsive to the lens element vibrating at the first frequency. 4. The apparatus of claim 3 , wherein the controller circuitry is configured to activate the transducer to dry the lens element after reducing the size of the foreign material. 5. The apparatus of claim 1 , wherein the controller circuitry is configured to activate the transducer to dry the lens element by vibrating the lens element at the first frequency after vibrating the lens element at the second frequency. 6. The apparatus of claim 5 , wherein the controller circuitry is configured to generate at least one of the first or second comparisons responsive to logged temperatures. 7. The apparatus of claim 6 , wherein the controller circuitry is configured to select the first frequency responsive to an electronic image generated responsive to light traversing the lens element. 8. The apparatus of claim 1 , wherein the controller circuitry is configured to: measure an impedance of the transducer or the lens element; and determine at least one of the first temperature or the second temperature responsive to the measured impedance. 9. The apparatus of claim 8 , wherein the controller circuitry is configured to measure the impedance responsive to an excitation of the transducer by a pulse-width modulated excitation signal. 10. The apparatus of claim 8 , wherein the controller circuitry is configured to determine at least one of the first or second temperatures according to an equation T=A*Z 2 +B*Z+C, in which Z is the measured impedance responsive to the transducer being activated, A is a constant, B is a constant, C is a constant, and T is the at least one of the first temperature or the second temperature. 11. The apparatus of claim 1 , wherein the lens element is configured to remove moisture from an exterior surface of the lens element by urging the moisture along a path for moisture migration responsive to the transducer vibrating the lens element. 12. A system, comprising: a housing that shelters a space from an environment; a camera coupled to the housing, the camera including a transparent lens element exposed to the environment; an apparatus coupled to the housing, the apparatus including a transducer coupled to the lens element configured to vibrate the lens element at a first frequency and a different second frequency; and controller circuitry coupled to the housing, the controller circuitry configured to: determine a first temperature of the lens element; generate a first comparison between the first temperature and a freezing point of water; responsive to the first temperature being less than the freezing point of water, activate the transducer by vibrating the lens element at the first frequency to thaw moisture on the lens element; after the lens element vibrates at the first frequency, responsive to thawed moisture on at least a portion of the lens element, activate the transducer by vibrating the lens element at the second frequency to reduce a size of the thawed moisture; determine a second temperature of the lens element; generate a second comparison between the second temperature and a depolarization temperature of the transducer; and responsive to the second temperature being greater than or equal to the depolarization temperature, deactivate the transducer. 13. The system of claim 12 , wherein the controller circuitry is configured to determine at least one of the first or second temperature responsive to an impedance of the transducer or the lens element. 14. The system of claim 12 , wherein: the system includes a computing device coupled to the controller circuitry configured to measure an impedance-versus-frequency curve and a phase-versus-frequency curve responsive to the transducer vibrating the lens element across a range of operating frequencies; and the first frequency is within a fixed bandwidth that encompasses at least one of: a frequency corresponding to a valley on the impedance-versus-frequency curve; or a frequency corresponding to an inflection point of a lower frequency skirt associated with a phase peak of the phase-versus-frequency curve. 15. The system of claim 12 , wherein the controller circuitry is configured to select the first frequency by dynamically determining an instantaneous series resonance of the transducer or the lens element. 16. The system of claim 15 , wherein the controller circuitry is configured to select the first frequency by determining a frequency corresponding to a phase peak measured by a computing device in response to the transducer vibrating the lens element across a range of operating frequencies. 17. A method, comprising: determining a first temperature of an apparatus that includes a lens element and a transducer coupled to the lens element configured to vibrate the lens element at a first frequency and a different second frequency; generating a first comparison between the first temperature and a freezing point of water; responsive to the first temperature being less than the freezing point of water, activating the transducer to vibrate the lens element at the first frequency to thaw moisture on the lens element; after operating the transducer at the first frequency, responsive to thawed moisture on at least a portion of the lens element, activating the transducer by vibrating the lens element at the second frequency to reduce a size of the thawed moisture; determining a second temperature of the apparatus; generating a second comparison between the second temperature and a depolarization temperature of the transducer; and responsive to the second temperature being greater than or equal to the depolarization temperature, deactivating the transducer. 18. The method of claim 17 , further including measuring an impedance of the apparatus when the transducer is activated. 19. The method of claim 18 , wherein determining the first temperature includes determining the first temperature responsive to the measured imped
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