Projector with three-dimensional measurement device

Patent metadata

Field	Value
Publication number	US-11415723-B2
Application number	US-202117317325-A
Country	US
Kind code	B2
Filing date	May 11, 2021
Priority date	Jul 24, 2018
Publication date	Aug 16, 2022
Grant date	Aug 16, 2022

Abstract

A device and method for projecting a light pattern is provided. The device includes a processor system and a housing. A three-dimensional (3D) measurement device is operably coupled to the housing that measures a distance to a surface in an environment. A laser projector is operably coupled to the housing, the laser projector having a light source and a pair of movable mirrors, the light source positioned to emit light onto the pair of movable mirrors. Wherein the processor system is responsive to non-transitory executable computer instructions for: determining 3D coordinates of points on the surface with the 3D measurement device; selecting a pattern; causing the laser projector to emit a beam of light and moving the pair of mirrors to generate the pattern on the surface; and adjusting the pattern based at least in part on the 3D coordinates.

First claim

What is claimed is:

1. A device comprising:
a processor system;
a housing;
a three-dimensional (3D) measurement device operably coupled to the housing that measures a distance to a surface in an environment;
a laser projector operably coupled to the housing, the laser projector having a light source and a pair of movable mirrors, the light source positioned to emit light onto the pair of movable mirrors; and
wherein the processor system is responsive to non-transitory executable computer instructions for:
determining 3D coordinates of points on the surface with the 3D measurement device;
selecting a pattern;
causing the laser projector to emit a beam of light and moving the pair of mirrors to generate the pattern on the surface; and
adjusting the pattern based at least in part on the 3D coordinates.

2. The device of claim 1 , wherein the 3D measurement devices measures the distance based at least in part on the speed of light.

3. The device of claim 1 , wherein the adjusting of the pattern includes at least one of scaling the pattern and changing the position of the pattern.

4. The device of claim 1 , further comprising a pair of galvanometers are mirror galvanometers.

5. The device of claim 1 , wherein:
the housing rotates about an axis; and
the processor system is further responsive to rotating the housing to generate the pattern on the surface.

6. The device of claim 1 , further comprising an image sensor that records an image of the surface.

7. The device of claim 6 , wherein the processor system is further responsive to comparing a position of an image of the pattern on the surface in the image with a predetermined position and determining a projection error.

8. The device of claim 7 , wherein adjusting of the pattern is further based at least in part on the projection error.

9. The device of claim 8 , wherein the adjusting of the pattern is further based at least in part on an electronic model.

10. The device of claim 1 , wherein the electronic model includes CAD data.

11. A method comprising:
emitting a plurality of first light beams from a three-dimensional (3D) measurement device and receiving the plurality of first light beams with a sensor;
determining, with a processor system, 3D coordinates of points on a surface based at least in part on the emitting and receiving of the plurality of first light beams;
selecting a pattern;
emitting from a laser projector a second light beam;
changing the direction of the second light beam to form the pattern on the surface; and
adjusting the pattern based at least in part on the 3D coordinates.

12. The method of claim 11 , wherein the determining of the 3D coordinates is based at least in part on the speed of light.

13. The method of claim 11 , wherein the adjusting of the pattern includes changing the position of the pattern.

14. The method of claim 11 , wherein the adjusting of the pattern includes scaling the pattern.

15. The method of claim 11 , wherein the 3D measurement device and laser projector are operably coupled to a housing.

16. The method of claim 15 , further comprising rotating the housing about an axis to direct the second light onto the surface.

17. The method of claim 11 , further comprising:
recording an image of the surface with the pattern;
comparing a position of the pattern in the image with a predetermined position; and
determining a projection error based at least in part on the comparing of the position of the patter in the image.

18. The method of claim 17 , wherein the adjusting of the pattern is further based at least in part on the projection error.

19. The method of claim 18 , wherein the adjusting of the pattern is further based at least in part on an electronic model.

20. The method of claim 18 , wherein the electronic model includes CAD data.

Assignees

• Faro Tech Inc

Inventors

• Trollmann Jens
• Mueller Stefan

Classifications

• H04N1/04

  Scanning arrangements {, i.e. arrangements for the displacement of active reading or reproducing elements relative to the original or reproducing medium, or vice versa}(H04N1/387 takes precedence) · CPC title

• G01S17/86

  Combinations of lidar systems with systems other than lidar, radar or sonar, e.g. with direction finders · CPC title

• G02B26/0841

  the reflecting element being moved or deformed by electrostatic means · CPC title

• G01B11/24

  for measuring contours or curvatures · CPC title

• G01S17/89

  for mapping or imaging · CPC title