Method related to tuning the performance of superconducting nanowire single photon detector via ion implantation

US11380834B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-11380834-B2
Application numberUS-201816761803-A
CountryUS
Kind codeB2
Filing dateApr 10, 2018
Priority dateNov 10, 2017
Publication dateJul 5, 2022
Grant dateJul 5, 2022

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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Abstract

Official abstract text for this publication.

The present disclosure provides a method for making a single photon detector with a modified superconducting nanowire. The method includes: preparing a substrate; modifying a superconducting nanowire with stress on a surface of the substrate; and fabricating a superconducting nanowire single photon detector based on the superconducting nanowire with stress. Based on the above technical solution, in the superconducting nanowire single photon detector provided by the present disclosure, the device material layer film has a certain thickness, the critical temperature of the device material can be reduced, the uniformity of the device material and small superconducting transition width are ensured, thereby improving the detection efficiency of the device.

First claim

Opening claim text (preview).

We claim: 1. A method for making a single photon detector with a modified superconducting nanowire, comprising: preparing a substrate; modifying a superconducting nanowire with stress on a surface of the substrate, the stress is introduced into the superconducting nanowire based on ion implantation; and fabricating a superconducting nanowire single photon detector based on the superconducting nanowire with stress. 2. The method for making a single photon detector with a modified superconducting nanowire according to claim 1 , wherein said fabricating of the superconducting nanowire with stress on the surface of the substrate includes: preparing a superconducting thin film layer on the surface of the substrate; implanting ions from a surface of the superconducting thin film layer to introduce stress into the superconducting thin film layer; and performing photolithography and reactive ion etching on the obtained superconducting thin film layer to form the superconducting nanowire with stress. 3. The method for making a single photon detector with a modified superconducting nanowire according to claim 1 , wherein said preparing of the superconducting nanowire with stress on the surface of the substrate includes: preparing a superconducting thin film layer on the surface of the substrate; performing photolithography and reactive ion etching process on the superconducting thin film layer to obtain a superconducting nanowire structure; and implanting ions on a surface of the superconducting nanowire structure to introduce stress into the superconducting nanowire structure, to obtain the superconducting nanowire with stress. 4. The method for making a single photon detector with a modified superconducting nanowire according to claim 2 , wherein the ions in the ion implantation process are inert gas ions. 5. The method for making a single photon detector with a modified superconducting nanowire according to claim 4 , wherein in the ion implantation process, an implantation dose ranges from 1×1014 to 1×1016 cm-2, an implantation energy ranges from 10 to 100 keV, and an implantation temperature ranges from 0 to 600° C. 6. The method for making a single photon detector with a modified superconducting nanowire according to claim 2 , wherein an ion implantation area in the ion implantation process covers a surface of a stress layer to be introduced and/or ions in the ion implantation process penetrate into the stress layer to be introduced. 7. The method for making a single photon detector with a modified superconducting nanowire according to claim 1 , wherein a material of the superconducting nanowire is NbN, Nb, TaN, TiN, NbTiN or WSi. 8. The method for making a single photon detector with a modified superconducting nanowire according to claim 1 , wherein between said preparing of the substrate and said preparing of the superconducting nanowire with stress on the surface of the substrate, the method further comprises: preparing an optical reflective film on the surface of the substrate, the optical reflective film is prepared between the substrate and the superconducting nanowire. 9. The method for making a single photon detector with a modified superconducting nanowire according to claim 3 , wherein the ions in the ion implantation process are inert gas ions. 10. The method for making a single photon detector with a modified superconducting nanowire according to claim 3 , wherein an ion implantation area in the ion implantation process covers a surface of a stress layer to be introduced and/or ions in the ion implantation process penetrate into the stress layer to be introduced.

Assignees

Inventors

Classifications

  • H10F30/10Primary

    the devices being sensitive to infrared radiation, visible or ultraviolet radiation, and having no potential barriers, e.g. photoresistors · CPC title

  • Measuring the characteristics of individual optical pulses or of optical pulse trains · CPC title

  • Nanotechnology for materials or surface science, e.g. nanocomposites · CPC title

  • Manufacture or treatment of nanostructures · CPC title

  • Single-photon detection or photon counting · CPC title

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Frequently asked questions

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What does patent US11380834B2 cover?
The present disclosure provides a method for making a single photon detector with a modified superconducting nanowire. The method includes: preparing a substrate; modifying a superconducting nanowire with stress on a surface of the substrate; and fabricating a superconducting nanowire single photon detector based on the superconducting nanowire with stress. Based on the above technical solution…
Who is the assignee on this patent?
Shanghai Inst Microsystem & Information Tech Cas, Shanghai Institute Of Microsystems And Information Tech Chinese Academy Of Sciences
What technology area does this patent fall under?
Primary CPC classification H10F30/10. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Jul 05 2022 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 2 related publications on this page (citations in our corpus or others sharing the same primary CPC).