Method of processing substrate, method of manufacturing semiconductor device, recording medium, and substrate processing apparatus
US-2024234132-A1 · Jul 11, 2024 · US
US11358974B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-11358974-B2 |
| Application number | US-201816499196-A |
| Country | US |
| Kind code | B2 |
| Filing date | Mar 28, 2018 |
| Priority date | Mar 29, 2017 |
| Publication date | Jun 14, 2022 |
| Grant date | Jun 14, 2022 |
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Provided are a silylamine compound, a composition for depositing a silicon-containing thin film containing the same, and a method for manufacturing a silicon-containing thin film using the composition, and more particularly, to a silylamine compound capable of being usefully used as a precursor of a silicon-containing thin film, a composition for depositing a silicon-containing thin film containing the same, and a method for manufacturing a silicon-containing thin film using the composition.
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The invention claimed is: 1. A silylamine compound represented by the following Chemical Formula 1: in Chemical Formula 1, R 1 to R 4 are each independently C1-C7alkyl or C2-C7alkenyl, or R 1 and R 2 , and R 3 and R 4 are each independently linked to each other to form a ring. 2. The silylamine compound of claim 1 , wherein in Chemical Formula 1, R 1 to R 4 are each independently C1-C5alkyl or C2-C5alkenyl. 3. The silylamine compound of claim 1 , wherein the silylamine compound represented by Chemical Formula 1 is represented by the following Chemical Formula 2 or 3: in Chemical Formulas 2 and 3, R 11 to R 14 are each independently C1-C5alkyl or C2-C5alkenyl; and n and m are each independently an integer of 1 to 7. 4. The silylamine compound of claim 3 , wherein in Chemical Formula 2, R 11 to R 14 are each independently C1-C3alkyl or C2-C3alkenyl; and wherein in Chemical Formula 3, n and m are each independently an integer of 1 to 4. 5. The silylamine compound of claim 1 , wherein the silylamine compound represented by Chemical Formula 1 is selected from the following compounds: 6. A composition for depositing a silicon-containing thin film, the composition comprising the silylamine compound of claim 1 . 7. A method for manufacturing a silicon-containing thin film comprising depositing the composition of claim 6 onto a substrate. 8. The method of claim 7 , wherein deposition is performed by an atomic layer deposition method, a chemical vapor deposition method, a metal-organic chemical vapor deposition method, a low-pressure chemical vapor deposition method, a plasma-enhanced chemical vapor deposition method, or a plasma-enhanced atomic layer deposition method. 9. The method of claim 7 , wherein the silicon-containing thin film is a silicon oxide film, a silicon oxy carbide film, a silicon nitride film, a silicon oxy nitride film, a silicon carbonitride film, or a silicon carbide film. 10. The method of claim 7 , comprising: a) maintaining a temperature of a substrate mounted in the chamber at 30 to 500□; b) contacting the composition of claim 6 with the substrate to adsorb the composition in the substrate; and c) injecting a reaction gas into the substrate in which the composition is adsorbed to form a silicon-containing thin film. 11. The method of claim 7 , wherein the reaction gas is supplied after being activated by generating plasma with a plasma power of 50 to 1000 W.
the material being a silicon nitride not containing oxygen, e.g. SixNy or SixByNz · CPC title
the material being a silicon oxide, e.g. SiO2 · CPC title
the material being a silicon oxynitride, e.g. SiON or SiON:H · CPC title
the material containing Si, O and at least one of H, N, C, F or other non-metal elements, e.g. SiOC, SiOC:H or SiONC · CPC title
being a silicon carbide or silicon carbonitride and not containing oxygen, e.g. SiC or SiC:H · CPC title
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