Fabrication of correlated electron material devices
US-9627615-B1 · Apr 18, 2017 · US
US11355192B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-11355192-B2 |
| Application number | US-201715710290-A |
| Country | US |
| Kind code | B2 |
| Filing date | Sep 20, 2017 |
| Priority date | Feb 23, 2016 |
| Publication date | Jun 7, 2022 |
| Grant date | Jun 7, 2022 |
A practical reading order for non-experts. Skip the full description unless you need deep technical detail.
What the patent document calls the invention.
A short plain-language summary of the technical disclosure.
Who owns or filed the patent and who is credited as inventor.
Filing, priority, publication, and grant dates set the timeline.
The legal scope of protection — read this for what is actually claimed.
Technology tags used to group this patent with similar filings.
Prior art links and similar publications in this corpus.
Official abstract text for this publication.
According to one embodiment of the present disclosure, a device comprises a latching circuitry, where the latching circuitry comprises at least one correlated electron random access memory (CeRAM) element. The latching circuitry further comprises a control circuit coupled to the at least one CeRAM element. The control circuit is configured to receive at least one control signal. Based on the at least one control signal, perform at least one of storing data into the latching circuitry and outputting data from the latching circuitry.
Opening claim text (preview).
The invention claimed is: 1. A device comprising: latching circuitry, the latching circuitry to comprise: at least one correlated electron switch (CES) element; and a control circuit coupled to the at least one CES element, wherein the control circuit to: receive at least one control signal; and perform storing input signals or providing output signals, or a combination thereof, based, at least in part, on the at least one CES element and the at least one control signal, wherein the control circuit to comprise a write circuit, wherein the write circuit to: receive input signals; and program the at least one CES element into one of a plurality of impedance states to comprise at least a low impedance and/or conductive state and a high impedance and/or insulative state based, at least in part, on the received input signals, the write circuit to comprise a first transistor to couple the at least one CES element to a first voltage supply to apply a first programming signal to the at least one CES element to place the at least one CES element in the low impedance and/or conductive state and a second transistor to couple the at least one CES element to the first voltage supply to apply a second programming signal to the at least one CES element to place the at least one CES element in the high impedance and/or insulative state, wherein: the first transistor is designed to provide the first programming signal, responsive to an input signal at a first logic level applied to a gate terminal of the first transistor, to impart a first current density in the at least one CES element to establish a threshold current density condition in the at least one CES element for a subsequent transition to the high impedance and/or insulative state responsive to application of the second programming signal; and the second transistor is designed so that the second programming signal, responsive to the input signal at a second logic level to a gate terminal of the second transistor, to impart a second current density in the at least one CES element to exceed the threshold current density condition in the at least one CES element, and wherein the write circuit further to comprise a third transistor, wherein: a first terminal of the third transistor to receive the first voltage supply; and the third transistor to couple the first voltage supply to the first transistor and/or the second transistor responsive to a write enable signal applied to a gate terminal of the third transistor. 2. The device as claimed in claim 1 , wherein the control circuit to comprise a read circuit, wherein the read circuit to output at least one of the stored input signals based, at least in part, on a current impedance state of the at least one CES element. 3. The device as claimed in claim 1 , wherein the control circuit to comprise a restore circuit, wherein the restore circuit to restore a state of the latching circuitry based, at least in part, on a current impedance state of the at least one CES element. 4. The device as claimed in claim 1 , wherein the write circuit further to: program the at least one CES element to the low impedance and/or conductive state while the input signal is at the first logic level; and program the at least one CES element to the high impedance and/or insulative state while the input signal is at the second logic level. 5. The device as claimed in claim 1 , wherein: a source input of the third transistor to receive the first voltage supply; a drain input of the first transistor to be coupled to a source input of the second transistor and a drain input of the third transistor; a drain input of the second transistor to be coupled to a first input of the at least one CES element; and a drain input of the first transistor to be coupled to the first input of the at least one CES element. 6. The device as claimed in claim 2 , wherein the read circuit to comprise an output node, a fourth transistor, a fifth transistor, and a sixth transistor, wherein: a drain input of the fourth transistor to receive a second voltage supply; a gate input of the fourth transistor to receive the at least one control signal; a source input of the fourth transistor to be connected to the output node; a drain input of the fifth transistor to be connected to the output node; a gate input of the fifth transistor to receive the at least one control signal; a drain input of the sixth transistor to be connected to the source input of the fifth transistor and a first input of the at least one CES element, and wherein a second input of the at least one CES element to be coupled to a third voltage supply; a gate input of the sixth transistor to receive the at least one control signal; and a source input of the sixth transistor to be connected to the third voltage supply. 7. The device as claimed in claim 6 , wherein the read circuit further to: provide a first output at the output node while the at least one CES element is in the low impedance and/or conductive state; and provide a second output at the output node while the at least one CES element is in the high impedance and/or insulative state. 8. The device as claimed in claim 6 , wherein an impedance value of the fourth transistor and the sixth transistor to be about equal to at least twice an impedance value of the fifth transistor. 9. The device as claimed in claim 4 , wherein: a drain input of the first transistor to be coupled to a source input of the second transistor, and wherein the drain input of the first transistor to receive the first voltage supply; a gate input of the first transistor to receive the input signal; a body input of the first transistor to receive a second voltage supply; a source input of the first transistor to be coupled to a source input of the third transistor; the source input of the second transistor to be coupled to the drain input of the first transistor, and wherein the source input of the second transistor to receive the first voltage supply; a gate input of the second transistor is coupled to the input signal; a body input of the second transistor to be coupled to the source input of the second transistor; a drain input of the second transistor to be coupled to the source input of the third transistor; a body input of the third transistor to receive the first voltage supply; and a drain input of the third transistor to be coupled to a first input of the at least one CES element, and wherein a second input of the at least one CES element is coupled to a third voltage supply. 10. The device as claimed in claim 2 , wherein the read circuit further to comprise an output node, a fourth transistor and a fifth transistor, wherein: a drain input of the fourth transistor to receive a second voltage supply; a gate input of the fourth transistor to receive the at least one control signal; a source input of the fourth transistor to be connected to the output node; a drain input of the fifth transistor to be connected to the output node; a gate input of the fifth transistor to receive the at least one control signal; and a source input of the fifth transistor to be connected to a first terminal of the at least one CES element, and wherein a second input of the at least one CES element to be coupled to a third voltage supply. 11. The device as claimed in claim 10 , wherein the read circuit to: provide a first output at the output node while the at least one CES element is in the low impedance and/or conductive state; and provide a second output at the output node while the at least one CES element is in the high impedance and/or insulative state. 12. The device as claimed in claim 1 ,
and the nonvolatile element is a resistive RAM element, i.e. programmable resistors, e.g. formed of phase change or chalcogenide material · CPC title
ensuring a predetermined initial state when the supply voltage has been applied; storing the actual state when the supply voltage fails (digital storage cells each combining volatile and non-volatile storage properties G11C14/00) · CPC title
Writing or programming circuits or methods · CPC title
Reading or sensing circuits or methods · CPC title
comprising metal oxide memory material, e.g. perovskites · CPC title
Related publications grouped by family.
Answers are generated from the same data shown on this page.