Bidirectional precision surge clamp with near-zero dynamic resistance and ultra-low leakage current
US-2019123556-A1 · Apr 25, 2019 · US
US11329040B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-11329040-B2 |
| Application number | US-201916359431-A |
| Country | US |
| Kind code | B2 |
| Filing date | Mar 20, 2019 |
| Priority date | Mar 26, 2018 |
| Publication date | May 10, 2022 |
| Grant date | May 10, 2022 |
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An electronic component includes first and second separate semiconductor regions. A third semiconductor region is arranged under and between the first and second semiconductor regions. The first and third semiconductor regions define electrodes of a first diode. The second and third semiconductor regions define electrodes of a second diode. The first diode is an avalanche diode.
Opening claim text (preview).
The invention claimed is: 1. An electronic component, comprising: first and second semiconductor regions; and a third semiconductor region arranged under the first and second semiconductor regions and further extending continuously between the first and second semiconductor regions in an unbroken fashion to separate the first semiconductor region from the second semiconductor region; wherein the first and third semiconductor regions define electrodes of a first diode, the first diode being an avalanche diode; and wherein the second and third semiconductor regions define electrodes of a second diode. 2. The electronic component of claim 1 , wherein the third semiconductor region has a lower doping level than the first and second semiconductor regions. 3. The electronic component of claim 1 , wherein the third semiconductor region is located on an electrically insulating layer. 4. An electronic component, comprising: first and second semiconductor regions; and a third semiconductor region arranged under the first and second semiconductor regions and further extending between the first and second semiconductor regions to separate the first semiconductor region from the second semiconductor region; wherein the first and third semiconductor regions define electrodes of a first diode, the first diode being an avalanche diode; wherein the second and third semiconductor regions define electrodes of a second diode; wherein the third semiconductor region is located on an electrically insulating layer; and wherein the electrically insulating layer covers a support having an electric resistivity greater than 1,500 Ω/cm. 5. The electronic component of claim 4 , wherein the support is a semiconductor wafer. 6. An electronic component, comprising: first and second semiconductor regions; a third semiconductor region arranged under the first and second semiconductor regions and further extending between the first and second semiconductor regions to separate the first semiconductor region from the second semiconductor region; wherein the first and third semiconductor regions define electrodes of a first diode, the first diode being an avalanche diode; wherein the second and third semiconductor regions define electrodes of a second diode; and a third diode connected in parallel with the first and second diodes. 7. The electronic component of claim 6 , wherein the third diode comprises: first and second semiconductor areas; and a third semiconductor area located under the first and second semiconductor areas and further extending between the first and second semiconductor areas to separate the first semiconductor area from the second semiconductor area; wherein the first and second semiconductor areas define electrodes of the third diode; and wherein the first and second semiconductor areas are more heavily doped than the third semiconductor area. 8. An electronic component, comprising: first and second semiconductor regions; a third semiconductor region arranged under the first and second semiconductor regions and further extending between the first and second semiconductor regions to separate the first semiconductor region from the second semiconductor region; wherein the first and third semiconductor regions define electrodes of a first diode, the first diode being an avalanche diode; wherein the second and third semiconductor regions define electrodes of a second diode; and under the first semiconductor region, an additional semiconductor region of a same conductivity type as the third semiconductor region and more heavily doped than the third semiconductor region. 9. An electronic component, comprising: first and second semiconductor regions; a third semiconductor region arranged under the first and second semiconductor regions and further extending between the first and second semiconductor regions to separate the first semiconductor region from the second semiconductor region; wherein the first and third semiconductor regions define electrodes of a first diode, the first diode being an avalanche diode; wherein the second and third semiconductor regions define electrodes of a second diode; and a fourth semiconductor region that is located above the third semiconductor region and which defines an electrode of a Schockley diode, and wherein another electrode of the Schockley diode is defined by the second semiconductor region. 10. The electronic component of claim 9 , wherein the fourth semiconductor region is not located above the additional semiconductor region. 11. The electronic component of claim 9 , wherein the fourth semiconductor region is located in an upper portion of the first semiconductor region. 12. The electronic component of claim 9 , further including a fifth semiconductor region of a same type of conductivity as the first and second semiconductor regions, wherein the third semiconductor region extends below and between the second and fifth semiconductor regions to separate the second semiconductor region from the fifth semiconductor region, and wherein the fourth semiconductor region is located in an upper portion of the fifth semiconductor region. 13. The electronic component of claim 12 , further comprising: a first contact on the first semiconductor region; and a second contact connected to the first contact and located astride the fourth semiconductor region and the first semiconductor region or the fifth semiconductor region. 14. An electronic component, comprising; first and second semiconductor regions; a third semiconductor region arranged under the first and second semiconductor regions and further extending between the first and second semiconductor regions to separate the first semiconductor region from the second semiconductor region; wherein the first and third semiconductor regions define electrodes of a first diode, the first diode being an avalanche diode; wherein the second and third semiconductor regions define electrodes of a second diode; and an inductive element coupled to an electrode of the second diode. 15. The electronic component of claim 14 , wherein the third semiconductor region is located on an electrically insulating layer and wherein the inductive element is arranged above the electrically insulating layer. 16. The electronic component of claim 15 , wherein no semiconductor portion is located between the electrically insulating layer and the inductive element. 17. The electronic component of claim 15 , wherein the inductive element is located above a portion of a semiconductor layer arranged on the electrically insulating layer. 18. A device for protection against electrostatic discharges comprising at least one electronic component according to claim 1 . 19. A circuit comprising an electronic component according to claim 1 . 20. A device for common mode filtering and protection against electrostatic discharges, the device comprising: a first circuit comprising: a first electronic component comprising: first and second semiconductor regions; and a third semiconductor region arranged under the first and second semiconductor regions and further extending between the first and second semiconductor regions to separate the first semiconductor region from the second semiconductor region; wherein the first and third semiconductor regions define electrodes of a first diode, the first diode being an avalanche diode; and wherein the second and third semiconductor regions define electrodes of a second diode; and a first inductive ele
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