Voltage and temperature sensor for a serializer/deserializer communication application

Patent metadata

Field	Value
Publication number	US-11326961-B2
Application number	US-201916576639-A
Country	US
Kind code	B2
Filing date	Sep 19, 2019
Priority date	Mar 13, 2013
Publication date	May 10, 2022
Grant date	May 10, 2022

Abstract

The present invention relates to integrated circuits. More specifically, embodiments of the present invention provide methods and systems for determining temperatures of an integrated circuit using an one-point calibration technique, where temperature is determined by a single temperature measurement and calculation using known electrical characteristics of the integrated circuit.

First claim

What is claimed is:

1. An integrated circuit device, comprising:
a clock device outputting a first clock signal and a second clock signal;
a first delay core outputting a first delay core output, the first delay core being coupled to the first clock signal and receiving the first clock signal;
a second delay core outputting a second delay core output, the second delay core being coupled to the second clock signal and receiving the second clock signal, and coupled to the first delay core, the second clock signal being 180 degrees out of phase of the first clock signal;
a common load feedback circuit coupled to the first delay core and being coupled to the second delay core through a common mode voltage extractor coupled to the first delay core output and to the second delay core output;
a common mode generator circuit coupled to the common load feedback circuit, the common mode generator circuit being configured to operate in a voltage measurement mode or a temperature measurement mode;
a load equalizer device coupled to the second delay core output and the common mode voltage extractor; and
a comparator device coupled to the first delay core output and the common mode voltage extractor, the comparator device configured to convert a first waveform from the common mode voltage extractor to a second waveform wherein the first waveform contains current information indicative of one of a temperature reading and a voltage reading and the second waveform corresponds to a comparison between the first waveform and an output of the common mode voltage extractor.

2. The device of claim 1 wherein the first waveform is a triangular waveform and the second waveform is a square waveform.

3. The device of claim 1 wherein the first delay core and the second delay core generate a differential signal that has a common mode representing the temperature reading during the temperature measurement mode or the voltage reading during the voltage measurement mode.

4. The device of claim 1 , further comprising an input configured to receive the current information, the current information ranging from 100 mA to 1 A.

5. The device of claim 1 further comprising a plurality of lines numbered from 1 through N, where N is an integer greater than 2, each of the plurality of lines being connected to an input of a temperature sensing device through a multiplexer device.

Assignees

• Marvell Asian Pte Ltd
• Marvell Asia Pte Ltd

Inventors

• Cirit Sadettin
• Gopalakrishnan Karthik S

Classifications

• G01K7/01 Primary

  using semiconducting elements having PN junctions (G01K7/02, G01K7/16, G01K7/30 take precedence) · CPC title

• G01K1/14

  Supports; Fastening devices; Arrangements for mounting thermometers in particular locations · CPC title

• H04Q9/00

  Arrangements in telecontrol or telemetry systems for selectively calling a substation from a main station, in which substation desired apparatus is selected for applying a control signal thereto or for obtaining measured values therefrom · CPC title

• G01K15/005

  Calibration · CPC title

• G01R19/2503

  for measuring voltage only, e.g. digital volt meters (DVM's) (G01R19/2506 - G01R19/257 take precedence) · CPC title