Voltage and temperature sensor for a serializer/deserializer communication application

Patent metadata

Field	Value
Publication number	US-9587992-B1
Application number	US-201314021955-A
Country	US
Kind code	B1
Filing date	Sep 9, 2013
Priority date	Mar 13, 2013
Publication date	Mar 7, 2017
Grant date	Mar 7, 2017

Abstract

The present invention relates to integrated circuits. More specifically, embodiments of the present invention provide methods and systems for determining temperatures of an integrated circuit using an one-point calibration technique, where temperature is determined by a single temperature measurement and calculation using known electrical characteristics of the integrated circuit.

First claim

What is claimed is:

1. A method for determining a temperature measurement, the method comprising:
providing an integrated circuit device;
measuring a first temperature using a temperature sensor;
determining a first reference value for the integrated circuit device at the first temperature, the reference value being based on at least a temperature, a first delay electrical characteristic, and a design constant associated with the integrated circuit, the first reference value being proportional to the first temperature;
measuring a second delay electrical characteristic for the integrated circuit device;
determining a second reference value for the integrated circuit based on the second delay electrical characteristic and an equivalent temperature;
determining a gain value associated with the temperature sensor using at least the first reference value and the second reference value;
generating a line equation using at least the gain value;
measuring a third delay electrical characteristic comprising a differential signal from a first delay core and a second delay core receiving a common feedback voltage; and
determining a third temperature using the third delay electrical characteristic and the line equation.

2. The method of claim 1 wherein the first reference value is proportion to current.

3. The method of claim 1 wherein the first reference value comprises a current proportion to absolute temperature value described by equation IPTAT=K*T*ln(M)/R, where K is Boltzmann's constant, T is absolute temperature in Kelvin, M is the design constant, and R is a resistance value.

4. The method of claim 1 further comprising generating the second reference value using one or more control switches.

5. The method of claim 1 wherein the gain value is a ratio between changing electrical characteristic and corresponding changing temperature.

6. A system for determining a temperature measurement, the system comprising:
a temperature sensor positioned on an integrated circuit, the temperature sensor is associated with a reference value and a line equation for determining a temperature value;
a control element configured to change more variables of the reference value;
a processor configured to determine the temperature value using at least the line equation;
wherein:
the reference proportional to temperature value, a design constant, and a resistance value;
the line equation is determined by calculating a gain factor, the gain factor being based on change in temperature corresponding to change in the one or more variables caused by the control element;
the processor determines the temperature value using reading of one or more delay electrical characteristics comprising a differential signal from a first delay core and a second delay core receiving a common feedback voltage.

7. The system of claim 6 wherein the temperature sensor is configured to determine delay values.

8. The system of claim 6 further comprising a memory element for storing at least the reference value.

9. The system of claim 6 further comprising an interface for transmitting the temperature value.

10. The system of claim 6 further comprising an interface for receiving signals for temperature determination.

11. The system of claim 6 wherein the integrated circuit comprises a plurality of temperature sensors at different locations.

12. The system of claim 6 further comprising a memory storing characterization data associated with the integrated circuit, the characterization data comprising a the design constant.

13. The system of claim 6 wherein the temperature value is determined using a base reference temperature value.

14. A method for determining temperature at a region of an integrated circuit device, the method comprising:
obtaining characterization data associated with the integrated circuit device;
measuring a first temperature using a temperature sensor;
storing the first temperature;
determining a first reference value for the integrated circuit device at the first temperature, the reference value being based on at least a temperature, a first delay electrical characteristic, and a design constant associated with the characterization data, the first reference value being proportional to the first temperature, the first electrical characteristic being a delay value;
measuring a second delay electrical characteristic for the integrated circuit device;
providing a second reference value for the integrated circuit based on the second delay electrical characteristic and an equivalent temperature;
determining a gain value associated with the temperature sensor using at least the first reference value and the second reference value;
generating a line equation using at least the gain value;
determining a third delay electrical characteristic comprising a differential signal from a first delay core and a second delay core receiving a common feedback voltage; and
determining a second temperature using the third delay electrical characteristic and the line equation.

15. The method of claim 14 further comprising determining a second temperature.

16. The method of claim 14 further comprising receiving a request for a temperature reading of the integrated circuit device.

17. The method of claim 14 further comprising determining a second temperature using at least the line equation and the first temperature.

18. The method of claim 14 wherein the equivalent temperature is substantially the same as the first temperature.

Assignees

• Inphi Corp

Inventors

• Cirit Sadettin
• Gopalakrishnan Karthik S

Classifications

• G01K7/01 Primary

  using semiconducting elements having PN junctions (G01K7/02, G01K7/16, G01K7/30 take precedence) · CPC title

• H04Q9/00

  Arrangements in telecontrol or telemetry systems for selectively calling a substation from a main station, in which substation desired apparatus is selected for applying a control signal thereto or for obtaining measured values therefrom · CPC title

• G01K2219/00

  Thermometers with dedicated analog to digital converters · CPC title

• G01R19/2503

  for measuring voltage only, e.g. digital volt meters (DVM's) (G01R19/2506 - G01R19/257 take precedence) · CPC title

• G01K15/005

  Calibration · CPC title