Device for analyzing impact and puncture resistance

US11313879B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-11313879-B2
Application numberUS-201816630715-A
CountryUS
Kind codeB2
Filing dateApr 30, 2018
Priority dateJul 31, 2017
Publication dateApr 26, 2022
Grant dateApr 26, 2022

How to read this patent

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  1. Title

    What the patent document calls the invention.

  2. Abstract

    A short plain-language summary of the technical disclosure.

  3. Assignees and inventors

    Who owns or filed the patent and who is credited as inventor.

  4. Key dates

    Filing, priority, publication, and grant dates set the timeline.

  5. First independent claim

    The legal scope of protection — read this for what is actually claimed.

  6. CPC / IPC classifications

    Technology tags used to group this patent with similar filings.

  7. Citations and related patents

    Prior art links and similar publications in this corpus.

Abstract

Official abstract text for this publication.

A device for analyzing a physical characteristic of a film sample is described herein. The device includes a clamping system configured to hold the film sample. The device further includes a dart probe system configured to test a physical characteristic of the film sample. The dart probe system has a dart probe, a propulsion system configured to move the dart probe relative to the clamping system, and a force sensor configured to measure a force that the dart probe is subjected to during a movement of the dart probe. The force sensor is configured to measure a force imparted to the film sample when the dart probe comes in contact with the film sample.

First claim

Opening claim text (preview).

The invention claimed is: 1. A device for analyzing a physical characteristic of a film sample, the device comprising: a clamping system configured to hold the film sample; and a dart probe system configured to test a physical characteristic of the film sample, the dart probe system comprising a dart probe, a propulsion system configured to move the dart probe relative to the clamping system, and a force sensor configured to measure a force that the dart probe is subjected to during a movement of the dart probe, wherein the force sensor is configured to measure a force imparted to the film sample when the dart probe comes in contact with the film sample. 2. The device according to claim 1 , wherein the propulsion system comprises a linear motor configured to move the dart probe relative to the clamping system. 3. The device according to claim 2 , wherein the linear motor is configured to move the dart probe to impact the film sample at substantially constant velocity. 4. The device according to claim 3 , wherein the substantially constant velocity of the dart probe is between 0.04 m/s associated with a puncture resistance test and 4 m/s associated with a dart impact test. 5. The device according to claim 3 , wherein the substantially constant velocity of the dart probe is 3.3 m/s at impact with the film sample and the substantially constant velocity of the dart probe following impact remains at least 80% of 3.3 m/s until the film sample is punctured by the dart probe. 6. The device according to claim 2 , further comprising a computer system in communication with a controller configured to control the linear motor, wherein the computer system is configured to send a command signal to the controller to load a trajectory and to move the dart probe according to the loaded trajectory. 7. The device according to claim 1 , wherein the force sensor comprises a dynamic piezoelectric sensor. 8. The device according to claim 1 , wherein the dart probe has a hollow portion and has a hemispherical end configured to contact the film sample. 9. The device according to claim 8 , wherein the hemispherical end comprises steel and the hollow portion comprises aluminum. 10. The device according to claim 1 , wherein the clamping system comprises an upper jaw and a lower jaw, the upper and lower jaws having an open condition and a closed condition and a centrally located hole. 11. The device according to claim 10 , wherein the upper jaw and the lower jaw each comprise grooves and ridges, and the ridges in one of the upper and lower jaws are configured to fit into the grooves of the other of the upper and lower jaws. 12. The device according to claim 10 , wherein one of the upper jaw and the lower jaw comprises a holding mechanism configured to hold the film in place while the upper and lower jaws are in the open condition. 13. The device according to claim 12 , wherein the holding mechanism comprises a plurality of suction cups. 14. The device according to claim 1 , wherein the clamping system comprises a pneumatic gripper configured to move the upper jaw and lower jaw between open and closed positions. 15. The device according to claim 1 , further comprising a computer system in communication with the force sensor, the computer system being configured to acquire force data from the force sensor, wherein the computer system is further in communication with the clamping system and the dart probe system to control the opening and closing of the clamping system and an actuation of the dart probe system to acquire force data associated with said actuation.

Assignees

Inventors

Classifications

  • Clamping ring, "whole periphery" clamping · CPC title

  • Two dimensional, e.g. tapes, webs, sheets, strips, disks or membranes · CPC title

  • G01Q60/38Primary

    Probes, their manufacture, or their related instrumentation, e.g. holders · CPC title

  • G01N3/42Primary

    by performing impressions under a steady load by indentors, e.g. sphere, pyramid (G01N3/54 takes precedence) · CPC title

  • comprising robots or similar manipulators (robots per se B25J) · CPC title

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Frequently asked questions

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What does patent US11313879B2 cover?
A device for analyzing a physical characteristic of a film sample is described herein. The device includes a clamping system configured to hold the film sample. The device further includes a dart probe system configured to test a physical characteristic of the film sample. The dart probe system has a dart probe, a propulsion system configured to move the dart probe relative to the clamping syst…
Who is the assignee on this patent?
Dow Global Technologies Llc, Rohm & Haas
What technology area does this patent fall under?
Primary CPC classification G01Q60/38. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Apr 26 2022 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 2 related publications on this page (citations in our corpus or others sharing the same primary CPC).