Non-offset matrix-controlled printhead for an electrochemical additive manufacturing system

Patent metadata

Field	Value
Publication number	US-11313036-B2
Application number	US-202117535485-A
Country	US
Kind code	B2
Filing date	Nov 24, 2021
Priority date	Aug 23, 2019
Publication date	Apr 26, 2022
Grant date	Apr 26, 2022

Abstract

Process for manufacturing a printhead for a 3D manufacturing system that uses metal electrodeposition to construct parts. The printhead may be constructed by depositing layers on top of a backplane that contains control and power circuits. Deposited layers may include insulating layers and an anode layer that contain deposition anodes that are in contact with the electrolyte to drive electrodeposition. Insulating layers may for example be constructed of silicon nitride or silicon dioxide; the anode layer may contain an insoluble conductive material such as platinum group metals and their associated oxides, highly doped semiconducting materials, and carbon based conductors. The anode layer may be deposited using chemical vapor deposition or physical vapor deposition. Alternatively in one or more embodiments the printhead may be constructed by manufacturing a separate anode plane component, and then bonding the anode plane to the backplane.

First claim

What is claimed is:

1. A method for manufacturing a printhead of an electrochemical additive manufacturing system, the method comprising steps of:
depositing an insulating layer onto a backplane, wherein the backplane comprises:
a grid control circuit comprising:
an array of row traces;
an array of column traces;
a row driver circuit coupled electrically to the row traces; and
a column driver circuit coupled electrically to the column traces;

a power distribution circuit;
an array of deposition control circuits aligned with a deposition grid, wherein each deposition control circuit of the array of deposition control circuits is coupled electrically to:
the power distribution circuit;
an associated row trace of the row traces; and
an associated column trace of the column traces,

wherein the insulating layer does not entirely cover contact pads and each one of the contact pads is associated with a corresponding deposition control circuit of the array of deposition control circuits; and

depositing an anode layer on top of the contact pads such that at least one of the insulating layer or the anode layer at least partially covers the contact pads, wherein the anode layer comprises an array of deposition anodes corresponding to the array of deposition control circuits, and wherein each deposition anode of the array of deposition anodes comprises an insoluble conductive material that is coupled electrically to a corresponding one of the contact pads.

2. The method of claim 1 , wherein at least one of the insulating layer or the anode layer entirely covers the contact pads.

3. The method of claim 2 , wherein the anode layer entirely covers the contact pads.

4. The method of claim 1 , wherein both the insulating layer and the anode layer at least partially cover the contact pads.

5. The method of claim 1 , further comprising depositing a second insulating layer on top of the insulating layer and on top of the anode layer, wherein the second insulating layer does not cover an exposed surface of each deposition anode of the array of deposition anodes that is configured to contact an electrolyte.

6. The method of claim 5 , wherein the second insulating layer is further deposited on top of a portion of each one of the contact pads.

7. The method of claim 5 , wherein the second insulating layer is deposited on top of the insulating layer and on top of the anode layer such that the second insulating layer does not cover any portion of the contact pads.

8. The method of claim 1 , wherein the insoluble conductive material of each deposition anode of the array of deposition anodes comprises platinum.

9. The method of claim 1 , wherein:
the anode layer comprises a first layer and a second layer;
the step of depositing the anode layer on top of the contact pads comprises:
depositing the first layer on top of the contact pads; and
depositing the second layer on top of the first layer.

10. The method of claim 9 , wherein the second layer is made of platinum.

11. The method of claim 10 , wherein the first layer is made of titanium.

12. The method of claim 1 , wherein the step of depositing the anode layer comprises depositing the anode layer via chemical vapor deposition.

13. The method of claim 12 , wherein the step of depositing the anode layer further comprises:
depositing a seed material;
applying a mask over portions of the seed material that correspond to a desired pattern of the array of deposition anodes;
removing the seed material that is not covered by the mask;
removing the mask; and
depositing the insoluble conductive material on the seed material using the chemical vapor deposition.

14. The method of claim 12 , wherein the depositing the anode layer further comprises:
depositing the insoluble conductive material using the chemical vapor deposition;
applying a mask over portions of the insoluble conductive material that correspond to a desired pattern of the array of deposition anodes;
removing the insoluble conductive material that is not covered by the mask; and
removing the mask.

15. The method of claim 1 , wherein the step of depositing the anode layer comprises depositing the anode layer via physical vapor deposition.

16. The method of claim 15 , wherein the step of depositing the anode layer further comprises:
applying a photoresist layer on top of the insulating layer;
removing the photoresist layer in regions corresponding to a desired pattern of the array of deposition anodes;
depositing the insoluble conductive material on top of the insulating layer and the photoresist layer using the physical vapor deposition; and
removing the photoresist layer and the insoluble conductive material on top of the photoresist layer.

17. The method of claim 15 , wherein the step of depositing the anode layer further comprises:
depositing the insoluble conductive material using the physical vapor deposition;
applying a mask over portions of the insoluble conductive material that correspond to a desired pattern of the array of deposition anodes;
removing the insoluble conductive material that is not covered by the mask; and
removing the mask.

18. The method of claim 17 , wherein the removing the insoluble conductive material that is not covered by the mask comprises etching.

19. The method of claim 17 , wherein the etching comprises wet etching.

20. The method of claim 17 , wherein the etching comprises dry etching.

Assignees

• Fabric8Labs Inc

Inventors

• Pain David
• Edmonds Andrew
• Herman Jeffrey
• Pateros Charles
• White Edward

Classifications

• Y02P10/25

  Process efficiency · CPC title

• C25D1/00

  Electroforming · CPC title

• C25D17/00

  Constructional parts, or assemblies thereof, of cells for electrolytic coating · CPC title

• C23C14/08

  Oxides (C23C14/10 takes precedence) · CPC title

• C23C16/278

  doping or introduction of a secondary phase in the diamond · CPC title