Method and system for measuring power-on reset time

Patent metadata

Field	Value
Publication number	US-11287453-B2
Application number	US-201816166682-A
Country	US
Kind code	B2
Filing date	Oct 22, 2018
Priority date	Sep 19, 2017
Publication date	Mar 29, 2022
Grant date	Mar 29, 2022

Abstract

A method for measuring a power-on reset time includes: detecting a power supply pin voltage of a chip, and recording a time point at which the power supply pin voltage reaches a preset voltage as a first time point; detecting an output signal of a preset pin of the chip, and recording a time point at which the preset pin completes a pulse output for a first time after the chip is powered on, as a second time point, and recording a time point the preset pin completes a pulse output for a second time, as a third time point; wherein widths of the pulse output for the first time and for the second time are the same; and computing the power-on reset time of the chip according to the first time point, the second time point and the third time point.

First claim

What is claimed is:

1. A method for measuring a power-on reset time, comprising:
detecting a power supply pin voltage of a chip, and recording a time point at which the power supply pin voltage reaches a preset voltage as a first time point;
detecting an output signal of a preset pin of the chip, and recording a time point at which a completion of a first pulse output of the detected output signal is detected for a first time after the chip is powered on as a second time point, and recording a time point at which a completion of a second pulse output of the detected output signal is detected for a second time after the chip is powered on as a third time point; wherein widths of the first and second pulse outputs for the first time and for the second time are the same; and
computing the power-on reset time of the chip according to the first time point, the second time point and the third time point.

2. The method according to claim 1 , wherein the step of computing the power-on reset time of the chip according to the first time point, the second time point and the third time point comprises:
computing the power-on reset time of the chip according to a formula T(P)=(T 2 −T 1 )−(T 3 -T 2 );
wherein T(P) is the power-on reset time of the chip, T 1 is the first time point, T 2 is the second time point, and T 3 is the third time point.

3. The method according to claim 1 , further comprising:
correcting the power-on reset time according to a reset trigger time of a power-on reset circuit, after the power-on reset time of the chip is computed.

4. The method according to claim 3 , wherein the reset trigger time of the power-on reset circuit is a preset value.

5. The method according to claim 3 , further comprising:
recording a time point at which the power supply pin voltage appears as a fourth time point during a process of detecting the power supply pin voltage of the chip; and
the step of correcting the power-on reset time according to the reset trigger time of the power-on reset circuit comprises:
computing a time difference between the first time point and the fourth time point; and
taking the computed time difference as the reset trigger time of the power-on reset circuit and correcting the power-on reset time.

6. A system for measuring a power-on reset time, comprising:
a detecting device, configured for:
detecting a power supply pin voltage of a chip, and recording a time point at which the power supply pin voltage reaches a preset voltage as a first time point; and
detecting an output signal of a preset pin of the chip, recording a time point at which a completion of a first pulse output of the detected output signal is detected for a first time after the chip is powered on as a second time point, and recording a time point at which a completion of a second pulse output of the detected output signal is detected for a second time after the chip is powered on as a third time point, wherein widths of the first and second pulse outputs for the first time and for the second time are the same; and
a computing device, configured for computing the power-on reset time of the chip according to the first time point, the second time point and the third time point.

7. The system according to claim 6 , wherein the computing device computes the power-on reset time of the chip according to a formula T(P)=(T 2 −T 1 )−(T 3 −T 2 );
wherein T(P) is the power-on reset time of the chip, T 1 is the first time point, T 2 is the second time point, and T 3 is the third time point.

8. The system according to claim 7 , wherein the computing device is further configured for correcting the power-on reset time according to a reset trigger time of the power-on reset circuit, after the power-on reset time of the chip is computed.

9. The system according to claim 8 , wherein the reset trigger time of the power-on reset circuit is a preset value.

10. The system according to claim 8 , wherein the detecting device is further configured for recording a time point at which the power supply pin voltage appears as a fourth time point during a process of detecting the power supply pin voltage of the chip, and computing a time difference between the first time point and the fourth time point, taking the computed time difference as the reset trigger time of the power-on reset circuit, and correcting the power-on reset time.

11. The system according to claim 6 , wherein the detecting device is an oscilloscope or a logic analyzer.

12. A system for measuring a power-on reset time, comprising at least one processor; and
a memory that communicates with the at least one processor, wherein
the memory stores instructions executable by the at least one processor, the instructions being executed by the at least one processor to enable the at least one processor to:
detect a power supply pin voltage of a chip, and record a time point at which the power supply pin voltage reaches a preset voltage as a first time point;
detect an output signal of a preset pin of the chip, and record a time point at which a completion of a first pulse output of the detected output signal is detected for a first time after the chip is powered on as a second time point, and record a time point at which a completion of a second pulse output of the detected output signal is detected for a second time after the chip is powered on as a third time point; wherein widths of the first and second pulse outputs for the first time and for the second time are the same; and
compute the power-on reset time of the chip according to the first time point, the second time point and the third time point.

13. The system according to claim 12 , wherein the at least one processor is enabled to:
compute the power-on reset time of the chip according to a formula T(P)=(T 2 −T 1 )−(T 3 −T 2 );
wherein T(P) is the power-on reset time of the chip, T 1 is the first time point, T 2 is the second time point, and T 3 is the third time point.

14. The system according to claim 12 , wherein the at least one processor is enabled to: correct the power-on reset time according to a reset trigger time of a power-on reset circuit, after the power-on reset time of the chip is computed.

15. The system according to claim 14 , wherein the reset trigger time of the power-on reset circuit is a preset value.

16. The system according to claim 14 , wherein the at least one processor is further enabled to:
record a time point at which the power supply pin voltage appears as a fourth time point during a process of detecting the power supply pin voltage of the chip;
compute a time difference between the first time point and the fourth time point; and
take the computed time difference as the reset trigger time of the power-on reset circuit and correct the power-on reset time.

Assignees

• Shenzhen Goodix Techology Co Ltd
• Shenzhen Goodix Tech Co Ltd

Inventors

• Li Qingbin
• Chen Dekun

Classifications

• H03K17/22 Primary

  Modifications for ensuring a predetermined initial state when the supply voltage has been applied (bi-stable generators H03K3/12) · CPC title

• G01R29/02

  Measuring characteristics of individual pulses, e.g. deviation from pulse flatness, rise time or duration · CPC title

• G01R19/175 Primary

  Indicating the instants of passage of current or voltage through a given value, e.g. passage through zero · CPC title

• G01R19/16576

  comparing DC or AC voltage with one threshold (G01R19/16514, G01R19/16519, G01R19/16528, G01R19/16533 and G01R19/1659 take precedence) · CPC title

• G01R22/00

  Arrangements for measuring time integral of electric power or current, e.g. electricity meters · CPC title