System and method for compensating for thermal expansion caused by soldering process

Patent metadata

Field	Value
Publication number	US-11267062-B2
Application number	US-202016890658-A
Country	US
Kind code	B2
Filing date	Jun 2, 2020
Priority date	Jun 2, 2020
Publication date	Mar 8, 2022
Grant date	Mar 8, 2022

Abstract

Systems and methods are disclosed that may include identifying a first coefficient of thermal expansion for a first component, the first component including component pins having a first pitch value; identifying a second coefficient of thermal expansion for a second component, the second component associated with electrically conductive pads; determining a relative expansion value based on the first coefficient of thermal expansion and the second coefficient of thermal expansion; determining a change in temperature value of the first component and the second component, the change in temperature value indicating a change in temperature caused by a soldering process; and determining a second pitch value for the electrically conductive pads based on a product of the relative expansion value, the first pitch value, and the change in temperature value, the second pitch value causing an alignment between the component pins and the electrically conductive pads during the soldering process.

First claim

What is claimed is:

1. A method for compensating for thermal expansion caused by a soldering process, the method comprising:
identifying a first coefficient of thermal expansion (CTE) for a first material of a first component, the first component including a plurality of component pins having a first pitch value;
identifying a second CTE for a second material of a second component, the second component associated with a plurality of electrically conductive pads;
determining a relative expansion value based on the first CTE and the second CTE;
determining a change in temperature value of the first component and the second component, the change in temperature value indicating a change in temperature caused by the soldering process; and
determining a second pitch value for the plurality of electrically conductive pads based on a product of the relative expansion value, the first pitch value, and the change in temperature value, the second pitch value causing an alignment between the plurality of component pins and the plurality of electrically conductive pads during the soldering process.

2. The method of claim 1 , further comprising:
disposing the plurality of electrically conductive pads on a surface of the second component based on the second pitch value.

3. The method of claim 1 , wherein determining the relative expansion value comprises:
determining a difference between the first CTE and the second CTE.

4. The method of claim 1 , wherein determining the change of temperature value comprises:
determining a difference between a first temperature value and a second temperature value, the first temperature value associated with a room temperature, the second temperature value associated with the soldering process.

5. The method of claim 1 , wherein determining the second pitch value comprises:
determining that the second CTE is greater than the first CTE; and
in response to determining that the second CTE is greater than the first CTE, subtracting the product from the first pitch value.

6. The method of claim 1 , wherein determining the second pitch value comprises:
determining that the second CTE is less than the first CTE; and
in response to determining that the second CTE is less than the first CTE, adding the product to the first pitch value.

7. The method of claim 1 , wherein the first component is a surface-mount electronic component.

8. The method of claim 1 , wherein the second component is a printed circuit board (PCB).

9. An information handling system, comprising:
a processor;
a first component;
a second component; and
a memory medium coupled to the processor that includes instructions executed by the processor causing the information handling system to:
identify a first coefficient of thermal expansion (CTE) for a first material of the first component, the first component including a plurality of component pins having a first pitch value;
identify a second CTE for a second material of the second component, the second component associated with a plurality of electrically conductive pads;
determine a relative expansion value based on the first CTE and the second CTE;
determine a change in temperature value of the first component and the second component, the change in temperature value indicating a change in temperature caused by the soldering process; and
determine a second pitch value for the plurality of electrically conductive pads based on a product of the relative expansion value, the first pitch value, and the change in temperature value, the second pitch value causing an alignment between the plurality of component pins and the plurality of electrically conductive pads during the soldering process.

10. The information handling system of claim 9 , wherein to determine the relative expansion value, the instructions further cause the information handling system to:
determine a difference between the first CTE and the second CTE.

11. The information handling system of claim 9 , wherein to determine the change of temperature value, the instructions further cause the information handling system to:
determine a difference between a first temperature value and a second temperature value, the first temperature value associated with a room temperature, the second temperature value associated with the soldering process.

12. The information handling system of claim 9 , wherein to determine the second pitch value, the instructions further cause the information handling system to:
determining that the second CTE is greater than the first CTE; and
in response to determining that the second CTE is greater than the first CTE, subtract the product from the first pitch value.

13. The information handling system of claim 9 , wherein to determine the second pitch value, the instructions further cause the information handling system to:
determine that the second CTE is less than the first CTE; and
in response to determining that the second CTE is less than the first CTE, add the product to the first pitch value.

14. The information handling system of claim 9 , wherein the first component is a surface-mount component.

15. The information handling system of claim 9 , wherein the second component is a printed circuit board (PCB).

16. A computer-readable non-transitory memory medium that includes instructions executed by a processor of an information handling system causing the information handling system to:
identify a first coefficient of thermal expansion (CTE) for a first material of a first component, the first component including a plurality of component pins having a first pitch value;
identify a second CTE for a second material of a second component, the second component associated with a plurality of electrically conductive pads;
determine a relative expansion value based on the first CTE and the second CTE;
determine a change in temperature value of the first component and the second component, the change in temperature value indicating a change in temperature caused by the soldering process; and
determine a second pitch value for the plurality of electrically conductive pads based on a product of the relative expansion value, the first pitch value, and the change in temperature value, the second pitch value causing an alignment between the plurality of component pins and the plurality of electrically conductive pads during the soldering process.

17. The computer-readable non-transitory memory medium of claim 16 , wherein to determine the relative expansion value, the instructions further cause the information handling system to:
determine a difference between the first CTE and the second CTE.

18. The computer-readable non-transitory memory medium of claim 16 , wherein to determine the change of temperature value, the instructions further cause the information handling system to:
determine a difference between a first temperature value and a second temperature value, the first temperature value associated with a room temperature, the second temperature value associated with the soldering process.

19. The computer-readable non-transitory memory medium of claim 16 , wherein to determine the second pitch value, the instructions further cause the information handling system to:
determine that the second CTE is greater than the first CTE; and
in response to determining that the second CTE is greater than the first CTE, subtract the product from the first pitch value.

20. The computer-readable non-transitory memory medium of claim 16 , wherein to determine the sec

Assignees

• Dell Products Lp

Inventors

• Kennedy Brian D
• Strickland Stephen E

Classifications

• Y02P90/02

  Total factory control, e.g. smart factories, flexible manufacturing systems [FMS] or integrated manufacturing systems [IMS] · CPC title

• Y02P70/50

  Manufacturing or production processes characterised by the final manufactured product · CPC title

• G06F2119/08

  Thermal analysis or thermal optimisation · CPC title

• G06F2115/12

  Printed circuit boards [PCB] or multi-chip modules [MCM] · CPC title

• G06F30/39

  Circuit design at the physical level (physical level design for reconfigurable circuits G06F30/347) · CPC title