Molecular layer etching

US11257682B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-11257682-B2
Application numberUS-201916588176-A
CountryUS
Kind codeB2
Filing dateSep 30, 2019
Priority dateSep 30, 2019
Publication dateFeb 22, 2022
Grant dateFeb 22, 2022

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A method of etching an organic or hybrid inorganic/organic material. The method etches molecular layer deposition coatings. An etching cycle comprises a first half reaction exposing the coating to a precursor. A second half reaction exposes a second precursor, removing or etching a portion of the coating.

First claim

Opening claim text (preview).

What is claimed is: 1. A method of etching an organic/inorganic hybrid coating on a inorganic substrate, comprising: performing an etching cycle comprising: a first half reaction exposing a first etching precursor comprising a gaseous lithium precursor to the coating on the substrate at a first half reaction temperature, the coating being selected from the group consisting of an organic coating and an organic-inorganic coating; and a second half reaction exposing a second etching precursor, which comprises trimethylaluminum, to the coating at a second half reaction temperature; and removing a portion of the organic/inorganic coating; wherein the first etching precursor is selected from the group consisting of lithium tert-butoxide (LiO t Bu) and lithium hexamethyldisilizane (LiHMDS), and wherein performing the etching cycle does not comprise flowing water to react with the first etching precursor or the second etching precursor. 2. The method of claim 1 , wherein the first half reaction temperature and the second half reaction temperature are between 150° C. and 300° C. 3. The method of claim 1 , wherein the organic/inorganic coating is a metalcone. 4. The method of claim 3 , wherein the metalcone is alucone. 5. The method of claim 1 , wherein the inorganic substrate is Al 2 O 3 . 6. The method of claim 1 , wherein the removing is at a rate of 4-40 Angstrom/cycle. 7. The method of claim 1 , wherein the substrate is nonreactive with the first etching precursor and the second etching precursor. 8. The method of claim 1 , wherein the gaseous lithium precursor and the second etching precursor are non-reactive with the substrate. 9. The method of claim 1 , wherein the etching is at an etching temperature of 150° C. to 300° C. 10. A method of forming an object comprising: performing an alucone deposition cycle comprising: exposing a first deposition precursor to the substrate, exposing a second deposition precursor to the substrate, and repeating the deposition cycle N times, forming an alucone coating on the substrate; performing an etching cycle comprising: a first half reaction exposing a first etching precursor comprising a lithium precursor to the alucone coating on the substrate, and a second half reaction exposing a second etching precursor, which comprises an organometallic, to the alucone coating; and removing a portion of the alucone coating; wherein the first etching precursor is selected from the group consisting of lithium tert-butoxide (LiO t Bu) and lithium hexamethyldisilizane (LiHMDS), and wherein performing the etching cycle does not comprise flowing water to react with the first etching precursor or the second etching precursor. 11. The method of claim 10 , wherein the first half reaction temperature and the second half reaction temperature are between 150° C. and 300° C. 12. The method of claim 10 , wherein the inorganic substrate is Al 2 O 3 . 13. The method of claim 10 , wherein the removing is at a rate of 4-40 Angstrom/cycle. 14. The method of claim 10 , wherein the substrate is nonreactive with the first etching precursor and the second etching precursor. 15. The method of claim 10 , wherein the first etching precursor and the organometallic are non-reactive with the substrate.

Assignees

Inventors

Classifications

  • for lift-off processes · CPC title

  • for lift-off processes · CPC title

  • by chemical means · CPC title

  • the material containing aluminium, e.g. Al2O3 · CPC title

  • deposition by cyclic CVD, e.g. ALD, ALE or pulsed CVD · CPC title

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Frequently asked questions

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What does patent US11257682B2 cover?
A method of etching an organic or hybrid inorganic/organic material. The method etches molecular layer deposition coatings. An etching cycle comprises a first half reaction exposing the coating to a precursor. A second half reaction exposes a second precursor, removing or etching a portion of the coating.
Who is the assignee on this patent?
Uchicago Argonne Llc
What technology area does this patent fall under?
Primary CPC classification H10P50/283. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Feb 22 2022 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 1 related publication on this page (citations in our corpus or others sharing the same primary CPC).