Resist underlayer composition, and method of forming patterns using the composition

US11249396B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-11249396-B2
Application numberUS-202016789233-A
CountryUS
Kind codeB2
Filing dateFeb 12, 2020
Priority dateMar 6, 2019
Publication dateFeb 15, 2022
Grant dateFeb 15, 2022

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A resist underlayer composition includes a polymer including a structural unit represented by Chemical Formula 1; and a solvent and a method of forming patterns using the resist underlayer composition: In Chemical Formula 1, at least one of A 1 and A 2 is a group represented by Chemical Formula A:

First claim

Opening claim text (preview).

What is claimed is: 1. A resist underlayer composition, comprising: a polymer including a structural unit represented by Chemical Formula 1; and a solvent: wherein, in Chemical Formula 1, L 1 to L 5 are each independently a single bond, a substituted or unsubstituted C1 to C30 alkylene group, a substituted or unsubstituted C6 to C30 arylene group, a substituted or unsubstituted C1 to C30 heteroalkylene group, a substituted or unsubstituted C3 to C20 cycloalkylene group, a substituted or unsubstituted C2 to C20 heterocycloalkylene group, a substituted or unsubstituted C1 to C30 heteroalkenylene group, a substituted or unsubstituted C2 to C30 heteroarylene group, a substituted or unsubstituted C1 to C30 alkenylene group, a substituted or unsubstituted C1 to C30 alkynylene group, or a combination thereof, L 6 and L 7 are each independently O, S, S(O), S(O 2 ), C(O), C(O)O, OC(O)O, a single bond, a substituted or unsubstituted C1 to C30 alkylene group, a substituted or unsubstituted C6 to C30 arylene group, a substituted or unsubstituted C1 to C30 heteroalkylene group, a substituted or unsubstituted C3 to C20 cycloalkylene group, a substituted or unsubstituted C2 to C20 heterocycloalkylene group, a substituted or unsubstituted C1 to C30 heteroalkenylene group, a substituted or unsubstituted C2 to C30 heteroarylene group, a substituted or unsubstituted C1 to C30 alkenylene group, a substituted or unsubstituted C1 to C30 alkynylene group, or a combination thereof, R 1 and R 2 are each independently hydrogen, deuterium, a halogen, a hydroxy group, a cyano group, a nitro group, an amino group, an epoxy group, a vinyl group, a (meth)acrylate group, an oxetane group, a thiol group, a carboxyl group, a substituted or unsubstituted C1 to C30 alkyl group, a substituted or unsubstituted C2 to C30 alkenyl group, a substituted or unsubstituted C2 to C30 alkynyl group, a substituted or unsubstituted C1 to C10 alkoxy group, a substituted or unsubstituted C1 to C30 thioalkyl group, a substituted or unsubstituted C3 to C30 cycloalkyl group, a substituted or unsubstituted C2 to C20 heterocycloalkyl group, a substituted or unsubstituted C6 to C30 aryl group, a substituted or unsubstituted C6 to C30 aryloxy group, a substituted or unsubstituted C6 to C30 thioaryl group, a substituted or unsubstituted C2 to C30 heteroaryl group, or a combination thereof, n is an integer of 1 to 1,000, D is O, S, S(O 2 ), C(O), or C(O)O, m is an integer of 0 or 1, * is a linking point, A 1 and A 2 are each independently O, S, S(O), S(O 2 ), C(O), C(O)O, OC(O)O, a substituted or unsubstituted C3 to C10 cycloalkylene group, a substituted or unsubstituted C2 to C10 heterocycloalkylene group, a substituted or unsubstituted C6 to C30 arylene group, a substituted or unsubstituted C2 to C30 heteroarylene group, or a combination thereof, and at least one of A 1 and A 2 is a group represented by Chemical Formula A: wherein, in Chemical Formula A, L a is a single bond, a substituted or unsubstituted C1 to C30 alkylene group, a substituted or unsubstituted C6 to C30 arylene group, a substituted or unsubstituted C1 to C30 heteroalkylene group, a substituted or unsubstituted C3 to C20 cycloalkylene group, a substituted or unsubstituted C2 to C20 heterocycloalkylene group, a substituted or unsubstituted C1 to C30 heteroalkenylene group, a substituted or unsubstituted C2 to C30 heteroarylene group, a substituted or unsubstituted C1 to C30 alkenylene group, a substituted or unsubstituted C1 to C30 alkynylene group, or a combination thereof, and * is a linking point. 2. The resist underlayer composition of claim 1 , wherein A 1 and A 2 are each independently a substituted or unsubstituted C3 to C10 cycloalkylene group, a substituted or unsubstituted C2 to C10 heterocycloalkylene group, a substituted or unsubstituted C6 to C30 arylene group, a substituted or unsubstituted C2 to C30 heteroarylene group, or combination thereof. 3. The resist underlayer composition of claim 2 , wherein A 1 and A 2 are each independently one selected from the moieties of Group I: wherein, in Group I, X 1 to X 15 and X 17 to X 24 are each independently N or CR b , X 16 is NR a or CR c R d , Z 1 to Z 6 are each independently O, S, C(O), or CR c R d , R a , R b , R c , R d , R e , R f , R g , and R h are each independently hydrogen, deuterium, a hydroxy group, a thiol group, a halogen, a substituted or unsubstituted vinyl group, a substituted or unsubstituted C1 to C30 alkyl group, a substituted or unsubstituted C6 to C30 aryl group, a substituted or unsubstituted C1 to C10 alkoxy group, or a combination thereof, L b is a single bond, a substituted or unsubstituted C1 to C30 alkylene group, a substituted or unsubstituted C6 to C30 arylene group, a substituted or unsubstituted C1 to C30 heteroalkylene group, a substituted or unsubstituted C3 to C20 cycloalkylene group, a substituted or unsubstituted C2 to C20 heterocycloalkylene group, a substituted or unsubstituted C1 to C30 heteroalkenylene group, a substituted or unsubstituted C2 to C30 heteroarylene group, a substituted or unsubstituted C1 to C30 alkenylene group, a substituted or unsubstituted C1 to C30 alkynylene group, or a combination thereof, and * is a linking point. 4. The resist underlayer composition of claim 3 , wherein A 1 and A 2 are each independently one selected from the moieties of Group I-1: wherein, in Group I-1, * is a linking point. 5. The resist underlayer composition of claim 1 , wherein the polymer comprises at least one of the structural units represented by Chemical Formula 2 to Chemical Formula 5: wherein, in Chemical Formula 2 to Chemical Formula 5, R 1 and R 2 are each independently hydrogen, deuterium, a halogen, a hydroxy group, a cyano group, a nitro group, an amino group, an epoxy group, a vinyl group, a (meth)acrylate group, an oxetane group, a thiol group, a carboxyl group, a substituted or unsubstituted C1 to C30 alkyl group, a substituted or unsubstituted C2 to C30 alkenyl group, a substituted or unsubstituted C2 to C30 alkynyl group, a substituted or unsubstituted C1 to C10 alkoxy group, a substituted or unsubstituted C1 to C30 thioalkyl group, a substituted or unsubstituted C3 to C30 cycloalkyl group, a substituted or unsubstituted C2 to C20 heterocycloalkyl group, a substituted or unsubstituted C6 to C30 aryl group, a substituted or unsubstituted C6 to C30 aryloxy group, a substituted or unsubstituted C6 to C30 thioaryl group, a substituted or unsubstituted C2 to C30 heteroaryl group, or a combination thereof, n is an integer of 1 to 1,000, L 6 and L 7 are each independently O, S, S(O), S(O 2 ), C(O), C(O)O, OC(O)O, a single bond, a substituted or unsubstituted C1 to C30 alkylene group, a substituted or unsubstituted C6 to C30 arylene group, a substituted or unsubstituted C1 to C30 heteroalkylene group, a substituted or unsubstituted C3 to C20 cycloalkylene group, a substituted or unsubstituted C2 to C20 heterocycloalkylene group, a substituted or unsubstituted C1 to C30 heteroalkenylene group, a substituted or unsubstituted C2 to C30 heteroarylene group, a sub

Assignees

Inventors

Classifications

  • from polycyanurates · CPC title

  • C09D175/16Primary

    having terminal carbon-to-carbon unsaturated bonds · CPC title

  • Multilayer resist systems, e.g. planarising layers · CPC title

  • Finishing the coated layer, e.g. drying, baking, soaking · CPC title

  • containing isocyanurate groups · CPC title

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What does patent US11249396B2 cover?
A resist underlayer composition includes a polymer including a structural unit represented by Chemical Formula 1; and a solvent and a method of forming patterns using the resist underlayer composition: In Chemical Formula 1, at least one of A 1 and A 2 is a group represented by Chemical Formula A:
Who is the assignee on this patent?
Samsung Sdi Co Ltd
What technology area does this patent fall under?
Primary CPC classification C09D175/16. Mapped technology areas include Chemistry & Metallurgy.
When was this patent published?
Publication date Tue Feb 15 2022 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 1 related publication on this page (citations in our corpus or others sharing the same primary CPC).