Methods for depositing a transition metal chalcogenide film on a substrate by a cyclical deposition process

Patent metadata

Field	Value
Publication number	US-11244825-B2
Application number	US-202017028066-A
Country	US
Kind code	B2
Filing date	Sep 22, 2020
Priority date	Nov 16, 2018
Publication date	Feb 8, 2022
Grant date	Feb 8, 2022

Abstract

Systems for depositing a transition metal chalcogenide film on a substrate by cyclical deposition process are disclosed. The methods may include, contacting the substrate with at least one transition metal containing vapor phase reactant comprising at least one of a hafnium precursor, or a zirconium precursor, and contacting the substrate with at least one chalcogen containing vapor phase reactant. Semiconductor device structures including a transition metal chalcogenide film deposited by the methods of the disclosure are also provided.

First claim

What is claimed is:

1. A reaction system comprising: a reaction chamber; a first precursor reactant source comprising at least one transition metal containing reactant comprising at least one of a hafnium precursor and a zirconium precursor; a second precursor reactant source comprising at least one chalcogen containing reactant; and a system operation and control mechanism, wherein the system operation and control mechanism controls timing of gas pulse sequences from the first precursor reactant source and the second precursor reactant source to: contact a substrate with a vapor phase of the at least one transition metal containing reactant; and contact the substrate with a vapor phase of the at least one chalcogen containing reactant, to thereby form a transition metal chalcogenide film by a cyclical deposition process, wherein the temperature of the substrate during the steps of contact the substrate with a vapor phase of the at least one transition metal containing reactant and contact the substrate with a vapor phase of the at least one chalcogen containing vapor phase reactant is below 450° C.

2. The reaction system of claim 1 , wherein the cyclical deposition process comprises an atomic layer deposition process.

3. The reaction system of claim 1 , wherein the cyclical deposition process comprises a cyclical chemical vapor deposition process.

4. The reaction system of claim 1 , wherein the first precursor reactant source comprises at least one of a halide precursor and a metalorganic precursor.

5. The reaction system of claim 4 , wherein the first precursor reactant source comprises at least one of hafnium tetrachloride (HfCl 4 ) and zirconium tetrachloride (ZrCl 4 ).

6. The reaction system of claim 4 , wherein the metalorganic precursor comprises at least one of an alkylamide precursor and a cyclopentadienyl-ligand containing precursor.

7. The reaction system of claim 6 , wherein the alkylamide precursor comprises at least one of tetrakis(ethylmethylamido)hafnium (Hf(NEtMe) 4 ) and tetrakis(ethylmethylamido)zirconium (Zr(NEtMe) 4 ).

8. The reaction system of claim 6 , wherein the cyclopentadienyl-ligand containing precursor comprises at least one of tris(dimethylamido)cyclopentadienylhafnium (HfCp(NMe 2 ) 3 ), bis(methylcyclopentadienyl)methoxymethylhafnium ((MeCp) 2 Hf(CH) 3 (OCH 3 )), tris(dimethylamido)cyclopentadienylzirconium (ZrCp(NMe 2 ) 3 ), and bis(methylcyclopentadienyl)methoxymethylzirconium ((MeCp) 2 Zr(CH) 3 (OCH 3 )).

9. The reaction system of claim 1 , wherein the at least one chalcogen containing reactant comprises hydrogen sulfide (H 2 S), hydrogen selenide (H 2 Se), dimethyl sulfide ((CH 3 ) 2 S), or dimethyl telluride (CH 3 ) 2 Te.

10. The reaction system of claim 1 , further comprising a gas purifier, wherein the system operation and control mechanism further controls a flow of the vapor phase of the at least one chalcogen containing reactant through the gas purifier prior to entering the reaction chamber to reduce a concentration of at least one of water and oxygen within the vapor phase of the at least one chalcogen containing reactant.

11. The reaction system of claim 10 , wherein the concentration of at least one of water and oxygen within the chalcogen containing vapor phase reactant is reduced to less than 1 part per million.

12. The reaction system of claim 1 , wherein the system operation and control mechanism controls flow of a carrier gas through the first precursor reactant source to transport the vapor phase of the at least one transition metal containing reactant to the reaction chamber and to flow the carrier gas through a gas purifier prior to entering the first precursor reactant source to reduce a concentration of at least one of water and oxygen within the carrier gas.

13. The reaction system of claim 12 , wherein the concentration of at least one of water and oxygen within the carrier gas is reduced to less than 1 part per million.

14. The reaction system of claim 1 , wherein the system operation and control mechanism effectuates pre-anneal in the reaction chamber, prior to film deposition, at a temperature of greater than 500° C.

15. The reaction system of claim 1 , wherein the transition metal chalcogenide film comprises a predominant (001) crystallographic orientation.

16. The reaction system of claim 1 , wherein the system operation and control mechanism further effectuates deposition of a capping layer over the transition metal chalcogenide film to substantially prevent oxidation of the transition metal chalcogenide film when exposed to ambient conditions.

17. The reaction system of claim 16 , wherein the depositing the capping layer over the transition metal chalcogenide film comprises depositing the capping layer utilizing non-oxidative precursors or non-oxygen reactants.

18. The reaction system of claim 16 , wherein the capping layer comprises a metal silicate film.

19. The reaction system of claim 16 , wherein the metal silicate film comprises an aluminum silicate film.

20. The reaction system of claim 1 , wherein the operation and control mechanism controls a pressure within the reaction chamber.

Assignees

• Asm Ip Holding Bv

Inventors

• Mattinen Miika
• Ritala Mikko
• Leskelä Markku

Classifications

• H10P14/6929

  the material containing aluminium, e.g. AlSiOx · CPC title

• H10P14/6334

  using decomposition or reaction of gaseous or vapour phase compounds, i.e. chemical vapour deposition (deposition by physical ablation of a target H10P14/6329) · CPC title

• H10P14/3466

  Crystal orientation · CPC title

• H10P14/24

  using chemical vapour deposition [CVD] · CPC title

• H10P14/3436 Primary

  being chalcogenide semiconductor materials not being oxides, e.g. ternary compounds · CPC title