Gyro quadrature stabalization with demodulation phase error nulling
US-9605964-B2 · Mar 28, 2017 · US
US11221218B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-11221218-B2 |
| Application number | US-201916713378-A |
| Country | US |
| Kind code | B2 |
| Filing date | Dec 13, 2019 |
| Priority date | Aug 12, 2019 |
| Publication date | Jan 11, 2022 |
| Grant date | Jan 11, 2022 |
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A vibrating structure angular rate sensor comprises a MEMS structure includes a mount, a plurality of supporting structures fixed to the mount, and a vibrating planar ring structure flexibly supported by the plurality of supporting structures to move elastically relative to the mount. At least one primary drive transducer is arranged to cause the ring structure to oscillate in a primary mode at the resonant frequency of the primary mode. At least one primary pick-off transducer arranged to detect oscillation of the ring structure in the primary mode. At least three secondary pick-off transducers are arranged to detect oscillation of the ring structure in a secondary mode induced by Coriolis force when an angular rate is applied around an axis substantially perpendicular to the ring structure. At least one secondary drive transducer is arranged to null the induced oscillation in the secondary mode.
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The invention claimed is: 1. A vibrating structure angular rate sensor comprising: a MEMS structure comprising a mount, a plurality of supporting structures fixed to the mount, and a vibrating planar ring structure flexibly supported by the plurality of supporting structures to move elastically relative to the mount; at least one primary drive transducer arranged to cause the ring structure to oscillate in a primary mode at the resonant frequency of the primary mode; at least one primary pick-off transducer arranged to detect oscillation of the ring structure in the primary mode; at least three secondary pick-off transducers arranged to detect oscillation of the ring structure in a secondary mode induced by Coriolis force when an angular rate is applied around an axis substantially perpendicular to the ring structure; and at least one secondary drive transducer arranged to null the induced oscillation in the secondary mode; and wherein the number of secondary pick-off transducers and the number of secondary drive transducers is an odd number, and wherein the number of secondary drive transducers is smaller than the number of secondary pick-off transducers. 2. The sensor of claim 1 , wherein the at least three secondary pick-off transducers are electrically connected in series. 3. The sensor of claim 1 , further comprising a secondary pick-off signal output arranged to receive a secondary pick-off signal from each of the at least three secondary pick-off transducers. 4. The sensor of claim 3 , wherein the secondary pick-off signal output comprises an analogue amplifier. 5. The sensor of claim 4 , further comprising a rate output circuit connected to the secondary pick-off signal output to provide an output representative of the applied angular rate. 6. The sensor of claim 3 , further comprising a rate control loop connected to the secondary pick-off signal output. 7. The sensor of claim 6 , wherein the rate control loop is arranged to apply a secondary drive signal to the at least one secondary drive transducer, the secondary drive signal having a magnitude including a coefficient dependent on the number of secondary drive transducers. 8. The sensor of claim 7 , wherein the coefficient is two when there are three secondary pick-off transducers. 9. The sensor of claim 1 , wherein the transducers consist of a pair of primary drive transducers, a pair of primary pick-off transducers, one secondary drive transducer and three secondary pick-off transducers. 10. The sensor of claim 1 , wherein the transducers are spaced equi-angularly around a circumference of the vibrating planar ring structure. 11. The sensor of claim 1 , wherein each transducer is an inductive-type transducer. 12. The sensor of claim 1 , wherein each transducer is a capacitive-type transducer. 13. The sensor of claim 1 , wherein the MEMS structure is a semiconductor structure. 14. The sensor of claim 1 , further comprising a sensor package, the MEMS structure being sealed inside the sensor package, and a printed circuit board on which the sensor package in mounted, wherein electrical connections are made from the printed circuit board to the MEMS structure through the sensor package.
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the devices involving a micromechanical structure · CPC title
the devices involving a micromechanical structure · CPC title
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