Methods and apparatus providing thermal isolation of photonic devices
US-2019013452-A1 · Jan 10, 2019 · US
US11217737B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-11217737-B2 |
| Application number | US-202016945309-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jul 31, 2020 |
| Priority date | Jun 15, 2012 |
| Publication date | Jan 4, 2022 |
| Grant date | Jan 4, 2022 |
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Described embodiments include photonic integrated circuits and systems with photonic devices, including thermal isolation regions for the photonic devices. Methods of fabricating such circuits and systems are also described.
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We claim: 1. A method of operating an integrated structure, the method comprising: heating, with a heating device formed in a device formation region of the integrated structure, a temperature-sensitive photonic device formed in the device formation region; and thermally isolating, with a thermal isolation structure located in a trench formed in an upper surface of a substrate of the integrated structure, the substrate, wherein the heating device is located directly over the thermal isolation structure, and wherein the temperature-sensitive photonic device is laterally separated from the thermal isolation structure such that the temperature-sensitive photonic device is not formed directly over the thermal isolation structure. 2. The method of claim 1 , further comprising operating a waveguide formed in the device formation region, wherein the waveguide is separated from the trench by a portion of the substrate. 3. The method of claim 1 , wherein the thermal isolation structure comprises a physical gap between the heating device and substrate. 4. The method of claim 1 , wherein the thermal isolation structure is a first thermal isolation structure, and further comprising thermally isolating, with a second thermal isolation structure, the temperature-sensitive photonic device. 5. The method of claim 4 , wherein the second thermal isolation structure is located in the trench. 6. The method of claim 4 , wherein the first thermal isolation structure and the second thermal structure comprise separate materials. 7. The method of claim 4 , wherein the trench is a first trench, and wherein the second thermal isolation structure is located in a second trench. 8. The method of claim 1 , wherein the first thermal isolation structure comprises a low thermal conductivity material within the first trench. 9. The method of claim 8 , wherein the low thermal conductivity material has a thermal conductivity that is less than approximately 0.006 W/cm° C. 10. The method of claim 8 , wherein the low thermal conductivity material comprises an oxide doped with a material having a lower thermal conductivity than the oxide. 11. The method of claim 8 , wherein the low thermal conductivity material comprises silicon dioxide that has been doped with a dopant having a lower dielectric constant than the silicon dioxide. 12. The method of claim 11 , wherein the dopant comprises fluorine or carbon. 13. The method of claim 8 , wherein the low thermal conductivity material comprises porous silicon dioxide. 14. The method of claim 8 , wherein the low thermal conductivity material comprises spin-on silicon dioxide. 15. The method of claim 1 , wherein the temperature-sensitive photonic device comprises a carrier wave modulator. 16. The method of claim 1 , wherein the temperature-sensitive photonic device comprises a laser. 17. The method of claim 1 , wherein the trench and the thermal isolation structure form a shallow trench isolation region.
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